Seyed Iman MOSSAVAT

Person

Waalre, NL

People

Patents Grantslast 30 patents

Information Patent Grant
Method of calibrating a plurality of metrology apparatuses, method...
- Patent number 11,556,060
- Issue date Jan 17, 2023
- ASML Netherlands B.V.
- Seyed Iman Mossavat
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and metrology apparatus for determining estimated scattered...
- Patent number 11,392,043
- Issue date Jul 19, 2022
- ASML Netherlands B.V.
- Seyed Iman Mossavat
- G01 - MEASURING TESTING
Information Patent Grant
Methods and apparatus for metrology
- Patent number 10,996,568
- Issue date May 4, 2021
- ASML Netherlands B.V.
- Petrus Wilhelmus Smorenburg
- G01 - MEASURING TESTING
Information Patent Grant
Metrology method and apparatus with increased bandwidth
- Patent number 10,901,323
- Issue date Jan 26, 2021
- ASML Netherlands B.V.
- Hugo Augustinus Joseph Cramer
- G01 - MEASURING TESTING
Information Patent Grant
Metrology method and apparatus with increased bandwidth
- Patent number 10,732,514
- Issue date Aug 4, 2020
- ASML Netherlands B.V.
- Hugo Augustinus Joseph Cramer
- G01 - MEASURING TESTING
Information Patent Grant
Statistical hierarchical reconstruction from metrology data
- Patent number 10,627,213
- Issue date Apr 21, 2020
- ASML Netherlands B.V.
- Seyed Iman Mossavat
- G01 - MEASURING TESTING
Information Patent Grant
Estimation of data in metrology
- Patent number 10,429,746
- Issue date Oct 1, 2019
- ASML Netherlands B.V.
- Alexandru Onose
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Metrology method and apparatus, computer program and lithographic s...
- Patent number 10,369,752
- Issue date Aug 6, 2019
- ASML Netherlands B.V.
- Seyed Iman Mossavat
- B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
Information Patent Grant
Method of determining edge placement error, inspection apparatus, p...
- Patent number 10,156,797
- Issue date Dec 18, 2018
- ASML Netherlands, B.V.
- Seyed Iman Mossavat
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Process flagging and cluster detection without requiring reconstruc...
- Patent number 10,151,985
- Issue date Dec 11, 2018
- ASML Netherlands B.V.
- Remco Dirks
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method and inspection apparatus and computer program product for as...
- Patent number 9,760,018
- Issue date Sep 12, 2017
- ASML Netherlands B.V.
- Seyed Iman Mossavat
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Patents Applicationslast 30 patents

Information Patent Application
METHOD FOR ADJUSTING A PATTERNING PROCESS
- Publication number 20230273529
- Publication date Aug 31, 2023
- ASML NETHERLANDS B.V.
- Satej Subhash KHEDEKAR
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
METHODS OF MODELLING SYSTEMS FOR PERFORMING PREDICTIVE MAINTENANCE...
- Publication number 20230138469
- Publication date May 4, 2023
- ASML NETHERLANDS B.V.
- Carlo LANCIA
- G05 - CONTROLLING REGULATING
Information Patent Application
METHOD FOR CORRECTING MEASUREMENTS IN THE MANUFACTURE OF INTEGRATED...
- Publication number 20230040124
- Publication date Feb 9, 2023
- ASML NETHERLANDS B.V.
- Han-Kwang NIENHUYS
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Metrology Method and Apparatus with Increased Bandwidth
- Publication number 20200319562
- Publication date Oct 8, 2020
- ASML NETHERLANDS B.V.
- Hugo Augustinus Joseph CRAMER
- G01 - MEASURING TESTING
Information Patent Application
Methods and Apparatus for Metrology
- Publication number 20200201192
- Publication date Jun 25, 2020
- ASML NETHERLANDS B.V.
- Petrus Wilhelmus SMORENBURG
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Method of Calibrating a Plurality of Metrology Apparatuses, Method...
- Publication number 20200110341
- Publication date Apr 9, 2020
- ASML NETHERLANDS B.V.
- Seyed Iman MOSSAVAT
- G05 - CONTROLLING REGULATING
Information Patent Application
Method and Metrology Apparatus for Determining Estimated Scattered...
- Publication number 20200057386
- Publication date Feb 20, 2020
- ASML NETHERLANDS B.V.
- Seyed Iman MOSSAVAT
- G01 - MEASURING TESTING
Information Patent Application
Metrology Method and Apparatus with Increased Bandwidth
- Publication number 20190258177
- Publication date Aug 22, 2019
- ASML NETHERLANDS B.V.
- Hugo Augustinus Joseph CRAMER
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
ESTIMATION OF DATA IN METROLOGY
- Publication number 20190129313
- Publication date May 2, 2019
- ASML NETHERLANDS B.V.
- Alexandru ONOSE
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
PROCESS FLAGGING AND CLUSTER DETECTION WITHOUT REQUIRING RECONSTRUC...
- Publication number 20170176869
- Publication date Jun 22, 2017
- ASML NETHERLANDS B.V.
- Remco DIRKS
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
STATISTICAL HIERARCHICAL RECONSTRUCTION FROM METROLOGY DATA
- Publication number 20170160074
- Publication date Jun 8, 2017
- ASML NETHERLANDS B.V.
- Seyed Iman MOSSAVAT
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF DETERMINING EDGE PLACEMENT ERROR, INSPECTION APPARATUS, P...
- Publication number 20170010541
- Publication date Jan 12, 2017
- ASML NETHERLANDS B.V.
- Seyed Iman MOSSAVAT
- G01 - MEASURING TESTING
Information Patent Application
Metrology Method and Apparatus, Computer Program and Lithographic S...
- Publication number 20160325504
- Publication date Nov 10, 2016
- ASML NETHERLANDS B.V.
- Seyed Iman MOSSAVAT
- B33 - ADDITIVE MANUFACTURING TECHNOLOGY
Information Patent Application
Method and Inspection Apparatus and Computer Program Product for As...
- Publication number 20160154319
- Publication date Jun 2, 2016
- ASML NETHERLANDS B.V.
- Seyed Iman MOSSAVAT
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Seyed Iman MOSSAVAT

Person

Patents Grantslast 30 patents

Method of calibrating a plurality of metrology apparatuses, method...

Method and metrology apparatus for determining estimated scattered...

Methods and apparatus for metrology

Metrology method and apparatus with increased bandwidth

Metrology method and apparatus with increased bandwidth

Statistical hierarchical reconstruction from metrology data

Estimation of data in metrology

Metrology method and apparatus, computer program and lithographic s...

Method of determining edge placement error, inspection apparatus, p...

Process flagging and cluster detection without requiring reconstruc...

Method and inspection apparatus and computer program product for as...

Patents Applicationslast 30 patents

METHOD FOR ADJUSTING A PATTERNING PROCESS

METHODS OF MODELLING SYSTEMS FOR PERFORMING PREDICTIVE MAINTENANCE...

METHOD FOR CORRECTING MEASUREMENTS IN THE MANUFACTURE OF INTEGRATED...

Metrology Method and Apparatus with Increased Bandwidth

Methods and Apparatus for Metrology

Method of Calibrating a Plurality of Metrology Apparatuses, Method...

Method and Metrology Apparatus for Determining Estimated Scattered...

Metrology Method and Apparatus with Increased Bandwidth

ESTIMATION OF DATA IN METROLOGY

PROCESS FLAGGING AND CLUSTER DETECTION WITHOUT REQUIRING RECONSTRUC...

STATISTICAL HIERARCHICAL RECONSTRUCTION FROM METROLOGY DATA

METHOD OF DETERMINING EDGE PLACEMENT ERROR, INSPECTION APPARATUS, P...

Metrology Method and Apparatus, Computer Program and Lithographic S...

Method and Inspection Apparatus and Computer Program Product for As...