Shawn A. Adderly

Person

Essex Junction, VT, US

People

Patents Grantslast 30 patents

Information Patent Grant
Nano deposition and ablation for the repair and fabrication of inte...
- Patent number 10,607,899
- Issue date Mar 31, 2020
- International Business Machines Corporation
- Shawn A. Adderly
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Waveguide structures used in phonotics chip packaging
- Patent number 10,078,183
- Issue date Sep 18, 2018
- GLOBALFOUNDRIES Inc.
- Shawn A. Adderly
- G02 - OPTICS
Information Patent Grant
Centering substrates on a chuck
- Patent number 9,997,385
- Issue date Jun 12, 2018
- International Business Machines Corporation
- Shawn A. Adderly
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus and method for centering substrates on a chuck
- Patent number 9,685,362
- Issue date Jun 20, 2017
- International Business Machines Corporation
- Shawn A. Adderly
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Nano deposition and ablation for the repair and fabrication of inte...
- Patent number 9,583,401
- Issue date Feb 28, 2017
- International Business Machines Corporation
- Shawn A. Adderly
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Method of fine-tuning process controls during integrated circuit ch...
- Patent number 9,576,863
- Issue date Feb 21, 2017
- International Business Machines Corporation
- Shawn A. Adderly
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Void monitoring device for measurement of wafer temperature variations
- Patent number 9,543,219
- Issue date Jan 10, 2017
- GLOBALFOUNDRIES Inc.
- Shawn A. Adderly
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for detecting foreign material on a chuck
- Patent number 9,508,578
- Issue date Nov 29, 2016
- GLOBALFOUNDRIES Inc.
- Shawn A. Adderly
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of fine-tuning process controls during integrated circuit ch...
- Patent number 9,330,988
- Issue date May 3, 2016
- International Business Machines Corporation
- Shawn A. Adderly
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Uniform roughness on backside of a wafer
- Patent number 9,275,868
- Issue date Mar 1, 2016
- GLOBALFOUNDRIES Inc.
- Shawn A. Adderly
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Anticipatorily loading a page of memory
- Patent number 9,201,806
- Issue date Dec 1, 2015
- International Business Machines Corporation
- Shawn A. Adderly
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Achieving uniform capacitance between an electrostatic chuck and a...
- Patent number 9,196,519
- Issue date Nov 24, 2015
- GLOBALFOUNDRIES Inc.
- Shawn A. Adderly
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor structures with metal lines
- Patent number 9,087,839
- Issue date Jul 21, 2015
- International Business Machines Corporation
- Shawn A. Adderly
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for reducing lateral extrusion formed in semiconductor struc...
- Patent number 9,006,703
- Issue date Apr 14, 2015
- International Business Machines Corporation
- Shawn A. Adderly
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
CENTERING SUBSTRATES ON A CHUCK
- Publication number 20180240694
- Publication date Aug 23, 2018
- International Business Machines Corporation
- Shawn A. Adderly
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CENTERING SUBSTRATES ON A CHUCK
- Publication number 20170221742
- Publication date Aug 3, 2017
- International Business Machines Corporation
- Shawn A. Adderly
- G01 - MEASURING TESTING
Information Patent Application
WAVEGUIDE STRUCTURES
- Publication number 20170168242
- Publication date Jun 15, 2017
- GLOBALFOUNDRIES INC.
- Shawn A. Adderly
- G02 - OPTICS
Information Patent Application
NANO DEPOSITION AND ABLATION FOR THE REPAIR AND FABRICATION OF INTE...
- Publication number 20170117195
- Publication date Apr 27, 2017
- International Business Machines Corporation
- Shawn A. Adderly
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF FINE-TUNING PROCESS CONTROLS DURING INTEGRATED CIRCUIT CH...
- Publication number 20160181166
- Publication date Jun 23, 2016
- International Business Machines Corporation
- Shawn A. Adderly
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
VOID MONITORING DEVICE FOR MEASUREMENT OF WAFER TEMPERATURE VARIATIONS
- Publication number 20160155675
- Publication date Jun 2, 2016
- International Business Machines Corporation
- Shawn A. Adderly
- G01 - MEASURING TESTING
Information Patent Application
Apparatus and Method for Centering Substrates on a Chuck
- Publication number 20150235881
- Publication date Aug 20, 2015
- International Business Machines Corporation
- Shawn A. Adderly
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
NANO DEPOSITION AND ABLATION FOR THE REPAIR AND FABRICATION OF INTE...
- Publication number 20150228548
- Publication date Aug 13, 2015
- International Business Machines Corporation
- Shawn A. Adderly
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
METHOD AND APPARATUS FOR DETECTING FOREIGN MATERIAL ON A CHUCK
- Publication number 20150219479
- Publication date Aug 6, 2015
- International Business Machines Corporation
- Shawn A. Adderly
- G01 - MEASURING TESTING
Information Patent Application
ACHIEVING UNIFORM CAPACITANCE BETWEEN AN ELECTROSTATIC CHUCK AND A...
- Publication number 20150138686
- Publication date May 21, 2015
- International Business Machines Corporation
- Shawn A. Adderly
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR REDUCING LATERAL EXTRUSION FORMED IN SEMICONDUCTOR STRUC...
- Publication number 20150035117
- Publication date Feb 5, 2015
- International Business Machines Corporation
- Shawn A. Adderly
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
UNIFORM ROUGHNESS ON BACKSIDE OF A WAFER
- Publication number 20150021743
- Publication date Jan 22, 2015
- International Business Machines Corporation
- Shawn A. ADDERLY
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR STRUCTURES WITH METAL LINES
- Publication number 20140291802
- Publication date Oct 2, 2014
- International Business Machines Corporation
- Shawn A. Adderly
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ANTICIPATORILY LOADING A PAGE OF MEMORY
- Publication number 20140195771
- Publication date Jul 10, 2014
- International Business Machines Corporation
- Shawn A. Adderly
- G06 - COMPUTING CALCULATING COUNTING

Shawn A. Adderly

Person

Patents Grantslast 30 patents

Nano deposition and ablation for the repair and fabrication of inte...

Waveguide structures used in phonotics chip packaging

Centering substrates on a chuck

Apparatus and method for centering substrates on a chuck

Nano deposition and ablation for the repair and fabrication of inte...

Method of fine-tuning process controls during integrated circuit ch...

Void monitoring device for measurement of wafer temperature variations

Method and apparatus for detecting foreign material on a chuck

Method of fine-tuning process controls during integrated circuit ch...

Uniform roughness on backside of a wafer

Anticipatorily loading a page of memory

Achieving uniform capacitance between an electrostatic chuck and a...

Semiconductor structures with metal lines

Method for reducing lateral extrusion formed in semiconductor struc...

Patents Applicationslast 30 patents

CENTERING SUBSTRATES ON A CHUCK

CENTERING SUBSTRATES ON A CHUCK

WAVEGUIDE STRUCTURES

NANO DEPOSITION AND ABLATION FOR THE REPAIR AND FABRICATION OF INTE...

METHOD OF FINE-TUNING PROCESS CONTROLS DURING INTEGRATED CIRCUIT CH...

VOID MONITORING DEVICE FOR MEASUREMENT OF WAFER TEMPERATURE VARIATIONS

Apparatus and Method for Centering Substrates on a Chuck

NANO DEPOSITION AND ABLATION FOR THE REPAIR AND FABRICATION OF INTE...

METHOD AND APPARATUS FOR DETECTING FOREIGN MATERIAL ON A CHUCK

ACHIEVING UNIFORM CAPACITANCE BETWEEN AN ELECTROSTATIC CHUCK AND A...

METHOD FOR REDUCING LATERAL EXTRUSION FORMED IN SEMICONDUCTOR STRUC...

UNIFORM ROUGHNESS ON BACKSIDE OF A WAFER

SEMICONDUCTOR STRUCTURES WITH METAL LINES

ANTICIPATORILY LOADING A PAGE OF MEMORY