Shanwei Yang

Person

Beijing, CN

People

Patents Grantslast 30 patents

Information Patent Grant
Light-emitting diode chip, display substrate and manufacturing meth...
- Patent number 12,027,648
- Issue date Jul 2, 2024
- BOE MLED TECHNOLOGY CO., LTD.
- Junjie Ma
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for full-field measurement using dynamic laser doppler imaging
- Patent number 11,561,081
- Issue date Jan 24, 2023
- Beijing Jiaotong University
- Zhan Gao
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for full-field measurement using dynamic laser doppler imaging
- Patent number 10,883,817
- Issue date Jan 5, 2021
- Beijing Jiaotong University
- Zhan Gao
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
LIGHT-EMITTING DEVICE, LIGHT-EMITTING SUBSTRATE AND DISPLAY DEVICE
- Publication number 20240363799
- Publication date Oct 31, 2024
- BOE MLED TECHNOLOGY CO., LTD.
- Yuanda LU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
LIGHT EMITTING DIODE CHIP AND METHOD OF MANUFACTURING THE SAME, AND...
- Publication number 20240339575
- Publication date Oct 10, 2024
- BOE MLED TECHNOLOGY CO., LTD.
- Yuanda Lu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Light-Emitting Diode Chip, Display Substrate And Manufacturing Meth...
- Publication number 20240322082
- Publication date Sep 26, 2024
- BOE MLED TECHNOLOGY CO., LTD.
- Junjie Ma
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
LIGHT EMITTING DIODE CHIP, DISPLAY SUBSTRATE AND DISPLAY DEVICE
- Publication number 20240297283
- Publication date Sep 5, 2024
- BOE MLED TECHNOLOGY CO., LTD.
- Yuanda LU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
LIGHT-EMITTING DEVICE, LIGHT-EMITTING MODULE AND PREPARATION METHOD...
- Publication number 20240266470
- Publication date Aug 8, 2024
- BOE MLED TECHNOLOGY CO., LTD.
- Zhijun XIONG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
LIGHT EMITTING CHIP AND PRODUCING METHOD THEREOF, AND LIGHT EMITTIN...
- Publication number 20240213432
- Publication date Jun 27, 2024
- BOE MLED TECHNOLOGY CO., LTD.
- Shanwei YANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Light Emitting Device and Preparation Method Therefor, Light Emitti...
- Publication number 20240213422
- Publication date Jun 27, 2024
- BOE MLED TECHNOLOGY CO., LTD.
- Jiawei ZHAO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Light-Emitting Diode Chip, Display Substrate And Manufacturing Meth...
- Publication number 20220336706
- Publication date Oct 20, 2022
- BOE MLED TECHNOLOGY CO., LTD.
- Junjie Ma
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Light-emitting Chip and Light-emitting Substrate
- Publication number 20220254969
- Publication date Aug 11, 2022
- BOE MLED TECHNOLOGY CO., LTD.
- Linxia QI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR FULL-FIELD MEASUREMENT USING DYNAMIC LASER DOPPLER IMAGING
- Publication number 20210063137
- Publication date Mar 4, 2021
- BEIJING JIAOTONG UNIVERSITY
- Zhan Gao
- G01 - MEASURING TESTING

Shanwei Yang

Person

Patents Grantslast 30 patents

Light-emitting diode chip, display substrate and manufacturing meth...

Method for full-field measurement using dynamic laser doppler imaging

Method for full-field measurement using dynamic laser doppler imaging

Patents Applicationslast 30 patents

LIGHT-EMITTING DEVICE, LIGHT-EMITTING SUBSTRATE AND DISPLAY DEVICE

LIGHT EMITTING DIODE CHIP AND METHOD OF MANUFACTURING THE SAME, AND...

Light-Emitting Diode Chip, Display Substrate And Manufacturing Meth...

LIGHT EMITTING DIODE CHIP, DISPLAY SUBSTRATE AND DISPLAY DEVICE

LIGHT-EMITTING DEVICE, LIGHT-EMITTING MODULE AND PREPARATION METHOD...

LIGHT EMITTING CHIP AND PRODUCING METHOD THEREOF, AND LIGHT EMITTIN...

Light Emitting Device and Preparation Method Therefor, Light Emitti...

Light-Emitting Diode Chip, Display Substrate And Manufacturing Meth...

Light-emitting Chip and Light-emitting Substrate

METHOD FOR FULL-FIELD MEASUREMENT USING DYNAMIC LASER DOPPLER IMAGING