Seunghune YANG

Person

Seoul, KR

People

Patents Grantslast 30 patents

Information Patent Grant
Methods and devices of correcting layout for semiconductor processe...
- Patent number 12,086,526
- Issue date Sep 10, 2024
- Samsung Electronics Co., Ltd.
- Sooyong Lee
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of forming mask including curvilinear shape and method of fo...
- Patent number 12,044,961
- Issue date Jul 23, 2024
- Samsung Electronics Co., Ltd.
- Pilsoo Kang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electronic device for manufacturing semiconductor device and operat...
- Patent number 11,900,043
- Issue date Feb 13, 2024
- Samsung Electronics Co., Ltd.
- Sooyong Lee
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Semiconductor devices having landing pad patterns and methods of ma...
- Patent number 11,688,687
- Issue date Jun 27, 2023
- Samsung Electronics Co., Ltd.
- Sangoh Park
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of designing mask layout based on error pattern and method o...
- Patent number 11,506,983
- Issue date Nov 22, 2022
- Samsung Electronics Co., Ltd.
- Hungbae Ahn
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for inspecting pattern and an apparatus for manufacturing a...
- Patent number 9,965,851
- Issue date May 8, 2018
- Samsung Electronics Co., Ltd.
- Kaiyuan Chi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Pattern analysis method of a semiconductor device
- Patent number 9,672,611
- Issue date Jun 6, 2017
- Samsung Electronics Co., Ltd.
- Kiho Yang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Methods of inspecting a semiconductor device and semiconductor insp...
- Patent number 9,476,840
- Issue date Oct 25, 2016
- Samsung Electronics Co., Ltd.
- Kiho Yang
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTOR DEVICES AND METHODS OF MANUFACTURING THE SAME
- Publication number 20230290727
- Publication date Sep 14, 2023
- Samsung Electronics Co., Ltd.
- Sangoh Park
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SCANNING ELECTRON MICROSCOPE IMAGE-BASED PITCH WALK INSPECTION METH...
- Publication number 20230253179
- Publication date Aug 10, 2023
- Samsung Electronics Co., Ltd.
- SUNG MIN NAM
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF CORRECTING AN ERROR OF A LAYOUT OF A PATTERN, METHOD OF M...
- Publication number 20230194979
- Publication date Jun 22, 2023
- Samsung Electronics Co., Ltd.
- Mijin KWON
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MASK LAYOUT DESIGN METHOD, MASK AND INTEGRATED CIRCUIT MANUFACTURIN...
- Publication number 20230161937
- Publication date May 25, 2023
- Samsung Electronics Co., Ltd.
- Somin Cheon
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ELECTRONIC DEVICE FOR MANUFACTURING SEMICONDUCTOR DEVICE AND OPERAT...
- Publication number 20230028712
- Publication date Jan 26, 2023
- Samsung Electronics Co., Ltd.
- Sooyong LEE
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND COMPUTING DEVICE FOR MANUFACTURING SEMICONDUCTOR DEVICE
- Publication number 20220382249
- Publication date Dec 1, 2022
- Samsung Electronics Co., Ltd.
- Sooyong LEE
- G05 - CONTROLLING REGULATING
Information Patent Application
SEMICONDUCTOR DEVICES
- Publication number 20220262731
- Publication date Aug 18, 2022
- Samsung Electronics Co., Ltd.
- Sangoh Park
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHODS AND DEVICES OF CORRECTING LAYOUT FOR SEMICONDUCTOR PROCESSE...
- Publication number 20220171913
- Publication date Jun 2, 2022
- Samsung Electronics Co., Ltd.
- Sooyong Lee
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD OF FORMING MASK INCLUDING CURVILINEAR SHAPE AND METHOD OF FO...
- Publication number 20220050376
- Publication date Feb 17, 2022
- Samsung Electronics Co., Ltd.
- Pilsoo Kang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF DESIGNING MASK LAYOUT BASED ON ERROR PATTERN AND METHOD O...
- Publication number 20220043359
- Publication date Feb 10, 2022
- Samsung Electronics Co., Ltd.
- Hungbae AHN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICES AND METHODS OF MANUFACTURING THE SAME
- Publication number 20220037251
- Publication date Feb 3, 2022
- Samsung Electronics Co., Ltd.
- Sangoh Park
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR INSPECTING PATTERN AND AN APPARATUS FOR MANUFACTURING A...
- Publication number 20160275663
- Publication date Sep 22, 2016
- Samsung Electronics Co., Ltd.
- Kaiyuan Chi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PATTERN ANALYSIS METHOD OF A SEMICONDUCTOR DEVICE
- Publication number 20160071261
- Publication date Mar 10, 2016
- Samsung Electronics Co., Ltd.
- KIHO YANG
- G01 - MEASURING TESTING
Information Patent Application
METHODS OF INSPECTING A SEMICONDUCTOR DEVICE AND SEMICONDUCTOR INSP...
- Publication number 20150110383
- Publication date Apr 23, 2015
- Samsung Electronics Co., Ltd.
- Kiho YANG
- G06 - COMPUTING CALCULATING COUNTING

Seunghune YANG

Person

Patents Grantslast 30 patents

Methods and devices of correcting layout for semiconductor processe...

Method of forming mask including curvilinear shape and method of fo...

Electronic device for manufacturing semiconductor device and operat...

Semiconductor devices having landing pad patterns and methods of ma...

Method of designing mask layout based on error pattern and method o...

Method for inspecting pattern and an apparatus for manufacturing a...

Pattern analysis method of a semiconductor device

Methods of inspecting a semiconductor device and semiconductor insp...

Patents Applicationslast 30 patents

SEMICONDUCTOR DEVICES AND METHODS OF MANUFACTURING THE SAME

SCANNING ELECTRON MICROSCOPE IMAGE-BASED PITCH WALK INSPECTION METH...

METHOD OF CORRECTING AN ERROR OF A LAYOUT OF A PATTERN, METHOD OF M...

MASK LAYOUT DESIGN METHOD, MASK AND INTEGRATED CIRCUIT MANUFACTURIN...

ELECTRONIC DEVICE FOR MANUFACTURING SEMICONDUCTOR DEVICE AND OPERAT...

METHOD AND COMPUTING DEVICE FOR MANUFACTURING SEMICONDUCTOR DEVICE

SEMICONDUCTOR DEVICES

METHODS AND DEVICES OF CORRECTING LAYOUT FOR SEMICONDUCTOR PROCESSE...

METHOD OF FORMING MASK INCLUDING CURVILINEAR SHAPE AND METHOD OF FO...

METHOD OF DESIGNING MASK LAYOUT BASED ON ERROR PATTERN AND METHOD O...

SEMICONDUCTOR DEVICES AND METHODS OF MANUFACTURING THE SAME

METHOD FOR INSPECTING PATTERN AND AN APPARATUS FOR MANUFACTURING A...

PATTERN ANALYSIS METHOD OF A SEMICONDUCTOR DEVICE

METHODS OF INSPECTING A SEMICONDUCTOR DEVICE AND SEMICONDUCTOR INSP...