Shang-Jung HSIEH

Person

CHU-PEI CITY, TW

People

Patents Grantslast 30 patents

Information Patent Grant
Probe head for high frequency signal test and medium or low frequen...
- Patent number 11,346,860
- Issue date May 31, 2022
- MPI Corporation
- Chin-Tien Yang
- G01 - MEASURING TESTING
Information Patent Grant
Probe head for high frequency signal test and medium or low frequen...
- Patent number 11,150,269
- Issue date Oct 19, 2021
- MPI Corporation
- Hui-Pin Yang
- G01 - MEASURING TESTING
Information Patent Grant
Vertical probe device and supporter used in the same
- Patent number 10,119,991
- Issue date Nov 6, 2018
- MPI Corporation
- Tsung-Yi Chen
- G01 - MEASURING TESTING
Information Patent Grant
Positioner of probe card and probe head of probe card
- Patent number 9,638,716
- Issue date May 2, 2017
- MPI CORPORATION
- Tzu-Yang Chen
- G01 - MEASURING TESTING
Information Patent Grant
Illuminating device with light guiding frame
- Patent number 8,770,786
- Issue date Jul 8, 2014
- Lextar Electronics Corporation
- Sheng-Ping Chen
- F21 - LIGHTING
Information Patent Grant
Optical reflection plate and lighting device having the same
- Patent number 8,662,711
- Issue date Mar 4, 2014
- Lextar Electronics Corporation
- Sheng-Ping Chen
- F21 - LIGHTING

Patents Applicationslast 30 patents

Information Patent Application
PROBE CARDS, DUT SIDE MODULES OF THE PROBE CARDS, TESTING METHODS A...
- Publication number 20240241155
- Publication date Jul 18, 2024
- MPI Corporation
- CHIN-YI LIN
- G01 - MEASURING TESTING
Information Patent Application
PROBE HEAD FOR HIGH FREQUENCY SIGNAL TEST AND MEDIUM OR LOW FREQUEN...
- Publication number 20210048451
- Publication date Feb 18, 2021
- MPI Corporation
- Chin-Tien YANG
- G01 - MEASURING TESTING
Information Patent Application
PROBE HEAD FOR HIGH FREQUENCY SIGNAL TEST AND MEDIUM OR LOW FREQUEN...
- Publication number 20210048452
- Publication date Feb 18, 2021
- MPI Corporation
- Hui-Pin YANG
- G01 - MEASURING TESTING
Information Patent Application
POSITIONER OF PROBE CARD AND PROBE HEAD OF PROBE CARD
- Publication number 20150377926
- Publication date Dec 31, 2015
- MPI Corporation
- Tzu-Yang Chen
- G01 - MEASURING TESTING
Information Patent Application
VERTICAL PROBE DEVICE AND SUPPORTER USED IN THE SAME
- Publication number 20150276800
- Publication date Oct 1, 2015
- MPI Corporation
- Tsung-Yi CHEN
- G01 - MEASURING TESTING
Information Patent Application
LIGHT EMITTING DEVICE
- Publication number 20130322086
- Publication date Dec 5, 2013
- Lextar Electronics Corporation
- Sheng-Ping Chen
- G02 - OPTICS
Information Patent Application
LIGHT-GUIDING ELEMENT, ILLUMINATION MODULE AND LAMINATE LAMP APPARATUS
- Publication number 20130258652
- Publication date Oct 3, 2013
- Lextar Electronics Corporation
- Shang-Jung HSIEH
- F21 - LIGHTING
Information Patent Application
OPTICAL REFLECTION PLATE AND LIGHTING DEVICE HAVING THE SAME
- Publication number 20130208468
- Publication date Aug 15, 2013
- Lextar Electronics Corporation
- Sheng-Ping Chen
- G02 - OPTICS

Shang-Jung HSIEH

Person

Patents Grantslast 30 patents

Probe head for high frequency signal test and medium or low frequen...

Probe head for high frequency signal test and medium or low frequen...

Vertical probe device and supporter used in the same

Positioner of probe card and probe head of probe card

Illuminating device with light guiding frame

Optical reflection plate and lighting device having the same

Patents Applicationslast 30 patents

PROBE CARDS, DUT SIDE MODULES OF THE PROBE CARDS, TESTING METHODS A...

PROBE HEAD FOR HIGH FREQUENCY SIGNAL TEST AND MEDIUM OR LOW FREQUEN...

PROBE HEAD FOR HIGH FREQUENCY SIGNAL TEST AND MEDIUM OR LOW FREQUEN...

POSITIONER OF PROBE CARD AND PROBE HEAD OF PROBE CARD

VERTICAL PROBE DEVICE AND SUPPORTER USED IN THE SAME

LIGHT EMITTING DEVICE

LIGHT-GUIDING ELEMENT, ILLUMINATION MODULE AND LAMINATE LAMP APPARATUS

OPTICAL REFLECTION PLATE AND LIGHTING DEVICE HAVING THE SAME