Shalini Pathak

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Gurgaon, IN

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Patents Grantslast 30 patents

Information Patent Grant
Partial chain reconfiguration for test time reduction
- Patent number 12,306,246
- Issue date May 20, 2025
- STMICROELECTRONICS INTERNATIONAL N.V.
- Sandeep Jain
- G01 - MEASURING TESTING
Information Patent Grant
Compression-based scan test system
- Patent number 12,265,121
- Issue date Apr 1, 2025
- STMICROELECTRONICS INTERNATIONAL N.V.
- Sandeep Jain
- G01 - MEASURING TESTING
Information Patent Grant
Test-time optimization with few slow scan pads
- Patent number 12,203,985
- Issue date Jan 21, 2025
- STMICROELECTRONICS INTERNATIONAL N.V.
- Sandeep Jain
- G01 - MEASURING TESTING
Information Patent Grant
Scan compression through pin data encoding
- Patent number 12,105,145
- Issue date Oct 1, 2024
- STMICROELECTRONICS INTERNATIONAL N.V.
- Sandeep Jain
- G01 - MEASURING TESTING
Information Patent Grant
Scan compression through pin data encoding
- Patent number 11,782,092
- Issue date Oct 10, 2023
- STMICROELECTRONICS INTERNATIONAL N.V.
- Sandeep Jain
- G01 - MEASURING TESTING
Information Patent Grant
Method and device for testing configuration memory cells in program...
- Patent number 7,167,404
- Issue date Jan 23, 2007
- STMicroelectronics Pvt. Ltd.
- Shalini Pathak
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
PARTIAL CHAIN RECONFIGURATION FOR TEST TIME REDUCTION
- Publication number 20250067803
- Publication date Feb 27, 2025
- STMicroelectronics International N.V.
- Sandeep Jain
- G01 - MEASURING TESTING
Information Patent Application
TEST-TIME OPTIMIZATION WITH FEW SLOW SCAN PADS
- Publication number 20250027994
- Publication date Jan 23, 2025
- STMicroelectronics International N.V.
- Sandeep JAIN
- G01 - MEASURING TESTING
Information Patent Application
COMPRESSION-BASED SCAN TEST SYSTEM
- Publication number 20240393393
- Publication date Nov 28, 2024
- STMicroelectronics International N.V.
- Sandeep Jain
- G01 - MEASURING TESTING
Information Patent Application
SCAN COMPRESSION THROUGH PIN DATA ENCODING
- Publication number 20230375617
- Publication date Nov 23, 2023
- STMicroelectronics International N.V.
- Sandeep Jain
- G01 - MEASURING TESTING
Information Patent Application
Method and device for testing configuration memory cells in program...
- Publication number 20040015758
- Publication date Jan 22, 2004
- STMicroelectronics Pvt. Ltd.
- Shalini Pathak
- G01 - MEASURING TESTING