Sharon McCauley

Person

San Jose, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Methods and systems for inspection of wafers and reticles using des...
- Patent number 11,348,222
- Issue date May 31, 2022
- KLA-Tencor Technologies Corp.
- Paul Frank Marella
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Methods and systems for inspection of wafers and reticles using des...
- Patent number 10,713,771
- Issue date Jul 14, 2020
- KLA-Tencor Technologies Corp.
- Paul Frank Marella
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Computer-implemented methods for performing one or more defect-rela...
- Patent number 9,037,280
- Issue date May 19, 2015
- KLA-Tencor Technologies Corp.
- Mark Dishner
- G05 - CONTROLLING REGULATING
Information Patent Grant
Methods and systems for inspection of wafers and reticles using des...
- Patent number 9,002,497
- Issue date Apr 7, 2015
- KLA-Tencor Technologies Corp.
- William Volk
- G01 - MEASURING TESTING
Information Patent Grant
Methods and systems for binning defects detected on a specimen
- Patent number 7,570,800
- Issue date Aug 4, 2009
- KLA-Tencor Technologies Corp.
- Jason Z. Lin
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Flexible hybrid defect classification for semiconductor manufacturing
- Patent number 7,142,992
- Issue date Nov 28, 2006
- KLA-Tencor Technologies Corp.
- Patrick Huet
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Inspection system setup techniques
- Patent number 7,072,786
- Issue date Jul 4, 2006
- KLA-Tencor Technologies, Corporation
- David Bruce Coldren
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Inspection system setup techniques
- Patent number 6,959,251
- Issue date Oct 25, 2005
- KLA-Tencor Technologies, Corporation
- David Bruce Coldren
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...

Patents Applicationslast 30 patents

Information Patent Application
METHODS AND SYSTEMS FOR INSPECTION OF WAFERS AND RETICLES USING DES...
- Publication number 20200074619
- Publication date Mar 5, 2020
- KLA-Tencor Technologies Corporation
- Paul Frank Marella
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHODS AND SYSTEMS FOR INSPECTION OF WAFERS AND RETICLES USING DES...
- Publication number 20180247403
- Publication date Aug 30, 2018
- KLA-Tencor Technologies Corporation
- Paul Frank Marella
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Methods and Systems for Inspection of Wafers and Reticles Using Des...
- Publication number 20150178914
- Publication date Jun 25, 2015
- KLA-Tencor Technologies Corporation
- Paul Frank Marella
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHODS AND SYSTEMS FOR BINNING DEFECTS DETECTED ON A SPECIMEN
- Publication number 20090290784
- Publication date Nov 26, 2009
- KLA-Tencor Technologies Corporation
- Jason Z. Lin
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHODS AND SYSTEMS FOR INSPECTION OF WAFERS AND RETICLES USING DES...
- Publication number 20080081385
- Publication date Apr 3, 2008
- Paul Frank Marella
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Methods and systems for binning defects detected on a specimen
- Publication number 20070133860
- Publication date Jun 14, 2007
- Jason Z. Lin
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Computer-implemented methods for performing one or more defect-rela...
- Publication number 20060287751
- Publication date Dec 21, 2006
- Mark Dishner
- G05 - CONTROLLING REGULATING
Information Patent Application
FLEXIBLE HYBRID DEFECT CLASSIFICATION FOR SEMICONDUCTOR MANUFACTURING
- Publication number 20060265145
- Publication date Nov 23, 2006
- Patrick Huet
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Inspection system setup techniques
- Publication number 20060025948
- Publication date Feb 2, 2006
- KLA-Tencor Technologies Corporation
- David Bruce Coldren
- G05 - CONTROLLING REGULATING
Information Patent Application
Methods and systems for inspection of wafers and reticles using des...
- Publication number 20050004774
- Publication date Jan 6, 2005
- William Volk
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Inspection system setup techniques
- Publication number 20040038454
- Publication date Feb 26, 2004
- KLA-Tencor Technologies Corporation
- David Bruce Coldren
- G05 - CONTROLLING REGULATING

Sharon McCauley

Person

Patents Grantslast 30 patents

Methods and systems for inspection of wafers and reticles using des...

Methods and systems for inspection of wafers and reticles using des...

Computer-implemented methods for performing one or more defect-rela...

Methods and systems for inspection of wafers and reticles using des...

Methods and systems for binning defects detected on a specimen

Flexible hybrid defect classification for semiconductor manufacturing

Inspection system setup techniques

Inspection system setup techniques

Patents Applicationslast 30 patents

METHODS AND SYSTEMS FOR INSPECTION OF WAFERS AND RETICLES USING DES...

METHODS AND SYSTEMS FOR INSPECTION OF WAFERS AND RETICLES USING DES...

Methods and Systems for Inspection of Wafers and Reticles Using Des...

METHODS AND SYSTEMS FOR BINNING DEFECTS DETECTED ON A SPECIMEN

METHODS AND SYSTEMS FOR INSPECTION OF WAFERS AND RETICLES USING DES...

Methods and systems for binning defects detected on a specimen

Computer-implemented methods for performing one or more defect-rela...

FLEXIBLE HYBRID DEFECT CLASSIFICATION FOR SEMICONDUCTOR MANUFACTURING

Inspection system setup techniques

Methods and systems for inspection of wafers and reticles using des...

Inspection system setup techniques