SHEMESH DROR

Person

Hod-Hasharon, IL

People

Patents Grantslast 30 patents

Information Patent Grant
Defect examination on a semiconductor specimen
- Patent number 11,961,221
- Issue date Apr 16, 2024
- Applied Materials Israel Ltd.
- Dror Shemesh
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
X-ray based evaluation of a status of a structure of a substrate
- Patent number 11,543,368
- Issue date Jan 3, 2023
- Applied Materials Israel Ltd.
- Dror Shemesh
- G01 - MEASURING TESTING
Information Patent Grant
Determination of defect location for examination of a specimen
- Patent number 11,423,529
- Issue date Aug 23, 2022
- Applied Materials Isreal Ltd
- Doron Girmonsky
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Process monitoring
- Patent number 11,022,565
- Issue date Jun 1, 2021
- Applied Materials Israel Ltd.
- Dror Shemesh
- G01 - MEASURING TESTING
Information Patent Grant
X-ray based evaluation of a status of a structure of a substrate
- Patent number 10,928,336
- Issue date Feb 23, 2021
- Applied Materials Israel Ltd.
- Dror Shemesh
- G01 - MEASURING TESTING
Information Patent Grant
Method for detecting voids and an inspection system
- Patent number 10,922,809
- Issue date Feb 16, 2021
- Applied Materials, Inc.
- Dror Shemesh
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Imaging of crystalline defects
- Patent number 10,347,462
- Issue date Jul 9, 2019
- Applied Materials Israel Ltd.
- Dror Shemesh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Resolving ambiguities in an energy spectrum
- Patent number 9,899,185
- Issue date Feb 20, 2018
- Applied Materials Israel Ltd.
- Dror Shemesh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for detecting voids in interconnects and an inspection system
- Patent number 9,805,909
- Issue date Oct 31, 2017
- Applied Materials Israel Ltd.
- Dror Shemesh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System and method for scanning an object
- Patent number 9,490,101
- Issue date Nov 8, 2016
- Applied Materials Israel Ltd.
- Yuval Gronau
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus for sample formation and microanalysis in a vacuum chamber
- Patent number 8,723,144
- Issue date May 13, 2014
- Applied Materials Israel, Ltd.
- Eitan Kidron
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for imaging a cross section of a specimen
- Patent number 8,709,269
- Issue date Apr 29, 2014
- Applied Materials Israel, Ltd.
- Dror Shemesh
- G01 - MEASURING TESTING
Information Patent Grant
Method for monitoring chamber cleanliness
- Patent number 8,361,814
- Issue date Jan 29, 2013
- Applied Materials, Israel, Ltd.
- Dror Shemesh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam device and method for inspecting specimen
- Patent number 8,008,629
- Issue date Aug 30, 2011
- ICT Integrated Circuit Testing Gesellschaft für Halbleiterprüftechnik mbH
- Pavel Adamec
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and system for providing a compensated auger spectrum
- Patent number 7,912,657
- Issue date Mar 22, 2011
- Applied Materials Israel, Ltd.
- Dror Shemesh
- G01 - MEASURING TESTING
Information Patent Grant
Scanning electron microscope having multiple detectors and a method...
- Patent number 7,847,267
- Issue date Dec 7, 2010
- Applied Materials Israel, Ltd.
- Dror Shemesh
- G01 - MEASURING TESTING
Information Patent Grant
Charged particle detector assembly, charged particle beam apparatus...
- Patent number 7,842,930
- Issue date Nov 30, 2010
- ICT Integrated Circuit Testing Gesellschaft für Halbleiterprüftechnik mbH
- Gilad Almogy
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam apparatus and method for operating a charged...
- Patent number 7,838,830
- Issue date Nov 23, 2010
- ICT, Integrated Circuit Testing Gesellschaft fur Halbleiterpruftechnik mbH
- Juergen Frosien
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and system for detecting hidden defects
- Patent number 7,683,317
- Issue date Mar 23, 2010
- Applied Materials Israel, Ltd.
- Dror Shemesh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and system for generating and reviewing a thin sample
- Patent number 7,659,506
- Issue date Feb 9, 2010
- Applied Materials, Israel, Ltd.
- Michal Avinun-Kalish
- G01 - MEASURING TESTING
Information Patent Grant
Specimen current mapper
- Patent number 7,473,911
- Issue date Jan 6, 2009
- Applied Materials, Israel, Ltd.
- Alexander Kadyshevitch
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods and systems for process monitoring using x-ray emission
- Patent number 7,365,320
- Issue date Apr 29, 2008
- Applied Materials Israel, Ltd.
- Dror Shemesh
- G01 - MEASURING TESTING
Information Patent Grant
Methods and systems for process monitoring using x-ray emission
- Patent number 7,312,446
- Issue date Dec 25, 2007
- Applied Materials, Israel, Ltd.
- Dror Shemesh
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for sample formation and microanalysis in a va...
- Patent number 7,297,965
- Issue date Nov 20, 2007
- Applied Materials, Israel, Ltd.
- Eitan Kidron
- G01 - MEASURING TESTING
Information Patent Grant
Method and device for aligning a charged particle beam column
- Patent number 7,271,396
- Issue date Sep 18, 2007
- Applied Materials, Israel Limited
- Dror Shemesh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multiple electrode lens arrangement and a method for inspecting an...
- Patent number 7,233,008
- Issue date Jun 19, 2007
- Applied Materials, Israel, Ltd.
- Igor Petrov
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
System and method for fast focal length alterations
- Patent number 7,161,158
- Issue date Jan 9, 2007
- Applied Materials, Inc.
- Dror Shemesh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus and method for enhanced voltage contrast analysis
- Patent number 6,900,065
- Issue date May 31, 2005
- Applied Materials Israel, Ltd.
- Vicky Rashkovan
- G01 - MEASURING TESTING
Information Patent Grant
System and method for reducing charged particle contamination
- Patent number 6,894,294
- Issue date May 17, 2005
- Applied Materials Israel, Ltd.
- Dror Shemesh
- B08 - CLEANING
Information Patent Grant
System and method for directing a miller
- Patent number 6,670,610
- Issue date Dec 30, 2003
- Applied Materials, Inc.
- Dror Shemesh
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
NON-DESTRUCTIVE CLASSIFICATION OF SPECIMENS BASED ON ENERGY SIGNATU...
- Publication number 20240255449
- Publication date Aug 1, 2024
- APPLIED MATERIALS ISRAEL LTD.
- Doron Girmonsky
- G01 - MEASURING TESTING
Information Patent Application
NON-DESTRUCTIVE SEM-BASED DEPTH-PROFILING OF SAMPLES
- Publication number 20240094150
- Publication date Mar 21, 2024
- APPLIED MATERIALS ISRAEL LTD.
- Dror Shemesh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
NON-DESTRUCTIVE SEM-BASED DEPTH-PROFILING OF SAMPLES
- Publication number 20240096591
- Publication date Mar 21, 2024
- APPLIED MATERIALS ISRAEL LTD.
- Dror Shemesh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Z-PROFILING OF WAFERS BASED ON X-RAY MEASUREMENTS
- Publication number 20240085356
- Publication date Mar 14, 2024
- APPLIED MATERIALS ISRAEL LTD.
- Doron Girmonsky
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DEPTH-PROFILING OF SAMPLES BASED ON X-RAY MEASUREMENTS
- Publication number 20240085351
- Publication date Mar 14, 2024
- APPLIED MATERIALS ISRAEL LTD.
- Doron Girmonsky
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DEFECT EXAMINATION ON A SEMICONDUCTOR SPECIMEN
- Publication number 20230114624
- Publication date Apr 13, 2023
- APPLIED MATERIALS ISRAEL LTD.
- Dror SHEMESH
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DETERMINATION OF DEFECT LOCATION FOR EXAMINATION OF A SPECIMEN
- Publication number 20210256687
- Publication date Aug 19, 2021
- APPLIED MATERIALS ISRAEL LTD.
- Doron GIRMONSKY
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
X-RAY BASED EVALUATION OF A STATUS OF A STRUCTURE OF A SUBSTRATE
- Publication number 20210181128
- Publication date Jun 17, 2021
- APPLIED MATERIALS ISRAEL LTD.
- Dror Shemesh
- G01 - MEASURING TESTING
Information Patent Application
X-RAY BASED EVALUATION OF A STATUS OF A STRUCTURE OF A SUBSTRATE
- Publication number 20210033550
- Publication date Feb 4, 2021
- APPLIED MATERIALS ISRAEL LTD.
- Dror Shemesh
- G01 - MEASURING TESTING
Information Patent Application
PROCESS MONITORING
- Publication number 20200355620
- Publication date Nov 12, 2020
- APPLIED MATERIALS ISRAEL LTD.
- Dror Shemesh
- G01 - MEASURING TESTING
Information Patent Application
IMAGING OF CRYSTALLINE DEFECTS
- Publication number 20190180975
- Publication date Jun 13, 2019
- APPLIED MATERIALS ISRAEL LTD.
- Dror Shemesh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR DETECTING VOIDS AND AN INSPECTION SYSTEM
- Publication number 20190043183
- Publication date Feb 7, 2019
- Applied Materials, Inc.
- Dror Shemesh
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEM AND METHOD FOR SCANNING AN OBJECT
- Publication number 20160276127
- Publication date Sep 22, 2016
- APPLIED MATERIALS ISRAEL LTD.
- Yuval Gronau
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND SYSTEM FOR ENHANCING RESOLUTION OF A SCANNING ELECTRON M...
- Publication number 20120241605
- Publication date Sep 27, 2012
- Dror Shemesh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND SYSTEM FOR GENERATING AND REVIEWING A THIN SAMPLE
- Publication number 20090078867
- Publication date Mar 26, 2009
- Michal Avinun-Kalish
- G01 - MEASURING TESTING
Information Patent Application
Method and System for Imaging a Cross Section of a Specimen
- Publication number 20090053395
- Publication date Feb 26, 2009
- Dror Shemesh
- G01 - MEASURING TESTING
Information Patent Application
CHARGED PARTICLE BEAM APPARATUS AND METHOD FOR OPERATING A CHARGED...
- Publication number 20080258060
- Publication date Oct 23, 2008
- JUERGEN FROSIEN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method and System for Providing a Compensated Auger Spectrum
- Publication number 20080234962
- Publication date Sep 25, 2008
- Dror Shemesh
- G01 - MEASURING TESTING
Information Patent Application
CHARGED PARTICLE DETECTOR ASSEMBLY, CHARGED PARTICLE BEAM APPARATUS...
- Publication number 20080191134
- Publication date Aug 14, 2008
- Gilad Almogy
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM DEVICE AND METHOD FOR INSPECTING SPECIMEN
- Publication number 20080048116
- Publication date Feb 28, 2008
- PAVEL ADAMEC
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND SYSTEM FOR DETECTING HIDDEN DEFECTS
- Publication number 20070114404
- Publication date May 24, 2007
- Dror Shemesh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND SYSTEM FOR ENHANCING RESOLUTION OF A SCANNING ELECTRON M...
- Publication number 20070090288
- Publication date Apr 26, 2007
- Dror Shemesh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method for monitoring chamber cleanliness
- Publication number 20060216839
- Publication date Sep 28, 2006
- APPLIED MATERIALS, ISRAEL, LTD.
- Dror Shemesh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Methods and systems for process monitoring using x-ray emission
- Publication number 20060054811
- Publication date Mar 16, 2006
- Dror Shemesh
- G01 - MEASURING TESTING
Information Patent Application
Scanning electron microscope having multiple detectors and a method...
- Publication number 20060054814
- Publication date Mar 16, 2006
- Dror Shemesh
- G01 - MEASURING TESTING
Information Patent Application
Methods and systems for process monitoring using x-ray emission
- Publication number 20060049349
- Publication date Mar 9, 2006
- Dror Shemesh
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for sample formation and microanalysis in a va...
- Publication number 20060011867
- Publication date Jan 19, 2006
- Applied Materials Israel Ltd.
- Eitan Kidron
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for sample formation and microanalysis in a va...
- Publication number 20060011868
- Publication date Jan 19, 2006
- Applied Materials Israel Ltd.
- Eitan Kidron
- G01 - MEASURING TESTING
Information Patent Application
System and method for fast focal length alterations
- Publication number 20050017192
- Publication date Jan 27, 2005
- Dror Shemesh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method and device for aligning a charged particle beam column
- Publication number 20050012050
- Publication date Jan 20, 2005
- Dror Shemesh
- H01 - BASIC ELECTRIC ELEMENTS

SHEMESH DROR

Person

Patents Grantslast 30 patents

Defect examination on a semiconductor specimen

X-ray based evaluation of a status of a structure of a substrate

Determination of defect location for examination of a specimen

Process monitoring

X-ray based evaluation of a status of a structure of a substrate

Method for detecting voids and an inspection system

Imaging of crystalline defects

Resolving ambiguities in an energy spectrum

Method for detecting voids in interconnects and an inspection system

System and method for scanning an object

Apparatus for sample formation and microanalysis in a vacuum chamber

Method and system for imaging a cross section of a specimen

Method for monitoring chamber cleanliness

Charged particle beam device and method for inspecting specimen

Method and system for providing a compensated auger spectrum

Scanning electron microscope having multiple detectors and a method...

Charged particle detector assembly, charged particle beam apparatus...

Charged particle beam apparatus and method for operating a charged...

Method and system for detecting hidden defects

Method and system for generating and reviewing a thin sample

Specimen current mapper

Methods and systems for process monitoring using x-ray emission

Methods and systems for process monitoring using x-ray emission

Method and apparatus for sample formation and microanalysis in a va...

Method and device for aligning a charged particle beam column

Multiple electrode lens arrangement and a method for inspecting an...

System and method for fast focal length alterations

Apparatus and method for enhanced voltage contrast analysis

System and method for reducing charged particle contamination

System and method for directing a miller

Patents Applicationslast 30 patents

NON-DESTRUCTIVE CLASSIFICATION OF SPECIMENS BASED ON ENERGY SIGNATU...

NON-DESTRUCTIVE SEM-BASED DEPTH-PROFILING OF SAMPLES

NON-DESTRUCTIVE SEM-BASED DEPTH-PROFILING OF SAMPLES

Z-PROFILING OF WAFERS BASED ON X-RAY MEASUREMENTS

DEPTH-PROFILING OF SAMPLES BASED ON X-RAY MEASUREMENTS

DEFECT EXAMINATION ON A SEMICONDUCTOR SPECIMEN

DETERMINATION OF DEFECT LOCATION FOR EXAMINATION OF A SPECIMEN

X-RAY BASED EVALUATION OF A STATUS OF A STRUCTURE OF A SUBSTRATE

X-RAY BASED EVALUATION OF A STATUS OF A STRUCTURE OF A SUBSTRATE

PROCESS MONITORING

IMAGING OF CRYSTALLINE DEFECTS

METHOD FOR DETECTING VOIDS AND AN INSPECTION SYSTEM

SYSTEM AND METHOD FOR SCANNING AN OBJECT

METHOD AND SYSTEM FOR ENHANCING RESOLUTION OF A SCANNING ELECTRON M...

METHOD AND SYSTEM FOR GENERATING AND REVIEWING A THIN SAMPLE

Method and System for Imaging a Cross Section of a Specimen

CHARGED PARTICLE BEAM APPARATUS AND METHOD FOR OPERATING A CHARGED...

Method and System for Providing a Compensated Auger Spectrum

CHARGED PARTICLE DETECTOR ASSEMBLY, CHARGED PARTICLE BEAM APPARATUS...

CHARGED PARTICLE BEAM DEVICE AND METHOD FOR INSPECTING SPECIMEN

METHOD AND SYSTEM FOR DETECTING HIDDEN DEFECTS

METHOD AND SYSTEM FOR ENHANCING RESOLUTION OF A SCANNING ELECTRON M...

Method for monitoring chamber cleanliness

Methods and systems for process monitoring using x-ray emission

Scanning electron microscope having multiple detectors and a method...

Methods and systems for process monitoring using x-ray emission

Method and apparatus for sample formation and microanalysis in a va...

Method and apparatus for sample formation and microanalysis in a va...

System and method for fast focal length alterations

Method and device for aligning a charged particle beam column