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Serkan Ertekin
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Istanbul, TR
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last 30 patents
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Patent Grant
Inspection method and system using multifrequency phase analysis
Patent number
7,206,706
Issue date
Apr 17, 2007
General Electric Company
Changting Wang
G01 - MEASURING TESTING
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last 30 patents
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Patent Application
Inspection method and system using multifrequency phase analysis
Publication number
20060217908
Publication date
Sep 28, 2006
General Electric Company
Changting Wang
G01 - MEASURING TESTING