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Shailesh Joshi
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Bengaluru, IN
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Patents Grants
last 30 patents
Information
Patent Grant
Methods and apparatus to compensate for radar system calibration ch...
Patent number
12,228,680
Issue date
Feb 18, 2025
Texas Instruments Incorporated
Karthik Subburaj
G01 - MEASURING TESTING
Information
Patent Grant
Cascaded radar system calibration of baseband imbalances
Patent number
12,078,749
Issue date
Sep 3, 2024
Texas Instruments Incorporated
Karthik Subburaj
G01 - MEASURING TESTING
Information
Patent Grant
Intermediate frequency amplifier with a configurable high-pass filter
Patent number
12,021,552
Issue date
Jun 25, 2024
Texas Instruments Incorporated
Karthik Subburaj
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Non-uniform multi-dimensional data access for radar data processing
Patent number
12,007,462
Issue date
Jun 11, 2024
Texas Instruments Incorporated
Karthik Subburaj
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Non-active chirp dithering in FMCW radar
Patent number
11,874,392
Issue date
Jan 16, 2024
Texas Instruments Incorporated
Shankar Ram Narayana Moorthy
G01 - MEASURING TESTING
Information
Patent Grant
Cascaded radar system calibration of baseband imbalances
Patent number
11,630,185
Issue date
Apr 18, 2023
Texas Instruments Incorporated
Karthik Subburaj
G01 - MEASURING TESTING
Information
Patent Grant
Methods and apparatus to compensate for radar system calibration ch...
Patent number
11,391,815
Issue date
Jul 19, 2022
Texas Instmments Incorporated
Karthik Subburaj
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
INTERMEDIATE FREQUENCY AMPLIFIER WITH A CONFIGURABLE HIGH-PASS FILTER
Publication number
20240305321
Publication date
Sep 12, 2024
TEXAS INSTRUMENTS INCORPORATED
Karthik SUBBURAJ
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
NON-UNIFORM MULTI-DIMENSIONAL DATA ACCESS FOR RADAR DATA PROCESSING
Publication number
20240288563
Publication date
Aug 29, 2024
TEXAS INSTRUMENTS INCORPORATED
Karthik SUBBURAJ
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
NON-ACTIVE CHIRP DITHERING IN FMCW RADAR
Publication number
20240094335
Publication date
Mar 21, 2024
TEXAS INSTRUMENTS INCORPORATED
Shankar Ram NARAYANA MOORTHY
G01 - MEASURING TESTING
Information
Patent Application
CASCADED RADAR SYSTEM CALIBRATION OF BASEBAND IMBALANCES
Publication number
20230213615
Publication date
Jul 6, 2023
TEXAS INSTRUMENTS INCORPORATED
KARTHIK SUBBURAJ
G01 - MEASURING TESTING
Information
Patent Application
INTERMEDIATE FREQUENCY AMPLIFIER WITH A CONFIGURABLE HIGH-PASS FILTER
Publication number
20230216528
Publication date
Jul 6, 2023
TEXAS INSTRUMENTS INCORPORATED
Karthik SUBBURAJ
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
METHODS AND APPARATUS TO COMPENSATE FOR RADAR SYSTEM CALIBRATION CH...
Publication number
20230204717
Publication date
Jun 29, 2023
TEXAS INSTRUMENTS INCORPORATED
Karthik Subburaj
G01 - MEASURING TESTING
Information
Patent Application
NON-ACTIVE CHIRP DITHERING IN FMCW RADAR
Publication number
20230017031
Publication date
Jan 19, 2023
TEXAS INSTRUMENTS INCORPORATED
Shankar Ram NARAYANA MOORTHY
G01 - MEASURING TESTING
Information
Patent Application
LINEAR APPROXIMATION OF A COMPLEX NUMBER MAGNITUDE
Publication number
20220366004
Publication date
Nov 17, 2022
TEXAS INSTRUMENTS INCORPORATED
Shailesh JOSHI
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
NON-UNIFORM MULTI-DIMENSIONAL DATA ACCESS FOR RADAR DATA PROCESSING
Publication number
20220120884
Publication date
Apr 21, 2022
TEXAS INSTRUMENTS INCORPORATED
Karthik SUBBURAJ
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
CASCADED RADAR SYSTEM CALIBRATION OF BASEBAND IMBALANCES
Publication number
20210149019
Publication date
May 20, 2021
TEXAS INSTRUMENTS INCORPORATED
KARTHIK SUBBURAJ
G01 - MEASURING TESTING
Information
Patent Application
METHODS AND APPARATUS TO COMPENSATE FOR RADAR SYSTEM CALIBRATION CH...
Publication number
20200132810
Publication date
Apr 30, 2020
TEXAS INSTRUMENTS INCORPORATED
Karthik Subburaj
G01 - MEASURING TESTING