Seungwon JUNG

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Seo-gu, KR

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Patents Grantslast 30 patents

Information Patent Grant
Method of generating a compensation matrix during a substrate inspe...
- Patent number 10,151,705
- Issue date Dec 11, 2018
- Koh Young Technology Inc.
- Seungwon Jung
- G01 - MEASURING TESTING
Information Patent Grant
Method of generating reference data for inspecting a circuit board
- Patent number 9,911,185
- Issue date Mar 6, 2018
- Koh Young Technology Inc.
- Seungwon Jung
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and apparatus for generating depth image
- Patent number 9,746,547
- Issue date Aug 29, 2017
- Samsung Electronics Co., Ltd.
- Sunkwon Kim
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Method for positioning carbon nanotubes between electrodes, biomole...
- Patent number 7,928,740
- Issue date Apr 19, 2011
- Samsung Electronics Co., Ltd.
- Won Seok Chung
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
IMAGE PROCESSING DEVICE INCLUDING NEURAL NETWORK PROCESSOR AND IMAG...
- Publication number 20240420451
- Publication date Dec 19, 2024
- Korea University Research and Business Foundation
- Seungwon Jung
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD OF GENERATING A COMPENSATION MATRIX DURING A SUBSTRATE INSPE...
- Publication number 20160223468
- Publication date Aug 4, 2016
- KOH YOUNG TECHNOLOGY INC.
- Seungwon JUNG
- G01 - MEASURING TESTING
Information Patent Application
A METHOD OF GENERATING REFERENCE DATA FOR INSPECTING A CIRCUIT BOARD
- Publication number 20160225129
- Publication date Aug 4, 2016
- KOH YOUNG TECHNOLOGY INC.
- Seungwon JUNG
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR GENERATING DEPTH IMAGE
- Publication number 20150334372
- Publication date Nov 19, 2015
- Samsung Electronics Co., Ltd.
- Sunkwon KIM
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD FOR POSITIONING CARBON NANOTUBES BETWEEN ELECTRODES, BIOMOLE...
- Publication number 20100289509
- Publication date Nov 18, 2010
- Samsung Electronics Co., Ltd.
- Won Seok CHUNG
- G01 - MEASURING TESTING