Shawn McVey

Person

Newton, NH, US

People

Patents Grantslast 30 patents

Information Patent Grant
Inspection system and inspection method to qualify semiconductor st...
- Patent number 11,378,532
- Issue date Jul 5, 2022
- Carl Zeiss SMT GmbH
- Brett Lewis
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam system and method of operating a charged part...
- Patent number 9,640,364
- Issue date May 2, 2017
- Carl Zeiss Microscopy, LLC
- John A. Notte
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam system and method of operating a charged part...
- Patent number 9,627,172
- Issue date Apr 18, 2017
- Carl Zeiss Microscopy, LLC
- John A. Notte
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam system and method of operating a charged part...
- Patent number 9,536,699
- Issue date Jan 3, 2017
- Carl Zeiss Microscopy, LLC
- John A. Notte
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Charged particle beam system and method of operating a charged part...
- Patent number 9,218,935
- Issue date Dec 22, 2015
- Carl Zeiss Microscopy, LLC
- John A. Notte
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Charged particle beam system and method of operating a charged part...
- Patent number 9,218,934
- Issue date Dec 22, 2015
- Carl Zeiss Microscopy, LLC
- John A. Notte
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Charged particle detectors
- Patent number 9,000,396
- Issue date Apr 7, 2015
- Carl Zeiss Microscopy, LLC
- Raymond Hill
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion sources, systems and methods
- Patent number 7,521,693
- Issue date Apr 21, 2009
- ALIS Corporation
- Billy W. Ward
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
INSPECTION SYSTEM AND INSPECTION METHOD TO QUALIFY SEMICONDUCTOR ST...
- Publication number 20210109046
- Publication date Apr 15, 2021
- Carl Zeiss SMT GMBH
- Brett Lewis
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged Particle Beam System and Method of Operating a Charged Part...
- Publication number 20160111243
- Publication date Apr 21, 2016
- Carl Zeiss Microscopy, LLC
- John A. Notte
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged Particle Beam System and Method of Operating a Charged Part...
- Publication number 20160104598
- Publication date Apr 14, 2016
- Carl Zeiss Microscopy, LLC
- John A. Notte
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged Particle Beam System and Method of Operating a Charged Part...
- Publication number 20150008333
- Publication date Jan 8, 2015
- John A. Notte
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM SYSTEM AND METHOD OF OPERATING A CHARGED PART...
- Publication number 20150008332
- Publication date Jan 8, 2015
- Carl Zeiss Microscopy, LLC
- John A. Notte
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM SYSTEM AND METHOD OF OPERATING A CHARGED PART...
- Publication number 20150008334
- Publication date Jan 8, 2015
- Carl Zeiss Microscopy, LLC
- John A. Notte
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
COOLED CHARGED PARTICLE SYSTEMS AND METHODS
- Publication number 20130118184
- Publication date May 16, 2013
- CARL ZEISS NTS, LLC.
- Alexander Groholski
- F17 - STORING OF DISTRIBUTING GASES OR LIQUIDS
Information Patent Application
CHARGED PARTICLE DETECTORS
- Publication number 20120068068
- Publication date Mar 22, 2012
- CARL ZEISS NTS, LLC.
- Raymond Hill
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Ion sources, systems and methods
- Publication number 20070205375
- Publication date Sep 6, 2007
- Billy W. Ward
- B82 - NANO-TECHNOLOGY

Shawn McVey

Person

Patents Grantslast 30 patents

Inspection system and inspection method to qualify semiconductor st...

Charged particle beam system and method of operating a charged part...

Charged particle beam system and method of operating a charged part...

Charged particle beam system and method of operating a charged part...

Charged particle beam system and method of operating a charged part...

Charged particle beam system and method of operating a charged part...

Charged particle detectors

Ion sources, systems and methods

Patents Applicationslast 30 patents

INSPECTION SYSTEM AND INSPECTION METHOD TO QUALIFY SEMICONDUCTOR ST...

Charged Particle Beam System and Method of Operating a Charged Part...

Charged Particle Beam System and Method of Operating a Charged Part...

Charged Particle Beam System and Method of Operating a Charged Part...

CHARGED PARTICLE BEAM SYSTEM AND METHOD OF OPERATING A CHARGED PART...

CHARGED PARTICLE BEAM SYSTEM AND METHOD OF OPERATING A CHARGED PART...

COOLED CHARGED PARTICLE SYSTEMS AND METHODS

CHARGED PARTICLE DETECTORS

Ion sources, systems and methods