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Shahedul Hoque

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  • Hitachinaka, JP
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Patents Grantslast 30 patents

Patents Applicationslast 30 patents

  • Information Patent Application

    CHARGED PARTICLE BEAM APPARATUS
    • Publication number 20230030651
    • Publication date Feb 2, 2023
    • HITACHI HIGH-TECH CORPORATION
    • Yoshifumi SEKIGUCHI
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    Charged Particle Beam Device
    • Publication number 20220122804
    • Publication date Apr 21, 2022
    • HITACHI HIGH-TECH CORPORATION
    • Toshiyuki YOKOSUKA
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    Charged Particle Beam Apparatus
    • Publication number 20210375583
    • Publication date Dec 2, 2021
    • HITACHI HIGH-TECH CORPORATION
    • Shunsuke MIZUTANI
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    CHARGED PARTICLE BEAM APPARATUS
    • Publication number 20210183614
    • Publication date Jun 17, 2021
    • HITACHI HIGH-TECH CORPORATION
    • Yoshifumi SEKIGUCHI
    • G01 - MEASURING TESTING
  • Information Patent Application

    Charged Particle Beam Device
    • Publication number 20200312615
    • Publication date Oct 1, 2020
    • HITACHI HIGH-TECH CORPORATION
    • Toshiyuki YOKOSUKA
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    Light Guide, Detector Having Light Guide, and Charged Particle Beam...
    • Publication number 20200203120
    • Publication date Jun 25, 2020
    • Hitachi High-Technologies Corporation
    • Yoshifumi SEKIGUCHI
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    CHARGED-PARTICLE BEAM SYSTEM
    • Publication number 20200020504
    • Publication date Jan 16, 2020
    • Hitachi High-Technologies Corporation
    • Akio YAMAMOTO
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    Charged Particle Beam Apparatus
    • Publication number 20190355552
    • Publication date Nov 21, 2019
    • Hitachi High-Technologies Corporation
    • Shunsuke MIZUTANI
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    CHARGED PARTICLE DETECTOR AND CHARGED PARTICLE BEAM APPARATUS
    • Publication number 20190355549
    • Publication date Nov 21, 2019
    • Hitachi High-Technologies Corporation
    • Shin IMAMURA
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    CHARGED PARTICLE BEAM DEVICE
    • Publication number 20190180979
    • Publication date Jun 13, 2019
    • Hitachi High-Technologies Corporation
    • Toshiyuki YOKOSUKA
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    Light Guide, Detector Having Light Guide, and Charged Particle Beam...
    • Publication number 20190115186
    • Publication date Apr 18, 2019
    • Hitachi High-Technologies Corporation
    • Yoshifumi SEKIGUCHI
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    Charged Particle Beam Device Having Inspection Scan Direction Based...
    • Publication number 20180374674
    • Publication date Dec 27, 2018
    • Hitachi High-Technologies Corporation
    • Hideki ITAI
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    Charged Particle Beam Apparatus
    • Publication number 20180286627
    • Publication date Oct 4, 2018
    • Hitachi High-Technologies Corporation
    • Shinya UENO
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    Charged Particle Beam Device
    • Publication number 20180269026
    • Publication date Sep 20, 2018
    • Hitachi High-Technologies Corporation
    • Shahedul HOQUE
    • G02 - OPTICS
  • Information Patent Application

    Charged Particle Beam Device
    • Publication number 20170323763
    • Publication date Nov 9, 2017
    • Hideki ITAI
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    Charged Particle Beam Device
    • Publication number 20170278671
    • Publication date Sep 28, 2017
    • Hitachi High-Technologies Corporation
    • Toshiyuki YOKOSUKA
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    Charged Particle Beam Device
    • Publication number 20160240348
    • Publication date Aug 18, 2016
    • HITACHI HIGH-TECHNOLOGIES CORPORATION
    • Toshiyuki YOKOSUKA
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    ELECTRON BEAM IRRADIATION APPARATUS
    • Publication number 20140077079
    • Publication date Mar 20, 2014
    • Hitachi High-Technologies Corporation
    • Shahedul Hoque
    • G01 - MEASURING TESTING
  • Information Patent Application

    ELECTRON BEAM IRRADIATION APPARATUS
    • Publication number 20140021348
    • Publication date Jan 23, 2014
    • Hitachi High-Technologies Corporation
    • Shahedul Hoque
    • G01 - MEASURING TESTING
  • Information Patent Application

    SCANNING ELECTRON MICROSCOPE
    • Publication number 20130306866
    • Publication date Nov 21, 2013
    • Hitachi High-Technologies Corporation
    • Shahedul Hoque
    • H01 - BASIC ELECTRIC ELEMENTS