Sheldon C. P. Lim

Person

Sunnyvale, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Method for detecting and monitoring defects
- Patent number 7,487,064
- Issue date Feb 3, 2009
- Chartered Semiconductor Manufacturing, Ltd.
- Sheldon C. P. Lim
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Barrier layer enhancement in metallization scheme for semiconductor...
- Patent number 5,624,874
- Issue date Apr 29, 1997
- North America Philips Corporation
- Sheldon C. P. Lim
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Programmable semiconductor integrated circuits having fusible links
- Patent number 5,465,004
- Issue date Nov 7, 1995
- North American Philips Corporation
- Sheldon C. P. Lim
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of manufacturing fusible links in semiconductor devices
- Patent number 5,244,836
- Issue date Sep 14, 1993
- North American Philips Corporation
- Sheldon C. P. Lim
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Fabrication method using oxidation to control size of fusible link
- Patent number 5,015,604
- Issue date May 14, 1991
- North American Philips Corp., Signetics Division
- Sheldon C. P. Lim
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Planarization method and technique for isolating semiconductor islands
- Patent number 4,662,986
- Issue date May 5, 1987
- Signetics Corporation
- Sheldon C. P. Lim
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method of fabricating a programmable read-only memory cell incorpor...
- Patent number 4,569,120
- Issue date Feb 11, 1986
- Signetics Corporation
- William T. Stacy
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of fabricating a programmable read-only memory cell incorpor...
- Patent number 4,569,121
- Issue date Feb 11, 1986
- Signetics Corporation
- Sheldon C. P. Lim
- G11 - INFORMATION STORAGE
Information Patent Grant
TiW.sub.2 N Fusible links in semiconductor integrated circuits
- Patent number 4,491,860
- Issue date Jan 1, 1985
- Signetics Corporation
- Sheldon C. P. Lim
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Method for detecting and monitoring defects
- Publication number 20050027476
- Publication date Feb 3, 2005
- Sheldon C. P. Lim
- H01 - BASIC ELECTRIC ELEMENTS

Sheldon C. P. Lim

Person

Patents Grantslast 30 patents

Method for detecting and monitoring defects

Barrier layer enhancement in metallization scheme for semiconductor...

Programmable semiconductor integrated circuits having fusible links

Method of manufacturing fusible links in semiconductor devices

Fabrication method using oxidation to control size of fusible link

Planarization method and technique for isolating semiconductor islands

Method of fabricating a programmable read-only memory cell incorpor...

Method of fabricating a programmable read-only memory cell incorpor...

TiW.sub.2 N Fusible links in semiconductor integrated circuits

Patents Applicationslast 30 patents

Method for detecting and monitoring defects