Seungryeol Oh

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Daejeon, KR

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Patents Grantslast 30 patents

Information Patent Grant
Through-focus image-based metrology device, operation method thereo...
- Patent number 11,988,495
- Issue date May 21, 2024
- Samsung Electronics Co., Ltd.
- Kwangsoo Kim
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
DEFECT INSPECTION DEVICE AND DEFECT INSPECTION METHOD
- Publication number 20240272089
- Publication date Aug 15, 2024
- Samsung Electronics Co., Ltd.
- Minsu Kim
- G01 - MEASURING TESTING
Information Patent Application
SUBSTRATE INSPECTION METHOD
- Publication number 20240019380
- Publication date Jan 18, 2024
- Samsung Electronics Co., Ltd.
- Kihong Chung
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE MEASUREMENT METHOD USING X-RAY SCATTERING AND...
- Publication number 20230380783
- Publication date Nov 30, 2023
- Samsung Electronics Co., Ltd.
- Jaeyong LEE
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
THROUGH-FOCUS IMAGE-BASED METROLOGY DEVICE, OPERATION METHOD THEREO...
- Publication number 20210396510
- Publication date Dec 23, 2021
- Samsung Electronics Co., Ltd.
- Kwangsoo Kim
- G01 - MEASURING TESTING