Sergey SINITSA

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Holon, IL

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Patents Applicationslast 30 patents

Information Patent Application
MACHINE LEARNING BASED DEFECT EXAMINATION FOR SEMICONDUCTOR SPECIMENS
- Publication number 20250086781
- Publication date Mar 13, 2025
- APPLIED MATERIALS ISRAEL LTD.
- Boaz STURLESI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MACHINE LEARNING BASED EXAMINATION FOR PROCESS MONITORING
- Publication number 20240281956
- Publication date Aug 22, 2024
- APPLIED MATERIALS ISRAEL LTD.
- Noam TAL
- G06 - COMPUTING CALCULATING COUNTING