Seth W. Craighead

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San Jose, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Flexible sideband support systems and methods
- Patent number 12,203,978
- Issue date Jan 21, 2025
- Advantest Corporation
- Srdjan Malisic
- G01 - MEASURING TESTING
Information Patent Grant
Flexible sideband support systems and methods
- Patent number 11,733,290
- Issue date Aug 22, 2023
- Advantest Corporation
- Srdjan Malisic
- G01 - MEASURING TESTING
Information Patent Grant
Test equipment diagnostics systems and methods
- Patent number 11,714,132
- Issue date Aug 1, 2023
- Advantest Corporation
- Mei-Mei Su
- G01 - MEASURING TESTING
Information Patent Grant
Enhanced loopback diagnostic systems and methods
- Patent number 11,619,667
- Issue date Apr 4, 2023
- Advantest Corporation
- Mei-Mei Su
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Semiconductor test system having double data rate pin scrambling
- Patent number 6,754,868
- Issue date Jun 22, 2004
- Nextest Systems Corporation
- Steven R. Bristow
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Flexible Sideband Support Systems and Methods
- Publication number 20230400505
- Publication date Dec 14, 2023
- Srdjan Malisic
- G01 - MEASURING TESTING
Information Patent Application
Test Equipment Diagnostics Systems and Methods
- Publication number 20210302501
- Publication date Sep 30, 2021
- Mei-Mei Su
- G01 - MEASURING TESTING
Information Patent Application
Flexible Sideband Support Systems and Methods
- Publication number 20210302491
- Publication date Sep 30, 2021
- Srdjan Malisic
- G01 - MEASURING TESTING
Information Patent Application
ENHANCED LOOPBACK DIAGNOSTIC SYSTEMS AND METHODS
- Publication number 20210302498
- Publication date Sep 30, 2021
- Mei-Mei Su
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor test system having double data rate pin scrambling
- Publication number 20030005381
- Publication date Jan 2, 2003
- Steven R. Bristow
- G01 - MEASURING TESTING