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Shay Attal
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Rehovot, IL
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Patents Grants
last 30 patents
Information
Patent Grant
Image acquisition by an electron beam examination tool for metrolog...
Patent number
11,828,714
Issue date
Nov 28, 2023
Applied Materials Israel Ltd.
Bobin Mathew Skaria
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
System and methods of generating comparable regions of a lithograph...
Patent number
11,263,741
Issue date
Mar 1, 2022
Applied Materials Israel Ltd.
Boaz Cohen
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Overlay monitoring
Patent number
11,054,753
Issue date
Jul 6, 2021
Applied Materials Israel Ltd.
Vladislav Kaplan
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Evaluating an object
Patent number
10,504,693
Issue date
Dec 10, 2019
Applied Materials Israel Ltd.
Shay Attal
G01 - MEASURING TESTING
Information
Patent Grant
System and method for printability based inspection
Patent number
9,927,375
Issue date
Mar 27, 2018
Applied Materials Israel Ltd.
Shay Attal
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
IMAGE ACQUISITION BY AN ELECTRON BEAM EXAMINATION TOOL FOR METROLOG...
Publication number
20220099592
Publication date
Mar 31, 2022
APPLIED MATERIALS ISRAEL LTD.
Bobin Mathew SKARIA
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SYSTEM AND METHODS OF GENERATING COMPARABLE REGIONS OF A LITHOGRAPH...
Publication number
20210233220
Publication date
Jul 29, 2021
APPLIED MATERIALS ISRAEL LTD.
Boaz Cohen
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
EVALUATING AN OBJECT
Publication number
20190088444
Publication date
Mar 21, 2019
APPLIED MATERIALS ISRAEL, LTD.
Shay Attal
G01 - MEASURING TESTING
Information
Patent Application
SYSTEM AND METHOD FOR PRINTABILITY BASED INSPECTION
Publication number
20170176347
Publication date
Jun 22, 2017
APPLIED MATERIALS ISRAEL, LTD.
Shay Attal
G01 - MEASURING TESTING