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Sharjinder Singh
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New Delhi, IN
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last 30 patents
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Patent Grant
Highly accurate defect identification and prioritization of fault l...
Patent number
10,338,137
Issue date
Jul 2, 2019
Cadence Design Systems, Inc.
Sameer Chakravarthy Chillarige
G01 - MEASURING TESTING
Information
Patent Grant
System and method performing scan chain diagnosis of an electronic...
Patent number
10,180,457
Issue date
Jan 15, 2019
Cadence Design Systems, Inc.
Sameer Chakravarthy Chillarige
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method and apparatus for automatic diagnosis of mis-compares
Patent number
10,060,976
Issue date
Aug 28, 2018
Cadence Design Systems, Inc.
Sharjinder Singh
G01 - MEASURING TESTING
Information
Patent Grant
System and method for diagnosing failure locations in electronic ci...
Patent number
9,864,004
Issue date
Jan 9, 2018
Cadence Design Systems, Inc.
Sameer Chakravarthy Chillarige
G01 - MEASURING TESTING
Information
Patent Grant
Method and system of collective failure diagnosis for multiple elec...
Patent number
9,400,311
Issue date
Jul 26, 2016
Cadence Design Systems, Inc.
Anil Malik
G01 - MEASURING TESTING