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Sergiy Kharkivskiy
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Rolla, MO, US
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Patents Grants
last 30 patents
Information
Patent Grant
High frequency analysis of a device under test
Patent number
8,212,573
Issue date
Jul 3, 2012
The Curators of the University of Missouri
Mohamed Ahmed AbouKhousa
G01 - MEASURING TESTING
Information
Patent Grant
Microwave and millimeter wave imaging system
Patent number
7,746,266
Issue date
Jun 29, 2010
The Curators of the University of Missouri
Reza Zoughi
G01 - MEASURING TESTING
Information
Patent Grant
Non-destructive testing of physical characteristics of composite st...
Patent number
7,439,749
Issue date
Oct 21, 2008
The Curators of the University of Missouri
Reza Zoughi
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for nondestructive sample inspection
Patent number
7,190,177
Issue date
Mar 13, 2007
The Curators of the University of Missouri
Reza Zoughi
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
MICROWAVE AND MILLIMETER WAVE RESONANT SENSOR HAVING PERPENDICULAR...
Publication number
20100328142
Publication date
Dec 30, 2010
THE CURATORS OF THE UNIVERSITY OF MISSOURI
Reza Zoughi
G01 - MEASURING TESTING
Information
Patent Application
HIGH FREQUENCY ANALYSIS OF A DEVICE UNDER TEST
Publication number
20100176789
Publication date
Jul 15, 2010
THE CURATORS OF THE UNIVERSITY OF MISSOURI
Reza Zoughi
G01 - MEASURING TESTING
Information
Patent Application
MICROWAVE AND MILLIMETER WAVE IMAGING SYSTEM
Publication number
20090237092
Publication date
Sep 24, 2009
THE CURATORS OF THE UNIVERSITY OF MISSOURI
Reza Zoughi
G01 - MEASURING TESTING
Information
Patent Application
NON-DESTRUCTIVE TESTING OF PHYSICAL CHARACTERISTICS OF COMPOSITE ST...
Publication number
20080129316
Publication date
Jun 5, 2008
The Curators Of the University of Missouri
Reza Zoughi
G01 - MEASURING TESTING
Information
Patent Application
Method and apparatus for nondestructive sample inspection
Publication number
20060039257
Publication date
Feb 23, 2006
The Curators Of the University of Missouri
Reza Zoughi
G01 - MEASURING TESTING