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New Delhi, IN
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Patents Grants
last 30 patents
Information
Patent Grant
Scan chain diagnostic using scan stitching
Patent number
8,719,651
Issue date
May 6, 2014
Cadence Design Systems, Inc.
Nilabha Dev
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus to use physical design information to detect I...
Patent number
8,595,681
Issue date
Nov 26, 2013
Cadence Design Systems, Inc.
Senthil Arasu Thirunavukarasu
G01 - MEASURING TESTING
Information
Patent Grant
Testing to prescribe state capture by, and state retrieval from sca...
Patent number
8,584,074
Issue date
Nov 12, 2013
Cadence Design Systems, Inc.
Senthil Arasu Thirunavukarasu
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus to use physical design information to detect I...
Patent number
8,438,528
Issue date
May 7, 2013
Cadence Design Systems, Inc.
Senthil Arasu Thirunavukarasu
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus to use physical design information to detect I...
Patent number
8,429,593
Issue date
Apr 23, 2013
Cadence Design Systems, Inc.
Senthil Arasu Thirunavukarasu
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus to use physical design information to detect I...
Patent number
8,392,868
Issue date
Mar 5, 2013
Cadence Design Systems, Inc.
Senthil Arasu Thirunavukarasu
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus to use physical design information to detect I...
Patent number
8,336,019
Issue date
Dec 18, 2012
Cadence Design Systems, Inc.
Senthil Arasu Thirunavukarasu
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus to use physical design information to detect I...
Patent number
8,286,123
Issue date
Oct 9, 2012
Cadence Design Systems, Inc.
Senthil Arasu Thirunavukarasu
G01 - MEASURING TESTING
Information
Patent Grant
Method and system for selecting test vectors in statistical volume...
Patent number
8,190,953
Issue date
May 29, 2012
Sameer H. Chakravarthy
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus to detect manufacturing faults in power switches
Patent number
7,944,285
Issue date
May 17, 2011
Cadence Design Systems, Inc.
Senthil Arasu Thirunavukarasu
G11 - INFORMATION STORAGE
Information
Patent Grant
Testing to prescribe state capture by, and state retrieval from sca...
Patent number
7,886,263
Issue date
Feb 8, 2011
Cadence Design Systems, Inc.
Senthil Arasu Thirunavukarasu
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus to use physical design information to detect I...
Patent number
7,877,715
Issue date
Jan 25, 2011
Cadence Design Systems, Inc.
Senthil Arasu Thirunavukarasu
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
METHOD AND SYSTEM FOR SELECTING TEST VECTORS IN STATISTICAL VOLUME...
Publication number
20100088560
Publication date
Apr 8, 2010
Cadence Design Systems, Inc.
Sameer H. Chakravarthy
G01 - MEASURING TESTING