Shai Silberstein

Person

Rishon Le Zion, IL

People

Patents Grantslast 30 patents

Information Patent Grant
Photography-task-specific digital camera apparatus and methods usef...
- Patent number 8,681,226
- Issue date Mar 25, 2014
- Shai Silberstein
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Photography-specific digital camera apparatus and methods useful in...
- Patent number 8,169,484
- Issue date May 1, 2012
- Shai Silberstein
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Optical inspection tools featuring parallel post-inspection analysis
- Patent number 8,135,207
- Issue date Mar 13, 2012
- Applied Materials South East Asia Pte. Ltd.
- Shai Silberstein
- G01 - MEASURING TESTING
Information Patent Grant
Optical inspection tool featuring multiple speed modes
- Patent number 8,098,372
- Issue date Jan 17, 2012
- Applied Materials South East Asia Pte. Ltd.
- Giora Eitan
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Dynamic illumination in optical inspection systems
- Patent number 7,973,921
- Issue date Jul 5, 2011
- Applied Materials South East Asia Pte Ltd.
- Shai Silberstein
- G01 - MEASURING TESTING
Information Patent Grant
System for detection of wafer defects
- Patent number 7,961,763
- Issue date Jun 14, 2011
- Applied Materials South East Asia Pte. Ltd.
- Dov Furman
- G01 - MEASURING TESTING
Information Patent Grant
Optical inspection including partial scanning of wafers
- Patent number 7,924,420
- Issue date Apr 12, 2011
- Applied Materials South East Asia Pte. Ltd.
- Gilad Shomrony
- G01 - MEASURING TESTING
Information Patent Grant
System for detection of wafer defects
- Patent number 7,843,559
- Issue date Nov 30, 2010
- Applied Materials South East Asia Pte. Ltd.
- Dov Furman
- G01 - MEASURING TESTING
Information Patent Grant
Inspection tools supporting multiple operating states for multiple...
- Patent number 7,826,049
- Issue date Nov 2, 2010
- Applied Materials South East Asia Pte. Ltd.
- Dov Furman
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for detecting defects in wafers including alig...
- Patent number 7,804,993
- Issue date Sep 28, 2010
- Applied Materials South East Asia Pte. Ltd.
- Yuval Dorphan
- G01 - MEASURING TESTING
Information Patent Grant
Image splitting in optical inspection systems
- Patent number 7,719,674
- Issue date May 18, 2010
- Applied Materials South East Asia Pte. Ltd.
- Dov Furman
- G01 - MEASURING TESTING
Information Patent Grant
Image splitting in optical inspection systems
- Patent number 7,714,998
- Issue date May 11, 2010
- Applied Materials South East Asia Pte. Ltd.
- Dov Furman
- G01 - MEASURING TESTING
Information Patent Grant
Wafer inspection using short-pulsed continuous broadband illumination
- Patent number 7,659,973
- Issue date Feb 9, 2010
- Applied Materials Southeast Asia, Pte Ltd.
- Dov Furman
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for determining optimum position of focus of an imaging s...
- Patent number 7,633,041
- Issue date Dec 15, 2009
- Applied Materials South East Asia Pte, Ltd.
- Dov Furman
- G01 - MEASURING TESTING
Information Patent Grant
System for detection of water defects
- Patent number 7,525,659
- Issue date Apr 28, 2009
- Negevtech Ltd.
- Dov Furman
- G01 - MEASURING TESTING
Information Patent Grant
System for detection of wafer defects
- Patent number 7,477,383
- Issue date Jan 13, 2009
- Negevtech Ltd.
- Dov Furman
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
PHOTOGRAPHY-TASK-SPECIFIC DIGITAL CAMERA APPARATUS AND METHODS USEF...
- Publication number 20140168462
- Publication date Jun 19, 2014
- Shai Silberstein
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
PHOTOGRAPHY-TASK-SPECIFIC DIGITAL CAMERA APPARATUS AND METHODS USE...
- Publication number 20120182435
- Publication date Jul 19, 2012
- Shai Silberstein
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Dynamic Illumination in Optical Inspection Systems
- Publication number 20090323052
- Publication date Dec 31, 2009
- Shai Silberstein
- G01 - MEASURING TESTING
Information Patent Application
Optical Inspection Tools Featuring Parallel Post-Inspection Analysis
- Publication number 20090324057
- Publication date Dec 31, 2009
- Shai Silberstein
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
WAFER INSPECTION USING SHORT-PULSED CONTINUOUS BROADBAND ILLUMINATION
- Publication number 20090225307
- Publication date Sep 10, 2009
- NEGEVTECH, LTD.
- Dov Furman
- G01 - MEASURING TESTING
Information Patent Application
Inspection Tools Supporting Multiple Operating States for Multiple...
- Publication number 20090201494
- Publication date Aug 13, 2009
- Dov Furman
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL INSPECTION TOOL FEATURING MULTIPLE SPEED MODES
- Publication number 20090030630
- Publication date Jan 29, 2009
- NEGEVTECH, LTD.
- Giora Eitan
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Optical Inspection Including Partial Scanning of Wafers
- Publication number 20080307908
- Publication date Dec 18, 2008
- Gilad Shomrony
- G01 - MEASURING TESTING
Information Patent Application
Image Splitting in Optical Inspection Systems
- Publication number 20080137073
- Publication date Jun 12, 2008
- NEGEVTECH, LTD.
- Dov Furman
- G01 - MEASURING TESTING
Information Patent Application
Image Splitting in Optical Inspection Systems
- Publication number 20080137074
- Publication date Jun 12, 2008
- NEGEVTECH, LTD.
- Dov Furman
- G01 - MEASURING TESTING
Information Patent Application
Wafer Inspection Using Short-Pulsed Continuous Broadband Illumination
- Publication number 20070273945
- Publication date Nov 29, 2007
- Dov Furman
- G01 - MEASURING TESTING
Information Patent Application
System for detection of wafer defects
- Publication number 20070019856
- Publication date Jan 25, 2007
- NEGEVTECH LTD.
- Dov Furman
- G01 - MEASURING TESTING
Information Patent Application
Photography-specific digital camera apparatus and methods useful in...
- Publication number 20070019094
- Publication date Jan 25, 2007
- Shai Silberstein
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
System for detection of wafer defects
- Publication number 20070013903
- Publication date Jan 18, 2007
- NEGEVTECH LTD.
- Dov Furman
- G01 - MEASURING TESTING
Information Patent Application
System for detection of wafer defects
- Publication number 20060244956
- Publication date Nov 2, 2006
- NEGEVTECH LTD.
- Dov Furman
- G01 - MEASURING TESTING
Information Patent Application
System for detection of wafer defects
- Publication number 20060244958
- Publication date Nov 2, 2006
- NEGEVTECH LTD.
- Dov Furman
- G01 - MEASURING TESTING
Information Patent Application
System for detection of wafer defects
- Publication number 20060244957
- Publication date Nov 2, 2006
- NEGEVTECH LTD.
- Dov Furman
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for detecting defects in wafers including alig...
- Publication number 20060193506
- Publication date Aug 31, 2006
- Negevtech Ltd.
- Yuval Dorphan
- G01 - MEASURING TESTING
Information Patent Application
System for detection of wafer defects
- Publication number 20050110987
- Publication date May 26, 2005
- NEGEVTECH LTD.
- Dov Furman
- G01 - MEASURING TESTING
Information Patent Application
System for detection of wafer defects
- Publication number 20040146295
- Publication date Jul 29, 2004
- NEGEVTECH LTD.
- Dov Furman
- G01 - MEASURING TESTING

Shai Silberstein

Person

Patents Grantslast 30 patents

Photography-task-specific digital camera apparatus and methods usef...

Photography-specific digital camera apparatus and methods useful in...

Optical inspection tools featuring parallel post-inspection analysis

Optical inspection tool featuring multiple speed modes

Dynamic illumination in optical inspection systems

System for detection of wafer defects

Optical inspection including partial scanning of wafers

System for detection of wafer defects

Inspection tools supporting multiple operating states for multiple...

Method and apparatus for detecting defects in wafers including alig...

Image splitting in optical inspection systems

Image splitting in optical inspection systems

Wafer inspection using short-pulsed continuous broadband illumination

Apparatus for determining optimum position of focus of an imaging s...

System for detection of water defects

System for detection of wafer defects

Patents Applicationslast 30 patents

PHOTOGRAPHY-TASK-SPECIFIC DIGITAL CAMERA APPARATUS AND METHODS USEF...

PHOTOGRAPHY-TASK-SPECIFIC DIGITAL CAMERA APPARATUS AND METHODS USE...

Dynamic Illumination in Optical Inspection Systems

Optical Inspection Tools Featuring Parallel Post-Inspection Analysis

WAFER INSPECTION USING SHORT-PULSED CONTINUOUS BROADBAND ILLUMINATION

Inspection Tools Supporting Multiple Operating States for Multiple...

OPTICAL INSPECTION TOOL FEATURING MULTIPLE SPEED MODES

Optical Inspection Including Partial Scanning of Wafers

Image Splitting in Optical Inspection Systems

Image Splitting in Optical Inspection Systems

Wafer Inspection Using Short-Pulsed Continuous Broadband Illumination

System for detection of wafer defects

Photography-specific digital camera apparatus and methods useful in...

System for detection of wafer defects

System for detection of wafer defects

System for detection of wafer defects

System for detection of wafer defects

Method and apparatus for detecting defects in wafers including alig...

System for detection of wafer defects

System for detection of wafer defects