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Patents Grants
last 30 patents
Information
Patent Grant
Method of calibrating and debugging testing system
Patent number
9,880,252
Issue date
Jan 30, 2018
MPI Corporation
Wei-Cheng Ku
G01 - MEASURING TESTING
Information
Patent Grant
Testing system and method for testing of electrical connections
Patent number
9,759,743
Issue date
Sep 12, 2017
MPI Corporation
Wei-Cheng Ku
G01 - MEASURING TESTING
Information
Patent Grant
Method of operating testing system
Patent number
9,645,197
Issue date
May 9, 2017
MPI Corporation
Wei-Cheng Ku
G01 - MEASURING TESTING
Information
Patent Grant
Method of calibrating and debugging testing system
Patent number
9,581,676
Issue date
Feb 28, 2017
MPI CORPORATION
Wei-Cheng Ku
G01 - MEASURING TESTING
Information
Patent Grant
Electrical testing device
Patent number
9,523,708
Issue date
Dec 20, 2016
MPI Corporation
Wei-Cheng Ku
G01 - MEASURING TESTING
Information
Patent Grant
Electrical testing machine
Patent number
9,459,279
Issue date
Oct 4, 2016
MPI Corporation
Wei-Cheng Ku
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
METHOD OF CALIBRATING AND DEBUGGING TESTING SYSTEM
Publication number
20170146634
Publication date
May 25, 2017
MPI CORPORATION
WEI-CHENG KU
G01 - MEASURING TESTING
Information
Patent Application
METHOD OF CALIBRATING AND DEBUGGING TESTING SYSTEM
Publication number
20150241544
Publication date
Aug 27, 2015
MPI CORPORATION
WEI-CHENG KU
G01 - MEASURING TESTING
Information
Patent Application
Testing system and method for testing of electrical connections
Publication number
20150233969
Publication date
Aug 20, 2015
MPI CORPORATION
WEI-CHENG KU
G01 - MEASURING TESTING
Information
Patent Application
METHOD OF CALIBRATING AND OPERATING TESTING SYSTEM
Publication number
20150212186
Publication date
Jul 30, 2015
MPI CORPORATION
WEI-CHENG KU
G01 - MEASURING TESTING
Information
Patent Application
ELECTRICAL TESTING MACHINE
Publication number
20150204908
Publication date
Jul 23, 2015
MPI CORPORATION
WEI-CHENG KU
G01 - MEASURING TESTING
Information
Patent Application
ELECTRICAL TESTING DEVICE
Publication number
20150204907
Publication date
Jul 23, 2015
MPI CORPORATION
WEI-CHENG KU
G01 - MEASURING TESTING
Information
Patent Application
METHOD OF OPERATING TESTING SYSTEM
Publication number
20150204962
Publication date
Jul 23, 2015
MPI CORPORATION
WEI-CHENG KU
G01 - MEASURING TESTING