Shayak Banerjee

Person

Hartsdale, NY, US

People

Patents Grantslast 30 patents

Information Patent Grant
Optical rule checking for detecting at risk structures for overlay...
- Patent number 11,182,531
- Issue date Nov 23, 2021
- International Business Machines Corporation
- Shayak Banerjee
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Optical rule checking for detecting at risk structures for overlay...
- Patent number 11,163,934
- Issue date Nov 2, 2021
- International Business Machines Corporation
- Shayak Banerjee
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Methods, systems, and devices for calibrating light sensing devices
- Patent number 10,739,253
- Issue date Aug 11, 2020
- YouV Labs, Inc.
- Emmanuel Dumont
- G01 - MEASURING TESTING
Information Patent Grant
Optical rule checking for detecting at risk structures for overlay...
- Patent number 10,395,002
- Issue date Aug 27, 2019
- International Business Machines Corporation
- Shayak Banerjee
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Methods for guiding personal limit selection in UV dosimetry
- Patent number 10,378,953
- Issue date Aug 13, 2019
- YouV Labs, Inc.
- Emmanuel Dumont
- G01 - MEASURING TESTING
Information Patent Grant
Optical rule checking for detecting at risk structures for overlay...
- Patent number 10,339,261
- Issue date Jul 2, 2019
- International Business Machines Corporation
- Shayak Banerjee
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Sensing device
- Patent number D829112
- Issue date Sep 25, 2018
- The Joan and Irwin Jacobs Technion-Cornell Innovation Institute
- Emmanuel Dumont
- D10 - Measuring, testing, or signalling instruments
Information Patent Grant
Methods, systems, and apparatuses for accurate measurement and real...
- Patent number 9,880,052
- Issue date Jan 30, 2018
- The Joan and Irwin Jacobs Technion-Cornell Innovation Institute
- Emmanuel Dumont
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Methods, systems, and apparatuses for accurate measurement and real...
- Patent number 9,880,725
- Issue date Jan 30, 2018
- The Joan and Irwin Jacobs Technion-Cornell Innovation Institute
- Emmanuel Dumont
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Methods, systems, and apparatuses for accurate measurement and real...
- Patent number 9,798,458
- Issue date Oct 24, 2017
- The Joan and Irwin Jacobs Technion-Cornell Innovation Institute
- Emmanuel Dumont
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Detecting hotspots using machine learning on diffraction patterns
- Patent number 9,626,459
- Issue date Apr 18, 2017
- International Business Machines Corporation
- Kanak B. Agarwal
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Optical rule checking for detecting at risk structures for overlay...
- Patent number 9,607,268
- Issue date Mar 28, 2017
- International Business Machines Corporation
- Shayak Banerjee
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Optical proximity correction (OPC) accounting for critical dimensio...
- Patent number 9,536,039
- Issue date Jan 3, 2017
- International Business Machines Corporation
- Shayak Banerjee
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Optical proximity correction (OPC) accounting for critical dimensio...
- Patent number 9,342,648
- Issue date May 17, 2016
- International Business Machines Corporation
- Shayak Banerjee
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Optical rule checking for detecting at risk structures for overlay...
- Patent number 9,330,223
- Issue date May 3, 2016
- International Business Machines Corporation
- Shayak Banerjee
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Net-voltage-aware optical proximity correction (OPC)
- Patent number 9,311,442
- Issue date Apr 12, 2016
- GLOBALFOUNDRIES Inc.
- Shayak Banerjee
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Solutions for retargeting integrated circuit layouts based on diffr...
- Patent number 8,782,573
- Issue date Jul 15, 2014
- International Business Machines Corporation
- Kanak B. Agarwal
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Pitch-aware multi-patterning lithography
- Patent number 8,689,151
- Issue date Apr 1, 2014
- International Business Machines Corporation
- Kanak Behari Agarwal
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method for post decomposition density balancing in integrated circu...
- Patent number 8,647,893
- Issue date Feb 11, 2014
- International Business Machines Corporation
- Kanak B. Agarwal
- G05 - CONTROLLING REGULATING
Information Patent Grant
Frequency domain layout decomposition in double patterning lithography
- Patent number 8,627,244
- Issue date Jan 7, 2014
- International Business Machines Corporation
- Kanak B. Agarwal
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Density balancing in multiple patterning lithography using integrat...
- Patent number 8,627,245
- Issue date Jan 7, 2014
- International Business Machines Corporation
- Shayak Banerjee
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Retargeting multiple patterned integrated circuit device designs
- Patent number 8,612,902
- Issue date Dec 17, 2013
- International Business Machines Corporation
- Kanak B. Agarwal
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Machine learning approach to correct lithographic hot-spots
- Patent number 8,464,194
- Issue date Jun 11, 2013
- International Business Machines Corporation
- Kanak Behari Agarwal
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Analyzing multiple induced systematic and statistical layout depend...
- Patent number 8,418,087
- Issue date Apr 9, 2013
- International Business Machines Corporation
- Shayak Banerjee
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Simultaneous optical proximity correction and decomposition for dou...
- Patent number 8,415,077
- Issue date Apr 9, 2013
- International Business Machines Corporation
- Kanak B. Agarwal
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Reducing through process delay variation in metal wires
- Patent number 8,402,398
- Issue date Mar 19, 2013
- International Business Machines Corporation
- Kanak B. Agarwal
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Optical proximity correction for transistors using harmonic mean of...
- Patent number 8,331,646
- Issue date Dec 11, 2012
- International Business Machines Corporation
- Kanak B. Agarwal
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Model-based retargeting of layout patterns for sub-wavelength photo...
- Patent number 8,321,818
- Issue date Nov 27, 2012
- International Business Machines Corporation
- Kanak B. Agarwal
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Propagating design tolerances to shape tolerances for lithography
- Patent number 8,281,263
- Issue date Oct 2, 2012
- International Business Machines Corporation
- Kanak Agarwal
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Analyzing multiple induced systematic and statistical layout depend...
- Patent number 8,176,444
- Issue date May 8, 2012
- International Business Machines Corporation
- Shayak Banerjee
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
OPTICAL RULE CHECKING FOR DETECTING AT RISK STRUCTURES FOR OVERLAY...
- Publication number 20190340329
- Publication date Nov 7, 2019
- International Business Machines Corporation
- Shayak Banerjee
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
OPTICAL RULE CHECKING FOR DETECTING AT RISK STRUCTURES FOR OVERLAY...
- Publication number 20190258774
- Publication date Aug 22, 2019
- International Business Machines Corporation
- Shayak Banerjee
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Methods, Systems, and Apparatuses for Accurate Measurement and Real...
- Publication number 20190145820
- Publication date May 16, 2019
- Emmanuel DUMONT
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHODS FOR GUIDING PERSONAL LIMIT SELECTION IN UV DOSIMETRY
- Publication number 20190033126
- Publication date Jan 31, 2019
- Emmanuel DUMONT
- G01 - MEASURING TESTING
Information Patent Application
METHODS, SYSTEMS, AND APPARATUSES FOR ACCURATE MEASUREMENT AND REAL...
- Publication number 20180224326
- Publication date Aug 9, 2018
- Emmanuel DUMONT
- G01 - MEASURING TESTING
Information Patent Application
METHODS, SYSTEMS, AND DEVICES FOR CALIBRATING LIGHT SENSING DEVICES
- Publication number 20170350815
- Publication date Dec 7, 2017
- Emmanuel DUMONT
- G01 - MEASURING TESTING
Information Patent Application
METHODS, SYSTEMS, AND APPARATUSES FOR ACCURATE MEASUREMENT AND REAL...
- Publication number 20170344239
- Publication date Nov 30, 2017
- Emmanuel DUMONT
- G01 - MEASURING TESTING
Information Patent Application
Non-Scheduled Chartered Transportation Reservation Environment
- Publication number 20170124489
- Publication date May 4, 2017
- EvoLux Transportation, LLC
- Raymond B. Leavitt
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHODS, SYSTEMS, AND APPARATUSES FOR ACCURATE MEASUREMENT AND REAL...
- Publication number 20170115162
- Publication date Apr 27, 2017
- Emmanuel DUMONT
- G01 - MEASURING TESTING
Information Patent Application
METHODS, SYSTEMS, AND APPARATUSES FOR ACCURATE MEASUREMENT AND REAL...
- Publication number 20170118854
- Publication date Apr 27, 2017
- Emmanuel DUMONT
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL RULE CHECKING FOR DETECTING AT RISK STRUCTURES FOR OVERLAY...
- Publication number 20170116368
- Publication date Apr 27, 2017
- International Business Machines Corporation
- Shayak Banerjee
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHODS, SYSTEMS, AND APPARATUSES FOR ACCURATE MEASUREMENT AND REAL...
- Publication number 20160364131
- Publication date Dec 15, 2016
- Emmanuel DUMONT
- G01 - MEASURING TESTING
Information Patent Application
METHODS, SYSTEMS, AND APPARATUSES FOR ACCURATE MEASUREMENT AND REAL...
- Publication number 20160363479
- Publication date Dec 15, 2016
- Emmanuel DUMONT
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL PROXIMITY CORRECTION (OPC) ACCOUNTING FOR CRITICAL DIMENSIO...
- Publication number 20160217249
- Publication date Jul 28, 2016
- International Business Machines Corporation
- Shayak Banerjee
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
OPTICAL RULE CHECKING FOR DETECTING AT RISK STRUCTURES FOR OVERLAY...
- Publication number 20160196502
- Publication date Jul 7, 2016
- International Business Machines Corporation
- Shayak Banerjee
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
OPTICAL RULE CHECKING FOR DETECTING AT RISK STRUCTURES FOR OVERLAY...
- Publication number 20160092783
- Publication date Mar 31, 2016
- International Business Machines Corporation
- Shayak Banerjee
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
OPTICAL PROXIMITY CORRECTION (OPC) ACCOUNTING FOR CRITICAL DIMENSIO...
- Publication number 20150356230
- Publication date Dec 10, 2015
- International Business Machines Corporation
- Shayak Banerjee
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
NET-VOLTAGE-AWARE OPTICAL PROXIMITY CORRECTION (OPC)
- Publication number 20150310155
- Publication date Oct 29, 2015
- International Business Machines Corporation
- Shayak Banerjee
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DETECTING HOTSPOTS USING MACHINE LEARNING ON DIFFRACTION PATTERNS
- Publication number 20150213374
- Publication date Jul 30, 2015
- International Business Machines Corporation
- Kanak B. Agarwal
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND APPARATUS TO CONTINUOUSLY MAINTAIN USERS EYES FOCUSED ON...
- Publication number 20150185855
- Publication date Jul 2, 2015
- Praveen Elak
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Clustering Lithographic Hotspots Based on Frequency Domain Encoding
- Publication number 20150112649
- Publication date Apr 23, 2015
- International Business Machines Corporation
- Kanak B. Agarwal
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
OPTICAL RULE CHECKING FOR DETECTING AT RISK STRUCTURES FOR OVERLAY...
- Publication number 20140095124
- Publication date Apr 3, 2014
- International Business Machines Corporation
- Shayak Banerjee
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PITCH-AWARE MULTI-PATTERNING LITHOGRAPHY
- Publication number 20140075397
- Publication date Mar 13, 2014
- International Business Machines Corporation
- Kanak Behari Agarwal
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
SOLUTIONS FOR RETARGETING INTEGRATED CIRCUIT LAYOUTS BASED ON DIFFR...
- Publication number 20140068529
- Publication date Mar 6, 2014
- International Business Machines Corporation
- Kanak B. Agarwal
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
METHOD FOR POST DECOMPOSITION DENSITY BALANCING IN INTEGRATED CIRCU...
- Publication number 20140065728
- Publication date Mar 6, 2014
- International Business Machines Corporation
- Kanak B. Agarwal
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MACHINE LEARNING APPROACH TO CORRECT LITHOGRAPHIC HOT-SPOTS
- Publication number 20130159943
- Publication date Jun 20, 2013
- International Business Machines Corporation
- Kanak Behari Agarwal
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Frequency Domain Layout Decomposition in Double Patterning Lithography
- Publication number 20130003108
- Publication date Jan 3, 2013
- International Business Machines Corporation
- Kanak B. Agarwal
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Reducing Through Process Delay Variation in Metal Wires
- Publication number 20120317523
- Publication date Dec 13, 2012
- International Business Machines Corporation
- Kanak B. Agarwal
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
ANALYZING MULTIPLE INDUCED SYSTEMATIC AND STATISTICAL LAYOUT DEPEND...
- Publication number 20120144356
- Publication date Jun 7, 2012
- International Business Machines Corporation
- Shayak Banerjee
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Simultaneous Optical Proximity Correction and Decomposition for Dou...
- Publication number 20120040280
- Publication date Feb 16, 2012
- International Business Machines Corporation
- Kanak B. Agarwal
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Shayak Banerjee

Person

Patents Grantslast 30 patents

Optical rule checking for detecting at risk structures for overlay...

Optical rule checking for detecting at risk structures for overlay...

Methods, systems, and devices for calibrating light sensing devices

Optical rule checking for detecting at risk structures for overlay...

Methods for guiding personal limit selection in UV dosimetry

Optical rule checking for detecting at risk structures for overlay...

Sensing device

Methods, systems, and apparatuses for accurate measurement and real...

Methods, systems, and apparatuses for accurate measurement and real...

Methods, systems, and apparatuses for accurate measurement and real...

Detecting hotspots using machine learning on diffraction patterns

Optical rule checking for detecting at risk structures for overlay...

Optical proximity correction (OPC) accounting for critical dimensio...

Optical proximity correction (OPC) accounting for critical dimensio...

Optical rule checking for detecting at risk structures for overlay...

Net-voltage-aware optical proximity correction (OPC)

Solutions for retargeting integrated circuit layouts based on diffr...

Pitch-aware multi-patterning lithography

Method for post decomposition density balancing in integrated circu...

Frequency domain layout decomposition in double patterning lithography

Density balancing in multiple patterning lithography using integrat...

Retargeting multiple patterned integrated circuit device designs

Machine learning approach to correct lithographic hot-spots

Analyzing multiple induced systematic and statistical layout depend...

Simultaneous optical proximity correction and decomposition for dou...

Reducing through process delay variation in metal wires

Optical proximity correction for transistors using harmonic mean of...

Model-based retargeting of layout patterns for sub-wavelength photo...

Propagating design tolerances to shape tolerances for lithography

Analyzing multiple induced systematic and statistical layout depend...

Patents Applicationslast 30 patents

OPTICAL RULE CHECKING FOR DETECTING AT RISK STRUCTURES FOR OVERLAY...

OPTICAL RULE CHECKING FOR DETECTING AT RISK STRUCTURES FOR OVERLAY...

Methods, Systems, and Apparatuses for Accurate Measurement and Real...

METHODS FOR GUIDING PERSONAL LIMIT SELECTION IN UV DOSIMETRY

METHODS, SYSTEMS, AND APPARATUSES FOR ACCURATE MEASUREMENT AND REAL...

METHODS, SYSTEMS, AND DEVICES FOR CALIBRATING LIGHT SENSING DEVICES

METHODS, SYSTEMS, AND APPARATUSES FOR ACCURATE MEASUREMENT AND REAL...

Non-Scheduled Chartered Transportation Reservation Environment

METHODS, SYSTEMS, AND APPARATUSES FOR ACCURATE MEASUREMENT AND REAL...

METHODS, SYSTEMS, AND APPARATUSES FOR ACCURATE MEASUREMENT AND REAL...

OPTICAL RULE CHECKING FOR DETECTING AT RISK STRUCTURES FOR OVERLAY...

METHODS, SYSTEMS, AND APPARATUSES FOR ACCURATE MEASUREMENT AND REAL...

METHODS, SYSTEMS, AND APPARATUSES FOR ACCURATE MEASUREMENT AND REAL...

OPTICAL PROXIMITY CORRECTION (OPC) ACCOUNTING FOR CRITICAL DIMENSIO...

OPTICAL RULE CHECKING FOR DETECTING AT RISK STRUCTURES FOR OVERLAY...

OPTICAL RULE CHECKING FOR DETECTING AT RISK STRUCTURES FOR OVERLAY...

OPTICAL PROXIMITY CORRECTION (OPC) ACCOUNTING FOR CRITICAL DIMENSIO...

NET-VOLTAGE-AWARE OPTICAL PROXIMITY CORRECTION (OPC)

DETECTING HOTSPOTS USING MACHINE LEARNING ON DIFFRACTION PATTERNS

METHOD AND APPARATUS TO CONTINUOUSLY MAINTAIN USERS EYES FOCUSED ON...

Clustering Lithographic Hotspots Based on Frequency Domain Encoding

OPTICAL RULE CHECKING FOR DETECTING AT RISK STRUCTURES FOR OVERLAY...

PITCH-AWARE MULTI-PATTERNING LITHOGRAPHY

SOLUTIONS FOR RETARGETING INTEGRATED CIRCUIT LAYOUTS BASED ON DIFFR...

METHOD FOR POST DECOMPOSITION DENSITY BALANCING IN INTEGRATED CIRCU...

MACHINE LEARNING APPROACH TO CORRECT LITHOGRAPHIC HOT-SPOTS

Frequency Domain Layout Decomposition in Double Patterning Lithography

Reducing Through Process Delay Variation in Metal Wires

ANALYZING MULTIPLE INDUCED SYSTEMATIC AND STATISTICAL LAYOUT DEPEND...

Simultaneous Optical Proximity Correction and Decomposition for Dou...