Setsuo Nomura

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Patents Grantslast 30 patents

Information Patent Grant
Scanning charged particle microscope, and focal distance adjusting...
- Patent number 6,677,585
- Issue date Jan 13, 2004
- Hitachi, Ltd.
- Setsuo Nomura
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for working a specimen
- Patent number 5,770,861
- Issue date Jun 23, 1998
- Hitachi, Ltd.
- Hiroshi Hirose
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam apparatus
- Patent number 5,012,109
- Issue date Apr 30, 1991
- Hitachi, Ltd.
- Hiroyasu Shichi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Focusing apparatus used in a transmission electron microscope
- Patent number 4,698,503
- Issue date Oct 6, 1987
- Hitachi, Ltd.
- Setsuo Nomura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Focusing device for a television electron microscope
- Patent number 4,680,469
- Issue date Jul 14, 1987
- Hitachi, Ltd.
- Setsuo Nomura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron holography microscope
- Patent number 4,532,422
- Issue date Jul 30, 1985
- Hitachi, Ltd.
- Setsuo Nomura
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
X-ray tubes
- Patent number 4,344,011
- Issue date Aug 10, 1982
- Hitachi, Ltd.
- Tadashi Hayashi
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Scanning charged particle microscope, and focal distance adjusting...
- Publication number 20010050338
- Publication date Dec 13, 2001
- Setsuo Nomura
- G01 - MEASURING TESTING