Sergey Osechinskiy

Person

Goleta, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Nanoscale dynamic mechanical analysis via atomic force microscopy (...
- Patent number 12,241,911
- Issue date Mar 4, 2025
- BRUKER NANO, INC.
- Sergey Osechinskiy
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Nanoscale dynamic mechanical analysis via atomic force microscopy (...
- Patent number 11,940,461
- Issue date Mar 26, 2024
- BRUKER NANO, INC.
- Sergey Osechinskiy
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Nanoscale dynamic mechanical analysis via atomic force microscopy (...
- Patent number 11,635,449
- Issue date Apr 25, 2023
- BRUKER NANO, INC.
- Sergey Osechinskiy
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Nanoscale dynamic mechanical analysis via atomic force microscopy (...
- Patent number 11,307,220
- Issue date Apr 19, 2022
- BRUKER NANO
- Sergey Osechinskiy
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Nanoscale dynamic mechanical analysis via atomic force microscopy (...
- Patent number 11,029,330
- Issue date Jun 8, 2021
- BRUKER NANO, INC.
- Sergey Osechinskiy
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Filed-mapping and focal-spot tracking for s-SNOM
- Patent number 10,161,960
- Issue date Dec 25, 2018
- BRUKER NANO, INCORPORATED
- Sergey Osechinskiy
- G01 - MEASURING TESTING
Information Patent Grant
Field-mapping and focal-spot tracking for S-SNOM
- Patent number 10,067,159
- Issue date Sep 4, 2018
- Bruker Nano, Inc.
- Gregory Andreev
- G01 - MEASURING TESTING
Information Patent Grant
Chemical nano-identification of a sample using normalized near-fiel...
- Patent number 9,933,453
- Issue date Apr 3, 2018
- Bruker Nano, Inc.
- Gregory Andreev
- G01 - MEASURING TESTING
Information Patent Grant
Chemical nano-identification of a sample using normalized near-fiel...
- Patent number 9,846,178
- Issue date Dec 19, 2017
- Bruker Nano, Inc.
- Gregory Andreev
- G01 - MEASURING TESTING
Information Patent Grant
Chemical nano-identification of a sample using normalized near-fiel...
- Patent number 9,448,252
- Issue date Sep 20, 2016
- BRUKER NANO, INCORPORATED
- Gregory Andreev
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Nanoscale Dynamic Mechanical Analysis Via Atomic Force Microscopy (...
- Publication number 20250147066
- Publication date May 8, 2025
- Bruker Nano, Inc.
- Sergey Osechinskiy
- B82 - NANO-TECHNOLOGY
Information Patent Application
Nanoscale Dynamic Mechanical Analysis Via Atomic Force Microscopy (...
- Publication number 20240175895
- Publication date May 30, 2024
- Bruker Nano, Inc.
- Sergey Osechinskiy
- B82 - NANO-TECHNOLOGY
Information Patent Application
Nanoscale Dynamic Mechanical Analysis via Atomic Force Microscopy (...
- Publication number 20230243867
- Publication date Aug 3, 2023
- Bruker Nano, Inc.
- Sergey Osechinskiy
- B82 - NANO-TECHNOLOGY
Information Patent Application
Nanoscale Dynamic Mechanical Analysis via Atomic Force Microscopy (...
- Publication number 20220252638
- Publication date Aug 11, 2022
- Bruker Nano, Inc.
- Sergey Osechinskiy
- B82 - NANO-TECHNOLOGY
Information Patent Application
Nanoscale Dynamic Mechanical Analysis via Atomic Force Microscopy (...
- Publication number 20210239732
- Publication date Aug 5, 2021
- Bruker Nano, Inc.
- Sergey Osechinskiy
- B82 - NANO-TECHNOLOGY
Information Patent Application
Nanoscale Dynamic Mechanical Analysis via Atomic Force Microscopy (...
- Publication number 20200041541
- Publication date Feb 6, 2020
- Bruker Nano, Inc.
- Sergey Osechinskiy
- B82 - NANO-TECHNOLOGY
Information Patent Application
FIELD-MAPPING AND FOCAL-SPOT TRACKING FOR S-SNOM
- Publication number 20180364276
- Publication date Dec 20, 2018
- BRUKER NANO, INC.
- Sergey Osechinskiy
- G01 - MEASURING TESTING
Information Patent Application
CHEMICAL NANO-IDENTIFICATION OF A SAMPLE USING NORMALIZED NEAR-FIEL...
- Publication number 20180059136
- Publication date Mar 1, 2018
- BRUKER NANO, INC.
- Gregory Andreev
- G01 - MEASURING TESTING
Information Patent Application
Field-Mapping and Focal-Spot Tracking for S-SNOM
- Publication number 20170219621
- Publication date Aug 3, 2017
- BRUKER NANO, INCORPORATED
- Gregory Andreev
- G01 - MEASURING TESTING
Information Patent Application
CHEMICAL NANO-IDENTIFICATION OF A SAMPLE USING NORMALIZED NEAR-FIEL...
- Publication number 20160356809
- Publication date Dec 8, 2016
- BRUKER NANO, INC.
- Gregory Andreev
- G01 - MEASURING TESTING
Information Patent Application
CHEMICAL NANO-IDENTIFICATION OF A SAMPLE USING NORMALIZED NEAR-FIEL...
- Publication number 20160018437
- Publication date Jan 21, 2016
- Bruker Nano, Inc.
- Gregory Andreev
- G01 - MEASURING TESTING

Sergey Osechinskiy

Person

Patents Grantslast 30 patents

Nanoscale dynamic mechanical analysis via atomic force microscopy (...

Nanoscale dynamic mechanical analysis via atomic force microscopy (...

Nanoscale dynamic mechanical analysis via atomic force microscopy (...

Nanoscale dynamic mechanical analysis via atomic force microscopy (...

Nanoscale dynamic mechanical analysis via atomic force microscopy (...

Filed-mapping and focal-spot tracking for s-SNOM

Field-mapping and focal-spot tracking for S-SNOM

Chemical nano-identification of a sample using normalized near-fiel...

Chemical nano-identification of a sample using normalized near-fiel...

Chemical nano-identification of a sample using normalized near-fiel...

Patents Applicationslast 30 patents

Nanoscale Dynamic Mechanical Analysis Via Atomic Force Microscopy (...

Nanoscale Dynamic Mechanical Analysis Via Atomic Force Microscopy (...

Nanoscale Dynamic Mechanical Analysis via Atomic Force Microscopy (...

Nanoscale Dynamic Mechanical Analysis via Atomic Force Microscopy (...

Nanoscale Dynamic Mechanical Analysis via Atomic Force Microscopy (...

Nanoscale Dynamic Mechanical Analysis via Atomic Force Microscopy (...

FIELD-MAPPING AND FOCAL-SPOT TRACKING FOR S-SNOM

CHEMICAL NANO-IDENTIFICATION OF A SAMPLE USING NORMALIZED NEAR-FIEL...

Field-Mapping and Focal-Spot Tracking for S-SNOM

CHEMICAL NANO-IDENTIFICATION OF A SAMPLE USING NORMALIZED NEAR-FIEL...

CHEMICAL NANO-IDENTIFICATION OF A SAMPLE USING NORMALIZED NEAR-FIEL...