SEUNGWON JEONG

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Yongin-si, KR

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Patents Grantslast 30 patents

Information Patent Grant
Probe for testing a semiconductor device and a probe card including...
- Patent number 12,038,458
- Issue date Jul 16, 2024
- Samsung Electronics Co., Ltd.
- Sung Hoon Lee
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
PROBE FOR TESTING A SEMICONDUCTOR DEVICE AND A PROBE CARD INCLUDING...
- Publication number 20220308088
- Publication date Sep 29, 2022
- Korea Instrument Co.,Ltd.
- SUNG HOON LEE
- G01 - MEASURING TESTING