Setsuo Kodato

Person

Atsugi-shi, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Wide-band RF signal power detecting element and power detecting dev...
- Patent number 6,759,839
- Issue date Jul 6, 2004
- Anritsu Corporation
- Setsuo Kodato
- G01 - MEASURING TESTING
Information Patent Grant
Wide-band RF signal power detecting element and power detecting dev...
- Patent number 6,741,070
- Issue date May 25, 2004
- Anritsu Corporation
- Setsuo Kodato
- G01 - MEASURING TESTING
Information Patent Grant
Wide-band RF signal power detecting element and power detecting dev...
- Patent number 6,518,743
- Issue date Feb 11, 2003
- Anritsu Corporation
- Setsuo Kodato
- G01 - MEASURING TESTING
Information Patent Grant
Process for producing infrared emitting device and infrared emittin...
- Patent number 6,204,083
- Issue date Mar 20, 2001
- Anritsu Corporation
- Setsuo Kodato
- G01 - MEASURING TESTING
Information Patent Grant
Temperature sensor system using a micro-crystalline semiconductor t...
- Patent number 5,775,811
- Issue date Jul 7, 1998
- Anritsu Corporation
- Jun Hiraoka
- G01 - MEASURING TESTING
Information Patent Grant
Sensing system for measuring specific value of substance to be meas...
- Patent number 5,251,980
- Issue date Oct 12, 1993
- Anritsu Corporation
- Jun Hiraoka
- G01 - MEASURING TESTING
Information Patent Grant
Electric resistor having a thin film conductor
- Patent number 5,102,470
- Issue date Apr 7, 1992
- Anritsu Corporation
- Setsuo Kodato
- G01 - MEASURING TESTING
Information Patent Grant
Electric resistor and a power detector both comprising a thin film...
- Patent number 4,963,195
- Issue date Oct 16, 1990
- Anritsu Corporation
- Setsuo Kodato
- G01 - MEASURING TESTING
Information Patent Grant
Thin film conductor which contains silicon and germanium as major c...
- Patent number 4,835,059
- Issue date May 30, 1989
- Anritsu Corporation
- Setsuo Kodato
- G01 - MEASURING TESTING
Information Patent Grant
Method of manufacturing thin film conductor which contains silicon...
- Patent number 4,766,008
- Issue date Aug 23, 1988
- Anritsu Corporation
- Setsuo Kodato
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Wide-band RF signal power decting element and power detecting devic...
- Publication number 20030080725
- Publication date May 1, 2003
- Anritsu Corporation
- Setsuo Kodato
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Wide-band RF signal power detecting element and power detecting dev...
- Publication number 20030076085
- Publication date Apr 24, 2003
- ANRITSU CORPORATION
- Setsuo Kodato
- H03 - BASIC ELECTRONIC CIRCUITRY

Setsuo Kodato

Person

Patents Grantslast 30 patents

Wide-band RF signal power detecting element and power detecting dev...

Wide-band RF signal power detecting element and power detecting dev...

Wide-band RF signal power detecting element and power detecting dev...

Process for producing infrared emitting device and infrared emittin...

Temperature sensor system using a micro-crystalline semiconductor t...

Sensing system for measuring specific value of substance to be meas...

Electric resistor having a thin film conductor

Electric resistor and a power detector both comprising a thin film...

Thin film conductor which contains silicon and germanium as major c...

Method of manufacturing thin film conductor which contains silicon...

Patents Applicationslast 30 patents

Wide-band RF signal power decting element and power detecting devic...

Wide-band RF signal power detecting element and power detecting dev...