Shaul TEPLINSKY

Person

San Francisco, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Augmented reliability models for design and manufacturing
- Patent number 12,079,554
- Issue date Sep 3, 2024
- Optimal Plus Ltd.
- Shaul Teplinsky
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Methods of smart pairing
- Patent number 11,907,095
- Issue date Feb 20, 2024
- Optimal Plus Ltd.
- Shaul Teplinsky
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Methods and systems for detecting defects on an electronic assembly
- Patent number 11,852,684
- Issue date Dec 26, 2023
- Optimal Plus Ltd.
- Leonid Gurov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and system for real time outlier detection and product re-bi...
- Patent number 11,852,668
- Issue date Dec 26, 2023
- Optimal Plus Ltd.
- Shaul Teplinsky
- B07 - SEPARATING SOLIDS FROM SOLIDS SORTING
Information Patent Grant
Augmenting reliability models for manufactured products
- Patent number 11,829,125
- Issue date Nov 28, 2023
- OPTIMAL PLUS LTD.
- Shaul Teplinsky
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Parameter space reduction for device testing
- Patent number 11,789,074
- Issue date Oct 17, 2023
- National Instruments Corporation
- James C. Nagle
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Methods and systems for detecting defects on an electronic assembly
- Patent number 11,650,250
- Issue date May 16, 2023
- Optimal Plus Ltd.
- Leonid Gurov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Augmented reliability models for design and manufacturing
- Patent number 11,475,187
- Issue date Oct 18, 2022
- Optimal Plus Ltd.
- Shaul Teplinsky
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and system for real time outlier detection and product re-bi...
- Patent number 11,402,419
- Issue date Aug 2, 2022
- Optimal Plus Ltd.
- Shaul Teplinsky
- B07 - SEPARATING SOLIDS FROM SOLIDS SORTING
Information Patent Grant
Method and system for data collection and analysis for semiconducto...
- Patent number 11,143,689
- Issue date Oct 12, 2021
- Optimal Plus Ltd.
- Shaul Teplinsky
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Augmenting reliability models for manufactured products
- Patent number 11,068,478
- Issue date Jul 20, 2021
- Optimal Plus Ltd.
- Shaul Teplinsky
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Methods of smart pairing
- Patent number 11,061,795
- Issue date Jul 13, 2021
- Optimal Plus Ltd.
- Shaul Teplinsky
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Methods and systems for testing a tester
- Patent number 10,794,955
- Issue date Oct 6, 2020
- Optimal Plus Ltd.
- Hagay Gur
- G01 - MEASURING TESTING
Information Patent Grant
Dynamic process for adaptive tests
- Patent number 9,885,751
- Issue date Feb 6, 2018
- Optimal Plus Ltd.
- Eran Rousseau
- G01 - MEASURING TESTING
Information Patent Grant
Detection of counterfeit electronic items
- Patent number 9,767,459
- Issue date Sep 19, 2017
- Optimal Plus Ltd.
- Shaul Teplinsky
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
SYSTEM AND METHOD OF ADAPTIVELY ASSIGNING SCENARIO-BASED TESTS TO T...
- Publication number 20240160542
- Publication date May 16, 2024
- National Instruments Corporation
- Shaul Teplinsky
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND SYSTEM FOR REAL TIME OUTLIER DETECTION AND PRODUCT RE-BI...
- Publication number 20240159813
- Publication date May 16, 2024
- Optimal Plus
- Shaul Teplinsky
- B07 - SEPARATING SOLIDS FROM SOLIDS SORTING
Information Patent Application
METHODS AND SYSTEMS FOR DETECTING DEFECTS ON AN ELECTRONIC ASSEMBLY
- Publication number 20230236245
- Publication date Jul 27, 2023
- Optimal Plus Ltd.
- Leonid Gurov
- G01 - MEASURING TESTING
Information Patent Application
PARAMETER SPACE REDUCTION FOR DEVICE TESTING
- Publication number 20230114555
- Publication date Apr 13, 2023
- National Instruments Corporation
- James C. Nagle
- G01 - MEASURING TESTING
Information Patent Application
AUGMENTED RELIABILITY MODELS FOR DESIGN AND MANUFACTURING
- Publication number 20230032092
- Publication date Feb 2, 2023
- Optimal Plus Ltd.
- Shaul Teplinsky
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND SYSTEM FOR REAL TIME OUTLIER DETECTION AND PRODUCT RE-BI...
- Publication number 20220349930
- Publication date Nov 3, 2022
- Optimal Plus Ltd.
- Shaul Teplinsky
- B07 - SEPARATING SOLIDS FROM SOLIDS SORTING
Information Patent Application
AUGMENTING RELIABILITY MODELS FOR MANUFACTURED PRODUCTS
- Publication number 20210271672
- Publication date Sep 2, 2021
- Optimal Plus Ltd.
- Shaul Teplinsky
- G05 - CONTROLLING REGULATING
Information Patent Application
METHODS OF SMART PAIRING
- Publication number 20210263827
- Publication date Aug 26, 2021
- Optimal Plus Ltd.
- Shaul Teplinsky
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHODS AND SYSTEMS FOR DETECTING DEFECTS ON AN ELECTRONIC ASSEMBLY
- Publication number 20210041501
- Publication date Feb 11, 2021
- Optimal Plus Ltd.
- Leonid GUROV
- G01 - MEASURING TESTING
Information Patent Application
AUGMENTED RELIABILITY MODELS FOR DESIGN AND MANUFACTURING
- Publication number 20200302100
- Publication date Sep 24, 2020
- Optimal Plus Ltd.
- Shaul Teplinsky
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND SYSTEM FOR REAL TIME OUTLIER DETECTION AND PRODUCT RE-BI...
- Publication number 20200150173
- Publication date May 14, 2020
- Shaul Teplinsky
- B07 - SEPARATING SOLIDS FROM SOLIDS SORTING
Information Patent Application
METHODS AND SYSTEMS FOR TESTING A TESTER
- Publication number 20200116789
- Publication date Apr 16, 2020
- Optimal Plus Ltd.
- Hagay GUR
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR DATA COLLECTION AND ANALYSIS FOR SEMICONDUCTO...
- Publication number 20180348290
- Publication date Dec 6, 2018
- Optimal Plus Ltd.
- Shaul Teplinsky
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR DATA COLLECTION AND ANALYSIS FOR SEMICONDUCTO...
- Publication number 20180348291
- Publication date Dec 6, 2018
- Optimal Plus Ltd.
- Shaul Teplinsky
- G01 - MEASURING TESTING
Information Patent Application
METHODS OF SMART PAIRING
- Publication number 20180053104
- Publication date Feb 22, 2018
- Optimal Plus Ltd.
- Shaul Teplinsky
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DETECTION OF COUNTERFEIT ELECTRONIC ITEMS
- Publication number 20170262860
- Publication date Sep 14, 2017
- Optimal Plus Ltd.
- Shaul TEPLINSKY
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DYNAMIC PROCESS FOR ADAPTIVE TESTS
- Publication number 20170160342
- Publication date Jun 8, 2017
- Optimal Plus Ltd.
- Eran ROUSSEAU
- G01 - MEASURING TESTING
Information Patent Application
OBSCURELY RENDERING CONTENT USING IMAGE SPLITTING TECHNIQUES
- Publication number 20150371613
- Publication date Dec 24, 2015
- ContentGuard Holdings, Inc.
- Satyadev Rajesh Patel
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
OBSCURELY RENDERING CONTENT USING MASKING TECHNIQUES
- Publication number 20150371014
- Publication date Dec 24, 2015
- ContentGuard Holdings, Inc.
- Michael Charles Raley
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
OBSCURELY RENDERING CONTENT USING MASKING TECHNIQUES
- Publication number 20150371611
- Publication date Dec 24, 2015
- ContentGuard Holdings, Inc.
- Michael Charles Raley
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS

Shaul TEPLINSKY

Person

Patents Grantslast 30 patents

Augmented reliability models for design and manufacturing

Methods of smart pairing

Methods and systems for detecting defects on an electronic assembly

Method and system for real time outlier detection and product re-bi...

Augmenting reliability models for manufactured products

Parameter space reduction for device testing

Methods and systems for detecting defects on an electronic assembly

Augmented reliability models for design and manufacturing

Method and system for real time outlier detection and product re-bi...

Method and system for data collection and analysis for semiconducto...

Augmenting reliability models for manufactured products

Methods of smart pairing

Methods and systems for testing a tester

Dynamic process for adaptive tests

Detection of counterfeit electronic items

Patents Applicationslast 30 patents

SYSTEM AND METHOD OF ADAPTIVELY ASSIGNING SCENARIO-BASED TESTS TO T...

METHOD AND SYSTEM FOR REAL TIME OUTLIER DETECTION AND PRODUCT RE-BI...

METHODS AND SYSTEMS FOR DETECTING DEFECTS ON AN ELECTRONIC ASSEMBLY

PARAMETER SPACE REDUCTION FOR DEVICE TESTING

AUGMENTED RELIABILITY MODELS FOR DESIGN AND MANUFACTURING

METHOD AND SYSTEM FOR REAL TIME OUTLIER DETECTION AND PRODUCT RE-BI...

AUGMENTING RELIABILITY MODELS FOR MANUFACTURED PRODUCTS

METHODS OF SMART PAIRING

METHODS AND SYSTEMS FOR DETECTING DEFECTS ON AN ELECTRONIC ASSEMBLY

AUGMENTED RELIABILITY MODELS FOR DESIGN AND MANUFACTURING

METHOD AND SYSTEM FOR REAL TIME OUTLIER DETECTION AND PRODUCT RE-BI...

METHODS AND SYSTEMS FOR TESTING A TESTER

METHOD AND SYSTEM FOR DATA COLLECTION AND ANALYSIS FOR SEMICONDUCTO...

METHOD AND SYSTEM FOR DATA COLLECTION AND ANALYSIS FOR SEMICONDUCTO...

METHODS OF SMART PAIRING

DETECTION OF COUNTERFEIT ELECTRONIC ITEMS

DYNAMIC PROCESS FOR ADAPTIVE TESTS

OBSCURELY RENDERING CONTENT USING IMAGE SPLITTING TECHNIQUES

OBSCURELY RENDERING CONTENT USING MASKING TECHNIQUES

OBSCURELY RENDERING CONTENT USING MASKING TECHNIQUES