Shaul COHEN

Person

Irus, IL

People

Patents Grantslast 30 patents

Information Patent Grant
Determination of defects and/or edge roughness in a specimen based...
- Patent number 11,854,184
- Issue date Dec 26, 2023
- Applied Materials Israel Ltd.
- Shalom Elkayam
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Segmentation of an image of a semiconductor specimen
- Patent number 11,631,179
- Issue date Apr 18, 2023
- Applied Materials Israel Ltd.
- Elad Ben Baruch
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Generating a training set usable for examination of a semiconductor...
- Patent number 11,232,550
- Issue date Jan 25, 2022
- Applied Materials Israel Ltd.
- Elad Ben Baruch
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Examination of a semiconductor specimen
- Patent number 11,022,566
- Issue date Jun 1, 2021
- Applied Materials Israel Ltd.
- Dror Alumot
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Registration between an image of an object and a description
- Patent number 10,902,620
- Issue date Jan 26, 2021
- Applied Materials Israel Ltd.
- Shaul Cohen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of performing metrology operations and system thereof
- Patent number 10,571,406
- Issue date Feb 25, 2020
- Applied Materials Israel Ltd.
- Ron Katzir
- G01 - MEASURING TESTING
Information Patent Grant
Evaluating an object
- Patent number 10,504,693
- Issue date Dec 10, 2019
- Applied Materials Israel Ltd.
- Shay Attal
- G01 - MEASURING TESTING
Information Patent Grant
Method of performing metrology operations and system thereof
- Patent number 10,296,702
- Issue date May 21, 2019
- Applied Materials Israel Ltd.
- Ron Katzir
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of performing metrology operations and system thereof
- Patent number 10,120,973
- Issue date Nov 6, 2018
- Applied Materials Israel Ltd.
- Ron Katzir
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
MACHINE LEARNING BASED EXAMINATION OF A SEMICONDUCTOR SPECIMEN AND...
- Publication number 20230306580
- Publication date Sep 28, 2023
- APPLIED MATERIALS ISRAEL LTD.
- Tal BEN-SHLOMO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DETERMINATION OF DEFECTS AND/OR EDGE ROUGHNESS IN A SPECIMEN BASED...
- Publication number 20220222797
- Publication date Jul 14, 2022
- APPLIED MATERIALS ISRAEL LTD.
- Shalom ELKAYAM
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
GENERATING A TRAINING SET USABLE FOR EXAMINATION OF A SEMICONDUCTOR...
- Publication number 20210407072
- Publication date Dec 30, 2021
- APPLIED MATERIALS ISRAEL LTD.
- Elad BEN BARUCH
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SEGMENTATION OF AN IMAGE OF A SEMICONDUCTOR SPECIMEN
- Publication number 20210407093
- Publication date Dec 30, 2021
- APPLIED MATERIALS ISRAEL LTD.
- Elad BEN BARUCH
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD OF PERFORMING METROLOGY OPERATIONS AND SYSTEM THEREOF
- Publication number 20190121933
- Publication date Apr 25, 2019
- APPLIED MATERIALS ISRAEL LTD.
- Ron KATZIR
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
EVALUATING AN OBJECT
- Publication number 20190088444
- Publication date Mar 21, 2019
- APPLIED MATERIALS ISRAEL, LTD.
- Shay Attal
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF PERFORMING METROLOGY OPERATIONS AND SYSTEM THEREOF
- Publication number 20180268098
- Publication date Sep 20, 2018
- APPLIED MATERIALS ISRAEL LTD.
- Ron KATZIR
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD OF PERFORMING METROLOGY OPERATIONS AND SYSTEM THEREOF
- Publication number 20180268099
- Publication date Sep 20, 2018
- APPLIED MATERIALS ISRAEL LTD.
- Ron KATZIR
- G06 - COMPUTING CALCULATING COUNTING

Shaul COHEN

Person

Patents Grantslast 30 patents

Determination of defects and/or edge roughness in a specimen based...

Segmentation of an image of a semiconductor specimen

Generating a training set usable for examination of a semiconductor...

Examination of a semiconductor specimen

Registration between an image of an object and a description

Method of performing metrology operations and system thereof

Evaluating an object

Method of performing metrology operations and system thereof

Method of performing metrology operations and system thereof

Patents Applicationslast 30 patents

MACHINE LEARNING BASED EXAMINATION OF A SEMICONDUCTOR SPECIMEN AND...

DETERMINATION OF DEFECTS AND/OR EDGE ROUGHNESS IN A SPECIMEN BASED...

GENERATING A TRAINING SET USABLE FOR EXAMINATION OF A SEMICONDUCTOR...

SEGMENTATION OF AN IMAGE OF A SEMICONDUCTOR SPECIMEN

METHOD OF PERFORMING METROLOGY OPERATIONS AND SYSTEM THEREOF

EVALUATING AN OBJECT

METHOD OF PERFORMING METROLOGY OPERATIONS AND SYSTEM THEREOF

METHOD OF PERFORMING METROLOGY OPERATIONS AND SYSTEM THEREOF