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Seungryeol Oh
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Daejeon, KR
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Patents Grants
last 30 patents
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Patent Grant
Through-focus image-based metrology device, operation method thereo...
Patent number
11,988,495
Issue date
May 21, 2024
Samsung Electronics Co., Ltd.
Kwangsoo Kim
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
DEFECT INSPECTION DEVICE AND DEFECT INSPECTION METHOD
Publication number
20240272089
Publication date
Aug 15, 2024
Samsung Electronics Co., Ltd.
Minsu Kim
G01 - MEASURING TESTING
Information
Patent Application
SUBSTRATE INSPECTION METHOD
Publication number
20240019380
Publication date
Jan 18, 2024
Samsung Electronics Co., Ltd.
Kihong Chung
H01 - BASIC ELECTRIC ELEMENTS
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Patent Application
SEMICONDUCTOR DEVICE MEASUREMENT METHOD USING X-RAY SCATTERING AND...
Publication number
20230380783
Publication date
Nov 30, 2023
Samsung Electronics Co., Ltd.
Jaeyong LEE
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
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Patent Application
THROUGH-FOCUS IMAGE-BASED METROLOGY DEVICE, OPERATION METHOD THEREO...
Publication number
20210396510
Publication date
Dec 23, 2021
Samsung Electronics Co., Ltd.
Kwangsoo Kim
G01 - MEASURING TESTING