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Suwon-si, KR
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last 30 patents
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Patent Application
SEMICONDUCTOR YIELD PREDICTION METHOD AND APPARATUS
Publication number
20240135523
Publication date
Apr 25, 2024
Samsung Electronics Co., Ltd.
Taesoo SHIN
G06 - COMPUTING CALCULATING COUNTING
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Patent Application
METHOD AND APPARATUS FOR DETECTING CLUSTERS OF WAFER DEFECTS
Publication number
20240128128
Publication date
Apr 18, 2024
SAMSUNG ELECTRONICS CO,. LTD.
KIBUM LEE
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
DEFECT DETECTING DEVICE AND METHOD
Publication number
20240127426
Publication date
Apr 18, 2024
Samsung Electronics Co., Ltd.
Sungwook HWANG
G06 - COMPUTING CALCULATING COUNTING
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Patent Application
DEFECT DETECTION DEVICE AND METHOD THEREOF
Publication number
20240127425
Publication date
Apr 18, 2024
Samsung Electronics Co., Ltd.
Sungwook HWANG
G06 - COMPUTING CALCULATING COUNTING
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Patent Application
METHODS AND SYSTEMS OF DETECTING DEFECTS OF WAFER
Publication number
20240061345
Publication date
Feb 22, 2024
Samsung Electronics Co., Ltd.
Kibum LEE
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY