Shauh-Teh Juang

Person

Saratoga, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Methodology of incorporating wafer physical measurement with digita...
- Patent number 11,120,182
- Issue date Sep 14, 2021
- Applied Materials, Inc.
- Jason Zse-cherng Lin
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Auto defect screening using adaptive machine learning in semiconduc...
- Patent number 10,754,309
- Issue date Aug 25, 2020
- Applied Materials, Inc.
- Jason Zse-Cherng Lin
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Auto defect screening using adaptive machine learning in semiconduc...
- Patent number 10,365,617
- Issue date Jul 30, 2019
- DMO Systems Limited
- Jason Zse-Cherng Lin
- G05 - CONTROLLING REGULATING
Information Patent Grant
System and method for discovering unknown problematic patterns in c...
- Patent number 9,547,745
- Issue date Jan 17, 2017
- DMO Systems Limited
- Shauh-Teh Juang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method for identifying systematic defects in wafer inspe...
- Patent number 9,142,014
- Issue date Sep 22, 2015
- DMO Systems Limited
- Jason Zse-Cherng Lin
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Signature analytics for improving lithographic process of manufactu...
- Patent number 8,938,695
- Issue date Jan 20, 2015
- DMO Systems Limited
- Shauh-Teh Juang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Process window signature patterns for lithography process control
- Patent number 8,318,391
- Issue date Nov 27, 2012
- ASML Netherlands B.V.
- Jun Ye
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Process window signature patterns for lithography process control
- Patent number 8,057,967
- Issue date Nov 15, 2011
- ASML Netherlands B.V.
- Jun Ye
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method for detecting, sampling, analyzing, and correcting marginal...
- Patent number 7,853,920
- Issue date Dec 14, 2010
- ASML Netherlands B.V.
- Moshe E. Preil
- G01 - MEASURING TESTING
Information Patent Grant
Method for identifying and using process window signature patterns...
- Patent number 7,695,876
- Issue date Apr 13, 2010
- Brion Technologies, Inc.
- Jun Ye
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Mechanisms for making and inspecting reticles
- Patent number 6,748,103
- Issue date Jun 8, 2004
- KLA Tencor
- Lance A. Glasser
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Apparatus and methods for collecting global data during a reticle i...
- Patent number 6,654,489
- Issue date Nov 25, 2003
- KLA-Tencor Technologies Corporation
- James N. Wiley
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Mechanisms for making and inspecting reticles
- Patent number 6,529,621
- Issue date Mar 4, 2003
- KLA Tencor
- Lance A. Glasser
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Apparatus and methods for collecting global data during a reticle i...
- Patent number 6,516,085
- Issue date Feb 4, 2003
- KLA Tencor
- James N. Wiley
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
METHODOLOGY OF INCORPORATING WAFER PHYSICAL MEASUREMENT WITH DIGITA...
- Publication number 20190384882
- Publication date Dec 19, 2019
- Applied Materials, Inc.
- Jason Zse-cherng LIN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
AUTO DEFECT SCREENING USING ADAPTIVE MACHINE LEARNING IN SEMICONDUC...
- Publication number 20190384236
- Publication date Dec 19, 2019
- Applied Materials, Inc.
- Jason Zse-Cherng LIN
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Application
AUTO DEFECT SCREENING USING ADAPTIVE MACHINE LEARNING IN SEMICONDUC...
- Publication number 20180164792
- Publication date Jun 14, 2018
- DMO SYSTEMS LIMITED
- Jason Zse-Cherng Lin
- G05 - CONTROLLING REGULATING
Information Patent Application
System And Method For Discovering Unknown Problematic Patterns In C...
- Publication number 20170032075
- Publication date Feb 2, 2017
- DMO SYSTEMS LIMITED
- Shauh-Teh Juang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Methodology Of Incorporating Wafer Physical Measurement With Digita...
- Publication number 20160217240
- Publication date Jul 28, 2016
- DMO SYSTEMS LIMITED
- Jason Zse-Cherng Lin
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEM AND METHOD FOR IDENTIFYING SYSTEMATIC DEFECTS IN WAFER INSPE...
- Publication number 20140355867
- Publication date Dec 4, 2014
- Jason Zse-Cherng Lin
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Apparatus For Design-Based Manufacturing Optimization In Semiconduc...
- Publication number 20140214192
- Publication date Jul 31, 2014
- DMO SYSTEMS LIMITED
- Shauh-Teh Juang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
EVENT-BASED BIO-SIGNAL CAPTURING SYSTEM
- Publication number 20130150698
- Publication date Jun 13, 2013
- OP Global Holdings Limited
- Fu-Chieh Hsu
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
Process Window Signature Patterns for Lithography Process Control
- Publication number 20120021343
- Publication date Jan 26, 2012
- ASML NETHERLANDS B.V.
- Jun Ye
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Method for identifying and using process window signature patterns...
- Publication number 20100151364
- Publication date Jun 17, 2010
- Brion Technology, Inc.
- Jun Ye
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
METHOD FOR IDENTIFYING AND USING PROCESS WINDOW SIGNATURE PATTERNS...
- Publication number 20070050749
- Publication date Mar 1, 2007
- BRION TECHNOLOGIES, INC.
- Jun Ye
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Method for detecting, sampling, analyzing, and correcting marginal...
- Publication number 20060273266
- Publication date Dec 7, 2006
- BRION TECHNOLOGIES, INC.
- Moshe E. Preil
- G01 - MEASURING TESTING
Information Patent Application
Mechanisms for making and inspecting reticles
- Publication number 20030142860
- Publication date Jul 31, 2003
- KLA-Tencor Technologies Corporation
- Lance A. Glasser
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Apparatus and methods for collecting global data during a reticle i...
- Publication number 20030091224
- Publication date May 15, 2003
- KLA-Tencor Technologies Corporation
- James N. Wiley
- G06 - COMPUTING CALCULATING COUNTING

Shauh-Teh Juang

Person

Patents Grantslast 30 patents

Methodology of incorporating wafer physical measurement with digita...

Auto defect screening using adaptive machine learning in semiconduc...

Auto defect screening using adaptive machine learning in semiconduc...

System and method for discovering unknown problematic patterns in c...

System and method for identifying systematic defects in wafer inspe...

Signature analytics for improving lithographic process of manufactu...

Process window signature patterns for lithography process control

Process window signature patterns for lithography process control

Method for detecting, sampling, analyzing, and correcting marginal...

Method for identifying and using process window signature patterns...

Mechanisms for making and inspecting reticles

Apparatus and methods for collecting global data during a reticle i...

Mechanisms for making and inspecting reticles

Apparatus and methods for collecting global data during a reticle i...

Patents Applicationslast 30 patents

METHODOLOGY OF INCORPORATING WAFER PHYSICAL MEASUREMENT WITH DIGITA...

AUTO DEFECT SCREENING USING ADAPTIVE MACHINE LEARNING IN SEMICONDUC...

AUTO DEFECT SCREENING USING ADAPTIVE MACHINE LEARNING IN SEMICONDUC...

System And Method For Discovering Unknown Problematic Patterns In C...

Methodology Of Incorporating Wafer Physical Measurement With Digita...

SYSTEM AND METHOD FOR IDENTIFYING SYSTEMATIC DEFECTS IN WAFER INSPE...

Apparatus For Design-Based Manufacturing Optimization In Semiconduc...

EVENT-BASED BIO-SIGNAL CAPTURING SYSTEM

Process Window Signature Patterns for Lithography Process Control

Method for identifying and using process window signature patterns...

METHOD FOR IDENTIFYING AND USING PROCESS WINDOW SIGNATURE PATTERNS...

Method for detecting, sampling, analyzing, and correcting marginal...

Mechanisms for making and inspecting reticles

Apparatus and methods for collecting global data during a reticle i...