Shane G. Nowell

Person

Boise, ID, US

People

Patents Grantslast 30 patents

Information Patent Grant
Voltage calibration scans to reduce memory device overhead
- Patent number 12,057,185
- Issue date Aug 6, 2024
- Micron Technology, Inc.
- Kishore Kumar Muchherla
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Voltage bin calibration based on a voltage distribution reference v...
- Patent number 11,966,616
- Issue date Apr 23, 2024
- Micron Technology, Inc.
- Kishore Kumar Muchherla
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Combination scan management for block families of a memory device
- Patent number 11,941,277
- Issue date Mar 26, 2024
- Micron Technology, Inc.
- Shane Nowell
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Managing voltage bin selection for blocks of a memory device
- Patent number 11,928,347
- Issue date Mar 12, 2024
- Micron Technology, Inc.
- Kishore Kumar Muchherla
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Error avoidance based on voltage distribution parameters of block f...
- Patent number 11,915,776
- Issue date Feb 27, 2024
- Micron Technology, Inc.
- Michael Sheperek
- G11 - INFORMATION STORAGE
Information Patent Grant
Block family-based error avoidance for memory devices
- Patent number 11,886,726
- Issue date Jan 30, 2024
- Micron Technology, Inc.
- Michael Sheperek
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Providing recovered data to a new memory cell at a memory sub-syste...
- Patent number 11,868,639
- Issue date Jan 9, 2024
- Micron Technology, Inc.
- Sampath K. Ratnam
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Combining sets of memory blocks in a memory device
- Patent number 11,853,556
- Issue date Dec 26, 2023
- Micron Technology, Inc.
- Steven Michael Kientz
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Managing bin placement for block families of a memory device based...
- Patent number 11,847,317
- Issue date Dec 19, 2023
- Micron Technology, Inc.
- Shane Nowell
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Operating temperature management of a memory sub-system
- Patent number 11,841,753
- Issue date Dec 12, 2023
- Shane Nowell
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Managing error-handling flows in memory devices
- Patent number 11,837,307
- Issue date Dec 5, 2023
- Micron Technology, Inc.
- Kishore Kumar Muchherla
- G11 - INFORMATION STORAGE
Information Patent Grant
Voltage offset bin selection by die group for memory devices
- Patent number 11,837,291
- Issue date Dec 5, 2023
- Micron Technology, Inc.
- Vamsi Pavan Rayaprolu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Determining voltage offsets for memory read operations
- Patent number 11,823,722
- Issue date Nov 21, 2023
- Micron Technology, Inc.
- Kishore Kumar Muchherla
- G11 - INFORMATION STORAGE
Information Patent Grant
Voltage bin calibration based on a temporary voltage shift offset
- Patent number 11,823,748
- Issue date Nov 21, 2023
- Micron Technology, Inc.
- Kishore Kumar Muchherla
- G11 - INFORMATION STORAGE
Information Patent Grant
Multi-tier threshold voltage offset bin calibration
- Patent number 11,783,901
- Issue date Oct 10, 2023
- Micron Technology, Inc.
- Kishore Kumar Muchherla
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Voltage based combining of block families for memory devices
- Patent number 11,768,619
- Issue date Sep 26, 2023
- Micron Technology, Inc.
- Michael Sheperek
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Block family combination and voltage bin selection
- Patent number 11,755,478
- Issue date Sep 12, 2023
- Micron Technology, Inc.
- Michael Sheperek
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Reliability scan assisted voltage bin selection
- Patent number 11,733,896
- Issue date Aug 22, 2023
- Micron Technology, Inc.
- Vamsi Pavan Rayaprolu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Error avoidance based on voltage distribution parameters of blocks
- Patent number 11,735,254
- Issue date Aug 22, 2023
- Micron Technology, Inc.
- Shane Nowell
- G11 - INFORMATION STORAGE
Information Patent Grant
Time-based combining for block families of a memory device
- Patent number 11,726,689
- Issue date Aug 15, 2023
- Micron Technology, Inc.
- Shane Nowell
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Smart sampling for block family scan
- Patent number 11,721,409
- Issue date Aug 8, 2023
- Micron Technology, Inc.
- Vamsi Pavan Rayaprolu
- G11 - INFORMATION STORAGE
Information Patent Grant
Extended cross-temperature handling in a memory sub-system
- Patent number 11,720,286
- Issue date Aug 8, 2023
- Micron Technology, Inc.
- Vamsi Pavan Rayaprolu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Mitigating a voltage condition of a memory cell in a memory sub-system
- Patent number 11,710,527
- Issue date Jul 25, 2023
- Micron Technology, Inc.
- Vamsi Pavan Rayaprolu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Managing error-handling flows in memory devices
- Patent number 11,709,727
- Issue date Jul 25, 2023
- Micron Technology, Inc.
- Kishore Kumar Muchherla
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Error avoidance based on voltage distribution parameters
- Patent number 11,705,193
- Issue date Jul 18, 2023
- Micron Technology, Inc.
- Shane Nowell
- G11 - INFORMATION STORAGE
Information Patent Grant
Managing read level voltage offsets for low threshold voltage offse...
- Patent number 11,705,192
- Issue date Jul 18, 2023
- Micron Technology, Inc.
- Kishore Kumar Muchherla
- G11 - INFORMATION STORAGE
Information Patent Grant
Charge loss scan operation management in memory devices
- Patent number 11,704,217
- Issue date Jul 18, 2023
- Micron Technology, Inc.
- Michael Sheperek
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Error-handling flows in memory devices based on bins
- Patent number 11,693,745
- Issue date Jul 4, 2023
- Micron Technology, Inc.
- Bruce A. Liikanen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Multiple open block families supporting multiple cursors of a memor...
- Patent number 11,675,509
- Issue date Jun 13, 2023
- Micron Technology, Inc.
- Shane Nowell
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Threshold voltage determination for calibrating voltage bins of a m...
- Patent number 11,675,529
- Issue date Jun 13, 2023
- Micron Technology, Inc.
- Kishore Kumar Muchherla
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
VOLTAGE BIN CALIBRATION BASED ON A VOLTAGE DISTRIBUTION REFERENCE V...
- Publication number 20240231676
- Publication date Jul 11, 2024
- Micron Technology, Inc.
- Kishore Kumar Muchherla
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
BLOCK FAMILY-BASED ERROR AVOIDANCE FOR MEMORY DEVICES
- Publication number 20240111445
- Publication date Apr 4, 2024
- Micron Technology, Inc.
- Michael Sheperek
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PROVIDING RECOVERED DATA TO A NEW MEMORY CELL AT A MEMORY SUB-SYSTE...
- Publication number 20240103749
- Publication date Mar 28, 2024
- Micron Technology, Inc.
- Sampath K. Ratnam
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MANAGING ERROR-HANDLING FLOWS IN MEMORY DEVICES
- Publication number 20230325273
- Publication date Oct 12, 2023
- Micron Technology, Inc.
- Kishore Kumar Muchherla
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DETERMINING VOLTAGE OFFSETS FOR MEMORY READ OPERATIONS
- Publication number 20230282293
- Publication date Sep 7, 2023
- Micron Technology, Inc.
- Kishore Kumar MUCHHERLA
- G11 - INFORMATION STORAGE
Information Patent Application
MANAGING VOLTAGE BIN SELECTION FOR BLOCKS OF A MEMORY DEVICE
- Publication number 20230205438
- Publication date Jun 29, 2023
- Micron Technology, Inc.
- Kishore Kumar Muchherla
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
COMBINATION SCAN MANAGEMENT FOR BLOCK FAMILIES OF A MEMORY DEVICE
- Publication number 20230205442
- Publication date Jun 29, 2023
- Micron Technology, Inc.
- Shane Nowell
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
VOLTAGE BIN CALIBRATION BASED ON A VOLTAGE DISTRIBUTION REFERENCE V...
- Publication number 20230205447
- Publication date Jun 29, 2023
- Micron Technology, Inc.
- Kishore Kumar Muchherla
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
VOLTAGE CALIBRATION SCANS TO REDUCE MEMORY DEVICE OVERHEAD
- Publication number 20230122275
- Publication date Apr 20, 2023
- Micron Technology, Inc.
- Kishore Kumar Muchherla
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MANAGING ERROR-HANDLING FLOWS IN MEMORY DEVICES
- Publication number 20230046724
- Publication date Feb 16, 2023
- Micron Technology, Inc.
- Kishore Kumar Muchherla
- G11 - INFORMATION STORAGE
Information Patent Application
ERROR AVOIDANCE BASED ON VOLTAGE DISTRIBUTION PARAMETERS OF BLOCK F...
- Publication number 20230012855
- Publication date Jan 19, 2023
- Micron Technology, Inc.
- Michael Sheperek
- G11 - INFORMATION STORAGE
Information Patent Application
VOLTAGE BIN CALIBRATION BASED ON A TEMPORARY VOTLAGE SHIFT OFFSET
- Publication number 20220392547
- Publication date Dec 8, 2022
- Micron Technology, Inc.
- Kishore Kumar Muchherla
- G11 - INFORMATION STORAGE
Information Patent Application
VOLTAGE BIN SELECTION FOR BLOCKS OF A MEMORY DEVICE AFTER POWER UP...
- Publication number 20220383955
- Publication date Dec 1, 2022
- Micron Technology, Inc.
- Kishore Kumar Muchherla
- G11 - INFORMATION STORAGE
Information Patent Application
MULTI-TIER THRESHOLD VOLTAGE OFFSET BIN CALIBRATION
- Publication number 20220375530
- Publication date Nov 24, 2022
- Micron Technology, Inc.
- Kishore Kumar Muchherla
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SMART SAMPLING FOR BLOCK FAMILY SCAN
- Publication number 20220366997
- Publication date Nov 17, 2022
- Micron Technology, Inc.
- Vamsi Pavan Rayaprolu
- G11 - INFORMATION STORAGE
Information Patent Application
MITIGATING A VOLTAGE CONDITION OF A MEMORY CELL IN A MEMORY SUB-SYSTEM
- Publication number 20220351786
- Publication date Nov 3, 2022
- Micron Technology, Inc.
- Vamsi Pavan Rayaprolu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
VOLTAGE BASED COMBINING OF BLOCK FAMILIES FOR MEMORY DEVICES
- Publication number 20220350488
- Publication date Nov 3, 2022
- Micron Technology, Inc.
- Michael Sheperek
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
THRESHOLD VOLTAGE DETERMINATION FOR CALIBRATING VOLTAGE BINS OF A M...
- Publication number 20220334752
- Publication date Oct 20, 2022
- Micron Technology, Inc.
- Kishore Kumar MUCHHERLA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ASSOCIATING MULTIPLE CURSORS WITH BLOCK FAMILY OF MEMORY DEVICE
- Publication number 20220334721
- Publication date Oct 20, 2022
- Micron Technology, Inc.
- Michael Sheperek
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DETERMINING VOLTAGE OFFSETS FOR MEMORY READ OPERATIONS
- Publication number 20220336023
- Publication date Oct 20, 2022
- Micron Technology, Inc.
- Kishore Kumar MUCHHERLA
- G11 - INFORMATION STORAGE
Information Patent Application
MANAGING BIN PLACEMENT FOR BLOCK FAMILIES OF A MEMORY DEVICE BASED...
- Publication number 20220326851
- Publication date Oct 13, 2022
- Micron Technology, Inc.
- Shane Nowell
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MANAGING ERROR-HANDLING FLOWS IN MEMORY DEVICES
- Publication number 20220318086
- Publication date Oct 6, 2022
- Micron Technology, Inc.
- Kishore Kumar Muchherla
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ERROR AVOIDANCE BASED ON VOLTAGE DISTRIBUTION PARAMETERS OF BLOCKS
- Publication number 20220319589
- Publication date Oct 6, 2022
- Micron Technology, Inc.
- Shane Nowell
- G11 - INFORMATION STORAGE
Information Patent Application
ERROR AVOIDANCE BASED ON VOLTAGE DISTRIBUTION PARAMETERS OF BLOCK F...
- Publication number 20220319630
- Publication date Oct 6, 2022
- Micron Technology, Inc.
- Michael Sheperek
- G11 - INFORMATION STORAGE
Information Patent Application
MANAGING VOLTAGE BIN SELECTION FOR BLOCKS OF A MEMORY DEVICE
- Publication number 20220317902
- Publication date Oct 6, 2022
- Micron Technology, Inc.
- Kishore Kumar Muchherla
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
VOLTAGE BIN CALIBRATION BASED ON A VOLTAGE DISTRIBUTION REFERENCE V...
- Publication number 20220300186
- Publication date Sep 22, 2022
- Micron Technology, Inc.
- Kishore Kumar Muchherla
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MANAGING ERROR-HANDLING FLOWS IN MEMORY DEVICES
- Publication number 20220301652
- Publication date Sep 22, 2022
- Micron Technology, Inc.
- Kishore Kumar Muchherla
- G11 - INFORMATION STORAGE
Information Patent Application
COMBINING SETS OF MEMORY BLOCKS IN A MEMORY DEVICE
- Publication number 20220300166
- Publication date Sep 22, 2022
- Micron Technology, Inc.
- Steven Michael Kientz
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
VOLTAGE CALIBRATION SCANS TO REDUCE MEMORY DEVICE OVERHEAD
- Publication number 20220293208
- Publication date Sep 15, 2022
- Micron Technology, Inc.
- Kishore Kumar MUCHHERLA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
RELIABILITY SCAN ASSISTED VOLTAGE BIN SELECTION
- Publication number 20220276784
- Publication date Sep 1, 2022
- Micron Technology, Inc.
- Vamsi Pavan Rayaprolu
- G06 - COMPUTING CALCULATING COUNTING

Shane G. Nowell

Person

Patents Grantslast 30 patents

Voltage calibration scans to reduce memory device overhead

Voltage bin calibration based on a voltage distribution reference v...

Combination scan management for block families of a memory device

Managing voltage bin selection for blocks of a memory device

Error avoidance based on voltage distribution parameters of block f...

Block family-based error avoidance for memory devices

Providing recovered data to a new memory cell at a memory sub-syste...

Combining sets of memory blocks in a memory device

Managing bin placement for block families of a memory device based...

Operating temperature management of a memory sub-system

Managing error-handling flows in memory devices

Voltage offset bin selection by die group for memory devices

Determining voltage offsets for memory read operations

Voltage bin calibration based on a temporary voltage shift offset

Multi-tier threshold voltage offset bin calibration

Voltage based combining of block families for memory devices

Block family combination and voltage bin selection

Reliability scan assisted voltage bin selection

Error avoidance based on voltage distribution parameters of blocks

Time-based combining for block families of a memory device

Smart sampling for block family scan

Extended cross-temperature handling in a memory sub-system

Mitigating a voltage condition of a memory cell in a memory sub-system

Managing error-handling flows in memory devices

Error avoidance based on voltage distribution parameters

Managing read level voltage offsets for low threshold voltage offse...

Charge loss scan operation management in memory devices

Error-handling flows in memory devices based on bins

Multiple open block families supporting multiple cursors of a memor...

Threshold voltage determination for calibrating voltage bins of a m...

Patents Applicationslast 30 patents

VOLTAGE BIN CALIBRATION BASED ON A VOLTAGE DISTRIBUTION REFERENCE V...

BLOCK FAMILY-BASED ERROR AVOIDANCE FOR MEMORY DEVICES

PROVIDING RECOVERED DATA TO A NEW MEMORY CELL AT A MEMORY SUB-SYSTE...

MANAGING ERROR-HANDLING FLOWS IN MEMORY DEVICES

DETERMINING VOLTAGE OFFSETS FOR MEMORY READ OPERATIONS

MANAGING VOLTAGE BIN SELECTION FOR BLOCKS OF A MEMORY DEVICE

COMBINATION SCAN MANAGEMENT FOR BLOCK FAMILIES OF A MEMORY DEVICE

VOLTAGE BIN CALIBRATION BASED ON A VOLTAGE DISTRIBUTION REFERENCE V...

VOLTAGE CALIBRATION SCANS TO REDUCE MEMORY DEVICE OVERHEAD

MANAGING ERROR-HANDLING FLOWS IN MEMORY DEVICES

ERROR AVOIDANCE BASED ON VOLTAGE DISTRIBUTION PARAMETERS OF BLOCK F...

VOLTAGE BIN CALIBRATION BASED ON A TEMPORARY VOTLAGE SHIFT OFFSET

VOLTAGE BIN SELECTION FOR BLOCKS OF A MEMORY DEVICE AFTER POWER UP...

MULTI-TIER THRESHOLD VOLTAGE OFFSET BIN CALIBRATION

SMART SAMPLING FOR BLOCK FAMILY SCAN

MITIGATING A VOLTAGE CONDITION OF A MEMORY CELL IN A MEMORY SUB-SYSTEM

VOLTAGE BASED COMBINING OF BLOCK FAMILIES FOR MEMORY DEVICES

THRESHOLD VOLTAGE DETERMINATION FOR CALIBRATING VOLTAGE BINS OF A M...

ASSOCIATING MULTIPLE CURSORS WITH BLOCK FAMILY OF MEMORY DEVICE

DETERMINING VOLTAGE OFFSETS FOR MEMORY READ OPERATIONS

MANAGING BIN PLACEMENT FOR BLOCK FAMILIES OF A MEMORY DEVICE BASED...

MANAGING ERROR-HANDLING FLOWS IN MEMORY DEVICES

ERROR AVOIDANCE BASED ON VOLTAGE DISTRIBUTION PARAMETERS OF BLOCKS

ERROR AVOIDANCE BASED ON VOLTAGE DISTRIBUTION PARAMETERS OF BLOCK F...

MANAGING VOLTAGE BIN SELECTION FOR BLOCKS OF A MEMORY DEVICE

VOLTAGE BIN CALIBRATION BASED ON A VOLTAGE DISTRIBUTION REFERENCE V...

MANAGING ERROR-HANDLING FLOWS IN MEMORY DEVICES

COMBINING SETS OF MEMORY BLOCKS IN A MEMORY DEVICE

VOLTAGE CALIBRATION SCANS TO REDUCE MEMORY DEVICE OVERHEAD

RELIABILITY SCAN ASSISTED VOLTAGE BIN SELECTION