Hayward, CA, US
Information
Patent Grant
Applied Materials, Inc.
Dermot Cantwell
G01 - MEASURING TESTING
Information
Patent Grant
Applied Materials, Inc.
Sidharth Bhatia
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Applied Materials, Inc.
Dermot Cantwell
G01 - MEASURING TESTING
Information
Patent Application
Applied Materials, Inc.
Dermot Cantwell
G01 - MEASURING TESTING
Information
Patent Application
Applied Materials, Inc.
Sidharth Bhatia
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Applied Materials, Inc.
Albert Barrett Hicks
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Applied Materials, Inc.
Albert Barrett Hicks
C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information
Patent Application
Applied Materials, Inc.
Albert Barrett Hicks
C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information
Patent Application
Applied Materials, Inc.
Dermot Cantwell
G01 - MEASURING TESTING
Information
Patent Application
Applied Materials, Inc.
Sidharth Bhatia
G05 - CONTROLLING REGULATING
