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SHEMESH DROR
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Hod-Hasharon, IL
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Patents Grants
last 30 patents
Information
Patent Grant
Defect examination on a semiconductor specimen
Patent number
11,961,221
Issue date
Apr 16, 2024
Applied Materials Israel Ltd.
Dror Shemesh
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
X-ray based evaluation of a status of a structure of a substrate
Patent number
11,543,368
Issue date
Jan 3, 2023
Applied Materials Israel Ltd.
Dror Shemesh
G01 - MEASURING TESTING
Information
Patent Grant
Determination of defect location for examination of a specimen
Patent number
11,423,529
Issue date
Aug 23, 2022
Applied Materials Isreal Ltd
Doron Girmonsky
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Process monitoring
Patent number
11,022,565
Issue date
Jun 1, 2021
Applied Materials Israel Ltd.
Dror Shemesh
G01 - MEASURING TESTING
Information
Patent Grant
X-ray based evaluation of a status of a structure of a substrate
Patent number
10,928,336
Issue date
Feb 23, 2021
Applied Materials Israel Ltd.
Dror Shemesh
G01 - MEASURING TESTING
Information
Patent Grant
Method for detecting voids and an inspection system
Patent number
10,922,809
Issue date
Feb 16, 2021
Applied Materials, Inc.
Dror Shemesh
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Imaging of crystalline defects
Patent number
10,347,462
Issue date
Jul 9, 2019
Applied Materials Israel Ltd.
Dror Shemesh
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Resolving ambiguities in an energy spectrum
Patent number
9,899,185
Issue date
Feb 20, 2018
Applied Materials Israel Ltd.
Dror Shemesh
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method for detecting voids in interconnects and an inspection system
Patent number
9,805,909
Issue date
Oct 31, 2017
Applied Materials Israel Ltd.
Dror Shemesh
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
System and method for scanning an object
Patent number
9,490,101
Issue date
Nov 8, 2016
Applied Materials Israel Ltd.
Yuval Gronau
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Apparatus for sample formation and microanalysis in a vacuum chamber
Patent number
8,723,144
Issue date
May 13, 2014
Applied Materials Israel, Ltd.
Eitan Kidron
G01 - MEASURING TESTING
Information
Patent Grant
Method and system for imaging a cross section of a specimen
Patent number
8,709,269
Issue date
Apr 29, 2014
Applied Materials Israel, Ltd.
Dror Shemesh
G01 - MEASURING TESTING
Information
Patent Grant
Method for monitoring chamber cleanliness
Patent number
8,361,814
Issue date
Jan 29, 2013
Applied Materials, Israel, Ltd.
Dror Shemesh
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Charged particle beam device and method for inspecting specimen
Patent number
8,008,629
Issue date
Aug 30, 2011
ICT Integrated Circuit Testing Gesellschaft für Halbleiterprüftechnik mbH
Pavel Adamec
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method and system for providing a compensated auger spectrum
Patent number
7,912,657
Issue date
Mar 22, 2011
Applied Materials Israel, Ltd.
Dror Shemesh
G01 - MEASURING TESTING
Information
Patent Grant
Scanning electron microscope having multiple detectors and a method...
Patent number
7,847,267
Issue date
Dec 7, 2010
Applied Materials Israel, Ltd.
Dror Shemesh
G01 - MEASURING TESTING
Information
Patent Grant
Charged particle detector assembly, charged particle beam apparatus...
Patent number
7,842,930
Issue date
Nov 30, 2010
ICT Integrated Circuit Testing Gesellschaft für Halbleiterprüftechnik mbH
Gilad Almogy
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Charged particle beam apparatus and method for operating a charged...
Patent number
7,838,830
Issue date
Nov 23, 2010
ICT, Integrated Circuit Testing Gesellschaft fur Halbleiterpruftechnik mbH
Juergen Frosien
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method and system for detecting hidden defects
Patent number
7,683,317
Issue date
Mar 23, 2010
Applied Materials Israel, Ltd.
Dror Shemesh
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method and system for generating and reviewing a thin sample
Patent number
7,659,506
Issue date
Feb 9, 2010
Applied Materials, Israel, Ltd.
Michal Avinun-Kalish
G01 - MEASURING TESTING
Information
Patent Grant
Specimen current mapper
Patent number
7,473,911
Issue date
Jan 6, 2009
Applied Materials, Israel, Ltd.
Alexander Kadyshevitch
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Methods and systems for process monitoring using x-ray emission
Patent number
7,365,320
Issue date
Apr 29, 2008
Applied Materials Israel, Ltd.
Dror Shemesh
G01 - MEASURING TESTING
Information
Patent Grant
Methods and systems for process monitoring using x-ray emission
Patent number
7,312,446
Issue date
Dec 25, 2007
Applied Materials, Israel, Ltd.
Dror Shemesh
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for sample formation and microanalysis in a va...
Patent number
7,297,965
Issue date
Nov 20, 2007
Applied Materials, Israel, Ltd.
Eitan Kidron
G01 - MEASURING TESTING
Information
Patent Grant
Method and device for aligning a charged particle beam column
Patent number
7,271,396
Issue date
Sep 18, 2007
Applied Materials, Israel Limited
Dror Shemesh
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Multiple electrode lens arrangement and a method for inspecting an...
Patent number
7,233,008
Issue date
Jun 19, 2007
Applied Materials, Israel, Ltd.
Igor Petrov
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
System and method for fast focal length alterations
Patent number
7,161,158
Issue date
Jan 9, 2007
Applied Materials, Inc.
Dror Shemesh
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Apparatus and method for enhanced voltage contrast analysis
Patent number
6,900,065
Issue date
May 31, 2005
Applied Materials Israel, Ltd.
Vicky Rashkovan
G01 - MEASURING TESTING
Information
Patent Grant
System and method for reducing charged particle contamination
Patent number
6,894,294
Issue date
May 17, 2005
Applied Materials Israel, Ltd.
Dror Shemesh
B08 - CLEANING
Information
Patent Grant
System and method for directing a miller
Patent number
6,670,610
Issue date
Dec 30, 2003
Applied Materials, Inc.
Dror Shemesh
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
Information
Patent Application
NON-DESTRUCTIVE SEM-BASED DEPTH-PROFILING OF SAMPLES
Publication number
20240094150
Publication date
Mar 21, 2024
APPLIED MATERIALS ISRAEL LTD.
Dror Shemesh
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
NON-DESTRUCTIVE SEM-BASED DEPTH-PROFILING OF SAMPLES
Publication number
20240096591
Publication date
Mar 21, 2024
APPLIED MATERIALS ISRAEL LTD.
Dror Shemesh
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Z-PROFILING OF WAFERS BASED ON X-RAY MEASUREMENTS
Publication number
20240085356
Publication date
Mar 14, 2024
APPLIED MATERIALS ISRAEL LTD.
Doron Girmonsky
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
DEPTH-PROFILING OF SAMPLES BASED ON X-RAY MEASUREMENTS
Publication number
20240085351
Publication date
Mar 14, 2024
APPLIED MATERIALS ISRAEL LTD.
Doron Girmonsky
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
DEFECT EXAMINATION ON A SEMICONDUCTOR SPECIMEN
Publication number
20230114624
Publication date
Apr 13, 2023
APPLIED MATERIALS ISRAEL LTD.
Dror SHEMESH
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
DETERMINATION OF DEFECT LOCATION FOR EXAMINATION OF A SPECIMEN
Publication number
20210256687
Publication date
Aug 19, 2021
APPLIED MATERIALS ISRAEL LTD.
Doron GIRMONSKY
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
X-RAY BASED EVALUATION OF A STATUS OF A STRUCTURE OF A SUBSTRATE
Publication number
20210181128
Publication date
Jun 17, 2021
APPLIED MATERIALS ISRAEL LTD.
Dror Shemesh
G01 - MEASURING TESTING
Information
Patent Application
X-RAY BASED EVALUATION OF A STATUS OF A STRUCTURE OF A SUBSTRATE
Publication number
20210033550
Publication date
Feb 4, 2021
APPLIED MATERIALS ISRAEL LTD.
Dror Shemesh
G01 - MEASURING TESTING
Information
Patent Application
PROCESS MONITORING
Publication number
20200355620
Publication date
Nov 12, 2020
APPLIED MATERIALS ISRAEL LTD.
Dror Shemesh
G01 - MEASURING TESTING
Information
Patent Application
IMAGING OF CRYSTALLINE DEFECTS
Publication number
20190180975
Publication date
Jun 13, 2019
APPLIED MATERIALS ISRAEL LTD.
Dror Shemesh
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
METHOD FOR DETECTING VOIDS AND AN INSPECTION SYSTEM
Publication number
20190043183
Publication date
Feb 7, 2019
Applied Materials, Inc.
Dror Shemesh
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
SYSTEM AND METHOD FOR SCANNING AN OBJECT
Publication number
20160276127
Publication date
Sep 22, 2016
APPLIED MATERIALS ISRAEL LTD.
Yuval Gronau
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
METHOD AND SYSTEM FOR ENHANCING RESOLUTION OF A SCANNING ELECTRON M...
Publication number
20120241605
Publication date
Sep 27, 2012
Dror Shemesh
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
METHOD AND SYSTEM FOR GENERATING AND REVIEWING A THIN SAMPLE
Publication number
20090078867
Publication date
Mar 26, 2009
Michal Avinun-Kalish
G01 - MEASURING TESTING
Information
Patent Application
Method and System for Imaging a Cross Section of a Specimen
Publication number
20090053395
Publication date
Feb 26, 2009
Dror Shemesh
G01 - MEASURING TESTING
Information
Patent Application
CHARGED PARTICLE BEAM APPARATUS AND METHOD FOR OPERATING A CHARGED...
Publication number
20080258060
Publication date
Oct 23, 2008
JUERGEN FROSIEN
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Method and System for Providing a Compensated Auger Spectrum
Publication number
20080234962
Publication date
Sep 25, 2008
Dror Shemesh
G01 - MEASURING TESTING
Information
Patent Application
CHARGED PARTICLE DETECTOR ASSEMBLY, CHARGED PARTICLE BEAM APPARATUS...
Publication number
20080191134
Publication date
Aug 14, 2008
Gilad Almogy
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
CHARGED PARTICLE BEAM DEVICE AND METHOD FOR INSPECTING SPECIMEN
Publication number
20080048116
Publication date
Feb 28, 2008
PAVEL ADAMEC
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
METHOD AND SYSTEM FOR DETECTING HIDDEN DEFECTS
Publication number
20070114404
Publication date
May 24, 2007
Dror Shemesh
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
METHOD AND SYSTEM FOR ENHANCING RESOLUTION OF A SCANNING ELECTRON M...
Publication number
20070090288
Publication date
Apr 26, 2007
Dror Shemesh
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Method for monitoring chamber cleanliness
Publication number
20060216839
Publication date
Sep 28, 2006
APPLIED MATERIALS, ISRAEL, LTD.
Dror Shemesh
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Methods and systems for process monitoring using x-ray emission
Publication number
20060054811
Publication date
Mar 16, 2006
Dror Shemesh
G01 - MEASURING TESTING
Information
Patent Application
Scanning electron microscope having multiple detectors and a method...
Publication number
20060054814
Publication date
Mar 16, 2006
Dror Shemesh
G01 - MEASURING TESTING
Information
Patent Application
Methods and systems for process monitoring using x-ray emission
Publication number
20060049349
Publication date
Mar 9, 2006
Dror Shemesh
G01 - MEASURING TESTING
Information
Patent Application
Method and apparatus for sample formation and microanalysis in a va...
Publication number
20060011867
Publication date
Jan 19, 2006
Applied Materials Israel Ltd.
Eitan Kidron
G01 - MEASURING TESTING
Information
Patent Application
Method and apparatus for sample formation and microanalysis in a va...
Publication number
20060011868
Publication date
Jan 19, 2006
Applied Materials Israel Ltd.
Eitan Kidron
G01 - MEASURING TESTING
Information
Patent Application
System and method for fast focal length alterations
Publication number
20050017192
Publication date
Jan 27, 2005
Dror Shemesh
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Method and device for aligning a charged particle beam column
Publication number
20050012050
Publication date
Jan 20, 2005
Dror Shemesh
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Specimen current mapper
Publication number
20040084622
Publication date
May 6, 2004
Applied Materials Israel Ltd.
Alexander Kadyshevitch
H01 - BASIC ELECTRIC ELEMENTS