Sheldon L. Epstein

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Wilmette, IL, US

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Patents Grantslast 30 patents

Information Patent Grant
Inspection system for optical components
- Patent number 6,614,516
- Issue date Sep 2, 2003
- Novartis AG
- Sheldon L. Epstein
- G01 - MEASURING TESTING
Information Patent Grant
System and method for measuring properties of an optical component
- Patent number 6,493,073
- Issue date Dec 10, 2002
- Sheldon L. Epstein
- G01 - MEASURING TESTING
Information Patent Grant
Inspection system for optical components
- Patent number 6,301,005
- Issue date Oct 9, 2001
- Wesley-Jessen Corporation
- Sheldon L. Epstein
- G01 - MEASURING TESTING
Information Patent Grant
Particle analyzer having scanning apparatus series coupled between...
- Patent number 3,993,948
- Issue date Nov 23, 1976
- Coulter Electronics, Inc.
- Sheldon L. Epstein
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
System and method for measuring properties of an optical component
- Publication number 20020071111
- Publication date Jun 13, 2002
- Sheldon L. Epstein
- G01 - MEASURING TESTING
Information Patent Application
Inspection system for optical components
- Publication number 20010035949
- Publication date Nov 1, 2001
- Wesley-Jessen Corporation
- Sheldon L. Epstein
- G01 - MEASURING TESTING