Yorba Linda, CA, US
Information
Patent Grant
The Aerospace Corporation
Shabnam Virji
B82 - NANO-TECHNOLOGY
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Patent Grant
The Aerospace Corporation
Shabnam Virji
G01 - MEASURING TESTING
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Patent Grant
The Regeants Of The Universtiy Of California
Bruce H. Weiller
G01 - MEASURING TESTING
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Patent Grant
The Aerospace Corporation
Bruce H. Weiller
G01 - MEASURING TESTING
Information
Patent Grant
The Aerospace Corporation
Richard B. Kaner
B82 - NANO-TECHNOLOGY
Information
Patent Application
Shabnam Virji
G01 - MEASURING TESTING
Information
Patent Application
Bruce H. Weiller
G01 - MEASURING TESTING
Information
Patent Application
Bruce H. Weiller
G01 - MEASURING TESTING
Information
Patent Application
Shabnam Virji
G01 - MEASURING TESTING
Information
Patent Application
Shabnam Virji
G01 - MEASURING TESTING
Information
Patent Application
Shabnam Virji
G01 - MEASURING TESTING
Information
Patent Application
The Aerospace Corporation Regents of the University of California
Bruce H. Weiller
G01 - MEASURING TESTING
Information
Patent Application
Bruce H. Weiller
G01 - MEASURING TESTING
Information
Patent Application
Richard B. Kaner
D01 - NATURAL OR ARTIFICIAL THREADS OR FIBRES SPINNING
