Sergey Subach

Person

  • Aachen, DE

Patents Grantslast 30 patents

  • Information Patent Grant

    Method for examining a sample

    • Patent number 8,347,410
    • Issue date Jan 1, 2013
    • Forschungszentrum Juelich GmbH
    • Ruslan Temirov
    • B82 - NANO-TECHNOLOGY

Patents Applicationslast 30 patents

  • Information Patent Application

    METHOD FOR EXAMINING A SAMPLE

    • Publication number 20100263097
    • Publication date Oct 14, 2010
    • Ruslan Temirov
    • G01 - MEASURING TESTING