Sergey Khristo

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Ashdod, IL

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Patents Grantslast 30 patents

Information Patent Grant
Measuring height difference in patterns on semiconductor wafers
- Patent number 11,301,983
- Issue date Apr 12, 2022
- Applied Materials Israel Ltd.
- Ishai Schwarzband
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Measuring height difference in patterns on semiconductor wafers
- Patent number 10,748,272
- Issue date Aug 18, 2020
- Applied Materials Israel Ltd.
- Ishai Schwarzband
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Technique for inspecting semiconductor wafers
- Patent number 10,636,140
- Issue date Apr 28, 2020
- Applied Materials Israel Ltd.
- Ishai Schwarzband
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method for printability based inspection
- Patent number 9,927,375
- Issue date Mar 27, 2018
- Applied Materials Israel Ltd.
- Shay Attal
- G01 - MEASURING TESTING
Information Patent Grant
System and method for evaluating error sources associated with a mask
- Patent number 8,327,298
- Issue date Dec 4, 2012
- Applied Materials Israel, Ltd.
- Lev Faivishevsky
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Patents Applicationslast 30 patents

Information Patent Application
MEASURING HEIGHT DIFFERENCE IN PATTERNS ON SEMICONDUCTOR WAFERS
- Publication number 20200380668
- Publication date Dec 3, 2020
- APPLIED MATERIALS ISRAEL LTD.
- Ishai SCHWARZBAND
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
TECHNIQUE FOR INSPECTING SEMICONDUCTOR WAFERS
- Publication number 20180336671
- Publication date Nov 22, 2018
- APPLIED MATERIALS ISRAEL LTD.
- Ishai SCHWARZBAND
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MEASURING HEIGHT DIFFERENCE IN PATTERNS ON SEMICONDUCTOR WAFERS
- Publication number 20180336675
- Publication date Nov 22, 2018
- APPLIED MATERIALS ISRAEL LTD.
- Ishai SCHWARZBAND
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEM AND METHOD FOR PRINTABILITY BASED INSPECTION
- Publication number 20170176347
- Publication date Jun 22, 2017
- APPLIED MATERIALS ISRAEL, LTD.
- Shay Attal
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR EVALUATING ERROR SOURCES ASSOCIATED WITH A MASK
- Publication number 20100235805
- Publication date Sep 16, 2010
- Lev Faivishevsky
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY