Shai Shperber

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Bat Hefer, IL

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Patents Grantslast 30 patents

Information Patent Grant
Semiconductor device arrangement, a method of analysing a performan...
- Patent number 9,671,456
- Issue date Jun 6, 2017
- NXP USA, INC.
- Yoav Weizman
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
On-die capacitance measurement module and method for measuring an o...
- Patent number 9,459,297
- Issue date Oct 4, 2016
- FREESCALE SEMICONDUCTOR, INC.
- Ezra Baruch
- G01 - MEASURING TESTING
Information Patent Grant
Device and method for evaluating a temperature
- Patent number 8,430,562
- Issue date Apr 30, 2013
- FREESCALE SEMICONDUCTOR, INC.
- Yoav Weizman
- G01 - MEASURING TESTING
Information Patent Grant
Device and method for evaluating a temperature
- Patent number 8,070,357
- Issue date Dec 6, 2011
- FREESCALE SEMICONDUCTOR, INC.
- Yoav Weizman
- G01 - MEASURING TESTING
Information Patent Grant
Analysis module, integrated circuit, system and method for testing...
- Patent number 7,151,387
- Issue date Dec 19, 2006
- FREESCALE SEMICONDUCTOR, INC.
- Yoav Weizman
- G01 - MEASURING TESTING
Information Patent Grant
DEVICE AND METHOD FOR PATCHING CODE RESIDING ON A READ ONLY MEMORY...
- Patent number 6,463,549
- Issue date Oct 8, 2002
- Motorola, Inc.
- Shai Shperber
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTOR DEVICE ARRANGEMENT, A METHOD OF ANALYSING A PERFORMAN...
- Publication number 20150104886
- Publication date Apr 16, 2015
- FREESCALE SEMICONDUCTOR, INC.
- Yoav Weizman
- G01 - MEASURING TESTING
Information Patent Application
ON-DIE CAPACITANCE MEASUREMENT MODULE AND METHOD FOR MEASURING AN O...
- Publication number 20140333327
- Publication date Nov 13, 2014
- FREESCALE SEMICONDUCTOR, INC.
- Ezra Baruch
- G01 - MEASURING TESTING
Information Patent Application
DEVICE AND METHOD FOR EVALUATING A TEMPERATURE
- Publication number 20120051398
- Publication date Mar 1, 2012
- FREESCALE SEMICONDUCTOR, INC.
- Yoav Weizman
- G01 - MEASURING TESTING
Information Patent Application
DEVICE AND METHOD FOR EVALUATING A TEMPERATURE
- Publication number 20100020847
- Publication date Jan 28, 2010
- Yaov Weizman
- G01 - MEASURING TESTING
Information Patent Application
Analysis module, integrated circuit, system and method for testing...
- Publication number 20040064772
- Publication date Apr 1, 2004
- Yoav Weizman
- G01 - MEASURING TESTING