Shay Wolfling

Person

Tel Aviv, IL

People

Patents Grantslast 30 patents

Information Patent Grant
Methods and apparatus for wavefront manipulations and improved 3-D...
- Patent number 8,319,975
- Issue date Nov 27, 2012
- Nano-Or Technologies (Israel) Ltd.
- Yoel Arieli
- G01 - MEASURING TESTING
Information Patent Grant
Spatial wavefront analysis and 3D measurement
- Patent number 7,609,388
- Issue date Oct 27, 2009
- ICOS Vision Systems NV
- Yoel Arieli
- G11 - INFORMATION STORAGE
Information Patent Grant
Spatial and spectral wavefront analysis and measurement
- Patent number 7,542,144
- Issue date Jun 2, 2009
- ICOS Vision Systems NV
- Yoel Arieli
- G11 - INFORMATION STORAGE
Information Patent Grant
Spatial and spectral wavefront analysis and measurement
- Patent number 7,327,470
- Issue date Feb 5, 2008
- ICOS Vision Systems NV
- Yoel Arieli
- G11 - INFORMATION STORAGE
Information Patent Grant
Spatial and spectral wavefront analysis and measurement
- Patent number 6,819,435
- Issue date Nov 16, 2004
- Nano Or Technologies Inc.
- Yoel Arieli
- G11 - INFORMATION STORAGE
Information Patent Grant
Diffractive optical element and a method for producing same
- Patent number 6,707,608
- Issue date Mar 16, 2004
- Nano-Or Technologies (Israel) Ltd.
- Yoel Arieli
- G02 - OPTICS

Patents Applicationslast 30 patents

Information Patent Application
SPATIAL WAVEFRONT ANALYSIS AND 3D MEASUREMENT
- Publication number 20110149298
- Publication date Jun 23, 2011
- ICOS Vision Systems NV
- Yoel Arieli
- G01 - MEASURING TESTING
Information Patent Application
Methods and apparatus for wavefront manipulations and improved 3-D...
- Publication number 20100002950
- Publication date Jan 7, 2010
- ICOS VISION SYSTEMS NV
- Yoel Arieli
- G01 - MEASURING TESTING
Information Patent Application
Spatial and spectral wavefront analysis and measurement
- Publication number 20080088851
- Publication date Apr 17, 2008
- NANO-OR TECHNOLOGIES INC.
- Yoel Arieli
- G01 - MEASURING TESTING
Information Patent Application
Spatial and spectral wavefront analysis and measurement
- Publication number 20050094157
- Publication date May 5, 2005
- NANO-OR TECHNOLOGIES INC.
- Yoel Arieli
- G01 - MEASURING TESTING
Information Patent Application
Spatial wavefront analysis and 3d measurement
- Publication number 20050007603
- Publication date Jan 13, 2005
- Yoel Arieli
- G01 - MEASURING TESTING
Information Patent Application
Multiple layer optical storage device
- Publication number 20040081033
- Publication date Apr 29, 2004
- Yoel Arieli
- G11 - INFORMATION STORAGE
Information Patent Application
Spatial and spectral wavefront analysis and measurement
- Publication number 20020027661
- Publication date Mar 7, 2002
- NANO-OR TECHNOLOGIES INC.
- Yoel Arieli
- G01 - MEASURING TESTING

Shay Wolfling

Person

Patents Grantslast 30 patents

Methods and apparatus for wavefront manipulations and improved 3-D...

Spatial wavefront analysis and 3D measurement

Spatial and spectral wavefront analysis and measurement

Spatial and spectral wavefront analysis and measurement

Spatial and spectral wavefront analysis and measurement

Diffractive optical element and a method for producing same

Patents Applicationslast 30 patents

SPATIAL WAVEFRONT ANALYSIS AND 3D MEASUREMENT

Methods and apparatus for wavefront manipulations and improved 3-D...

Spatial and spectral wavefront analysis and measurement

Spatial and spectral wavefront analysis and measurement

Spatial wavefront analysis and 3d measurement

Multiple layer optical storage device

Spatial and spectral wavefront analysis and measurement