Shang-Tsang YEH

Follow

Person

Jhonghe City, TW

People

Patents Grantslast 30 patents

Information Patent Grant
Electrical connection defect detection system and method
- Patent number 8,350,575
- Issue date Jan 8, 2013
- Test Research, Inc.
- Su-Wei Tsai
- G01 - MEASURING TESTING
Information Patent Grant
Electrical connection defect detection device
- Patent number 8,324,908
- Issue date Dec 4, 2012
- Test Research, Inc.
- Su-Wei Tsai
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for testing printed circuit and method therefor
- Patent number 8,179,143
- Issue date May 15, 2012
- Test Research, Inc.
- Shang-Tsang Yeh
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
ELECTRICAL CONNECTION DEFECT DETECTION DEVICE
- Publication number 20110156718
- Publication date Jun 30, 2011
- Su-Wei TSAI
- G01 - MEASURING TESTING
Information Patent Application
ELECTRICAL CONNECTION DEFECT DETECTION SYSTEM AND METHOD
- Publication number 20110156717
- Publication date Jun 30, 2011
- Su-Wei TSAI
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS FOR TESTING PRINTED CIRCUIT AND METHOD THEREFOR
- Publication number 20100090679
- Publication date Apr 15, 2010
- Test Research, Inc
- Shang-Tsang YEH
- G01 - MEASURING TESTING