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Shalini Pathak
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Gurgaon, IN
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Patents Grants
last 30 patents
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Patent Grant
Scan compression through pin data encoding
Patent number
11,782,092
Issue date
Oct 10, 2023
STMICROELECTRONICS INTERNATIONAL N.V.
Sandeep Jain
G01 - MEASURING TESTING
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Patent Grant
Method and device for testing configuration memory cells in program...
Patent number
7,167,404
Issue date
Jan 23, 2007
STMicroelectronics Pvt. Ltd.
Shalini Pathak
G11 - INFORMATION STORAGE
Patents Applications
last 30 patents
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Patent Application
SCAN COMPRESSION THROUGH PIN DATA ENCODING
Publication number
20230375617
Publication date
Nov 23, 2023
STMicroelectronics International N.V.
Sandeep Jain
G01 - MEASURING TESTING
Information
Patent Application
Method and device for testing configuration memory cells in program...
Publication number
20040015758
Publication date
Jan 22, 2004
STMicroelectronics Pvt. Ltd.
Shalini Pathak
G01 - MEASURING TESTING