Sergiy Kharkivskiy

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Penrith, AU

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Patents Grantslast 30 patents

Information Patent Grant
High frequency analysis of a device under test
- Patent number 9,081,045
- Issue date Jul 14, 2015
- The Curators of the University of Missouri
- Reza Zoughi
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
HIGH FREQUENCY ANALYSIS OF A DEVICE UNDER TEST
- Publication number 20120235696
- Publication date Sep 20, 2012
- THE CURATORS OF THE UNIVERSITY OF MISSOURI
- Reza Zoughi
- G01 - MEASURING TESTING