Shay Wolfling

Person

Qiryat-Ono, IL

People

Patents Grantslast 30 patents

Information Patent Grant
Method and system for optical characterization of patterned samples
- Patent number 11,885,737
- Issue date Jan 30, 2024
- Nova Ltd.
- Dror Shafir
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for optical characterization of patterned samples
- Patent number 10,876,959
- Issue date Dec 29, 2020
- Nova Measuring Instruments Ltd.
- Dror Shafir
- G01 - MEASURING TESTING
Information Patent Grant
Overlay design optimization
- Patent number 10,311,198
- Issue date Jun 4, 2019
- Nova Measuring Instruments Ltd.
- Gilad Barak
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and system for determining strain distribution in a sample
- Patent number 10,209,206
- Issue date Feb 19, 2019
- Nova Measuring Instruments Ltd.
- Gilad Barak
- G01 - MEASURING TESTING
Information Patent Grant
Optical method and system for critical dimensions and thickness cha...
- Patent number 10,054,423
- Issue date Aug 21, 2018
- Nova Measuring Instruments Ltd.
- Dror Shafir
- G02 - OPTICS

Patents Applicationslast 30 patents

Information Patent Application
METHOD AND SYSTEM FOR OPTICAL CHARACTERIZATION OF PATTERNED SAMPLES
- Publication number 20240337590
- Publication date Oct 10, 2024
- NOVA LTD
- Dror SHAFIR
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR OPTICAL CHARACTERIZATION OF PATTERNED SAMPLES
- Publication number 20210116359
- Publication date Apr 22, 2021
- NOVA MEASURING INSTRUMENTS LTD.
- Dror SHAFIR
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR OPTICAL CHARACTERIZATION OF PATTERNED SAMPLES
- Publication number 20180328837
- Publication date Nov 15, 2018
- NOVA MEASURING INSTRUMENTS LTD.
- Dror SHAFIR
- G01 - MEASURING TESTING
Information Patent Application
OVERLAY DESIGN OPTIMIZATION
- Publication number 20170061066
- Publication date Mar 2, 2017
- NOVA MEASURING INSTRUMENTS LTD.
- Gilad BARAK
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
HYBRID METROLOGY TECHNIQUE
- Publication number 20170018069
- Publication date Jan 19, 2017
- Alok Vaid
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR DETERMINING STRAIN DISTRIBUTION IN A SAMPLE
- Publication number 20160139065
- Publication date May 19, 2016
- NOVA MEASURING INSTRUMENTS LTD.
- Gilad BARAK
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL METHOD AND SYSTEM FOR CRITICAL DIMENSIONS AND THICKNESS CHA...
- Publication number 20150345934
- Publication date Dec 3, 2015
- NOVA MEASURING INSTRUMENTS LTD.
- Dror SHAFIR
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR OPTICAL CHARACTERIZATION OF PATTERNED SAMPLES
- Publication number 20150316468
- Publication date Nov 5, 2015
- NOVA MEASURING INSTRUMENTS LTD.
- Dror SHAFIR
- G01 - MEASURING TESTING

Shay Wolfling

Person

Patents Grantslast 30 patents

Method and system for optical characterization of patterned samples

Method and system for optical characterization of patterned samples

Overlay design optimization

Method and system for determining strain distribution in a sample

Optical method and system for critical dimensions and thickness cha...

Patents Applicationslast 30 patents

METHOD AND SYSTEM FOR OPTICAL CHARACTERIZATION OF PATTERNED SAMPLES

METHOD AND SYSTEM FOR OPTICAL CHARACTERIZATION OF PATTERNED SAMPLES

METHOD AND SYSTEM FOR OPTICAL CHARACTERIZATION OF PATTERNED SAMPLES

OVERLAY DESIGN OPTIMIZATION

HYBRID METROLOGY TECHNIQUE

METHOD AND SYSTEM FOR DETERMINING STRAIN DISTRIBUTION IN A SAMPLE

OPTICAL METHOD AND SYSTEM FOR CRITICAL DIMENSIONS AND THICKNESS CHA...

METHOD AND SYSTEM FOR OPTICAL CHARACTERIZATION OF PATTERNED SAMPLES