Sheng-Hsu Chuang

Person

Hsinchu City, TW

People

Patents Grantslast 30 patents

Information Patent Grant
Chemical mechanical planarization tool
- Patent number 12,172,263
- Issue date Dec 24, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd
- Michael Yen
- B24 - GRINDING POLISHING
Information Patent Grant
Automated inspection tool
- Patent number 11,961,770
- Issue date Apr 16, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd
- Chia-Han Lin
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Apparatus and method for inspecting wafer carriers
- Patent number 11,929,271
- Issue date Mar 12, 2024
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Cheng-Kang Hu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Defect offset correction
- Patent number 11,842,481
- Issue date Dec 12, 2023
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Chien-Ko Liao
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Semiconductor equipment management method, electronic device, and n...
- Patent number 11,754,989
- Issue date Sep 12, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd
- Sing-Tsung Li
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Chemical mechanical planarization tool
- Patent number 11,679,469
- Issue date Jun 20, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd
- Michael Yen
- B24 - GRINDING POLISHING
Information Patent Grant
Method and system for map-free inspection of semiconductor devices
- Patent number 11,651,981
- Issue date May 16, 2023
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Jiao-Rou Liao
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Defect offset correction
- Patent number 11,430,108
- Issue date Aug 30, 2022
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Chien-Ko Liao
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
FinFET contacts and method forming same
- Patent number 11,189,727
- Issue date Nov 30, 2021
- Taiwan Semiconductor Manufacturing Company, Ltd
- Peng-Chung Jangjian
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Automated inspection tool
- Patent number 11,171,065
- Issue date Nov 9, 2021
- Taiwan Semiconductor Manufacturing Company, Ltd
- Chia-Han Lin
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Semiconductor processing stage profiler jig
- Patent number 11,152,238
- Issue date Oct 19, 2021
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Cheng-Kang Hu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Topological scanning method and system
- Patent number 11,120,539
- Issue date Sep 14, 2021
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Sheng-Hsiang Chuang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Wafer debonding system and method
- Patent number 10,889,097
- Issue date Jan 12, 2021
- Taiwan Semiconductor Manufacturing Co., Ltd
- Chang-Chen Tsao
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus and method for substrate inspection
- Patent number 10,876,976
- Issue date Dec 29, 2020
- Taiwan Semiconductor Manufacturing Company Ltd.
- Bo-Han Shih
- G01 - MEASURING TESTING
Information Patent Grant
Automatic in-line inspection system
- Patent number 10,872,794
- Issue date Dec 22, 2020
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Chien-Ko Liao
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Semiconductor equipment management method, electronic device, and n...
- Patent number 10,852,704
- Issue date Dec 1, 2020
- Taiwan Semiconductor Manufacturing Company, Ltd
- Sing-Tsung Li
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Defect offset correction
- Patent number 10,839,507
- Issue date Nov 17, 2020
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Chien-Ko Liao
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Apparatus and method for inspecting wafer carriers
- Patent number 10,714,364
- Issue date Jul 14, 2020
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Cheng-Kang Hu
- G01 - MEASURING TESTING
Information Patent Grant
Wafer debonding system and method
- Patent number 10,569,520
- Issue date Feb 25, 2020
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Chang-Chen Tsao
- B32 - LAYERED PRODUCTS
Information Patent Grant
Automated inspection tool
- Patent number 10,490,463
- Issue date Nov 26, 2019
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Chia-Han Lin
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Metal recycling method and metal recycling equipment thereof
- Patent number 10,319,618
- Issue date Jun 11, 2019
- Epistar Corporation
- Chun-Lung Tseng
- B44 - DECORATIVE ARTS
Information Patent Grant
Wafer debonding system and method
- Patent number 10,155,369
- Issue date Dec 18, 2018
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Chang-Chen Tsao
- B32 - LAYERED PRODUCTS
Information Patent Grant
Dual-function wafer handling apparatus
- Patent number 10,018,573
- Issue date Jul 10, 2018
- Taiwan Semiconductor Manufacturing Co., Ltd
- Ming-Han Tsai
- G01 - MEASURING TESTING
Information Patent Grant
Signal receiving device for Ethernet and control method thereof
- Patent number 9,973,235
- Issue date May 15, 2018
- Realtek Semiconductor Corporation
- Sheng-Fu Chuang
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Method for estimating cable length in Ethernet system and receiver...
- Patent number 9,879,970
- Issue date Jan 30, 2018
- Realtek Semiconductor Corp.
- Shih-Wei Wang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
United power module and system using the same
- Patent number 9,859,706
- Issue date Jan 2, 2018
- Realtek Semiconductor Corp.
- Ching-Yao Su
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Control method applied to operating-mode finite-state-machine and c...
- Patent number 9,824,055
- Issue date Nov 21, 2017
- Realtek Semiconductor Corp.
- Hsuan-Ting Ho
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Channel detection method and system thereof
- Patent number 9,800,290
- Issue date Oct 24, 2017
- Realtek Semiconductor Corp.
- Shih-Wei Wang
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Signal transmission method and communication system using the same
- Patent number 9,768,982
- Issue date Sep 19, 2017
- Realtek Semiconductor Corp.
- Sheng-Fu Chuang
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Photoresist composition to reduce photoresist pattern collapse
- Patent number 9,698,014
- Issue date Jul 4, 2017
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Tsung-Pao Chen
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Patents Applicationslast 30 patents

Information Patent Application
DEEP TRENCH ISOLATION STRUCTURE AND METHODS FOR FABRICATION THEREOF
- Publication number 20250031472
- Publication date Jan 23, 2025
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Sheng Chieh CHUANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTROSTATIC DISCHARGE PROTECTION DEVICE
- Publication number 20240355807
- Publication date Oct 24, 2024
- ALI CORPORATION
- Sheng-Jun CHUANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
STEPPED BACK SIDE DEEP TRENCH ISOLATON STRUCTURE
- Publication number 20240266380
- Publication date Aug 8, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Sin-Yao Huang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
APPARATUS AND METHOD FOR INSPECTING WAFER CARRIERS
- Publication number 20240186162
- Publication date Jun 6, 2024
- Taiwan Semiconductor Manufacturing Co., LTD
- Cheng-Kang HU
- G01 - MEASURING TESTING
Information Patent Application
IMAGE SENSOR INTEGRATED CIRCUIT WITH ISOLATION STRUCTURE AND METHOD
- Publication number 20230299106
- Publication date Sep 21, 2023
- Taiwan Semiconductor Manufacturing company Ltd.
- Shu Yen Kung
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Chemical Mechanical Planarization Tool
- Publication number 20230271298
- Publication date Aug 31, 2023
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Michael Yen
- B24 - GRINDING POLISHING
Information Patent Application
THERMAL IMAGE AUXILIARY PROCESSING DEVICE, POSITIONING DEVICE AND M...
- Publication number 20230057196
- Publication date Feb 23, 2023
- Industrial Technology Research Institute
- Sheng-Yu CHUANG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DEFECT OFFSET CORRECTION
- Publication number 20220375057
- Publication date Nov 24, 2022
- TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.
- Chien-Ko LIAO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
AUTOMATED INSPECTION TOOL
- Publication number 20220059415
- Publication date Feb 24, 2022
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Chia-Han Lin
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND SYSTEM FOR MAP-FREE INSPECTION OF SEMICONDUCTOR DEVICES
- Publication number 20220059376
- Publication date Feb 24, 2022
- Taiwan Semiconductor Manufacturing Co., LTD
- Becky LIAO
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR EQUIPMENT MANAGEMENT METHOD, ELECTRONIC DEVICE, AND N...
- Publication number 20210063984
- Publication date Mar 4, 2021
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Sing-Tsung Li
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DEFECT OFFSET CORRECTION
- Publication number 20210065347
- Publication date Mar 4, 2021
- TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.
- Chien-Ko LIAO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CHEMICAL MECHANICAL PLANARIZATION TOOL
- Publication number 20210053180
- Publication date Feb 25, 2021
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Michael Yen
- B24 - GRINDING POLISHING
Information Patent Application
FINFET CONTACTS AND METHOD FORMING SAME
- Publication number 20210057571
- Publication date Feb 25, 2021
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Peng-Chung Jangjian
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
APPARATUS AND METHOD FOR INSPECTING WAFER CARRIERS
- Publication number 20200343115
- Publication date Oct 29, 2020
- Taiwan Semiconductor Manufacturing Co., LTD
- Cheng-Kang HU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
WAFER DEBONDING SYSTEM AND METHOD
- Publication number 20200108592
- Publication date Apr 9, 2020
- Taiwan Semiconductor Manufacturing Co., LTD
- Chang-Chen Tsao
- B32 - LAYERED PRODUCTS
Information Patent Application
METHOD FOR MONITORING CUTTING-TOOL ABRASION
- Publication number 20200089191
- Publication date Mar 19, 2020
- Industrial Technology Research Institute
- Hsin-Chang Chang
- G05 - CONTROLLING REGULATING
Information Patent Application
APPARATUS AND METHOD FOR SUBSTRATE INSPECTION
- Publication number 20200072760
- Publication date Mar 5, 2020
- Taiwan Semiconductor Manufacturing company Ltd.
- BO-HAN SHIH
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATED INSPECTION TOOL
- Publication number 20200043812
- Publication date Feb 6, 2020
- Taiwan Semiconductor Manufacturing Co., LTD
- Chia-Han Lin
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
TOPOLOGICAL SCANNING METHOD AND SYSTEM
- Publication number 20190244343
- Publication date Aug 8, 2019
- Taiwan Semiconductor Manufacturing Co., LTD
- Sheng-Hsiang CHUANG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DISPLAY SYSTEM AND DISPLAY METHOD
- Publication number 20190228501
- Publication date Jul 25, 2019
- Industrial Technology Research Institute
- Hsin-Chang Chang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SEMICONDUCTOR EQUIPMENT MANAGEMENT METHOD, ELECTRONIC DEVICE, AND N...
- Publication number 20190163149
- Publication date May 30, 2019
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Sing-Tsung Li
- G05 - CONTROLLING REGULATING
Information Patent Application
DEFECT OFFSET CORRECTION
- Publication number 20190164265
- Publication date May 30, 2019
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Chien-Ko Liao
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SEMICONDUCTOR PROCESSING STAGE PROFILER JIG
- Publication number 20190164793
- Publication date May 30, 2019
- TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.
- Cheng-Kang HU
- G05 - CONTROLLING REGULATING
Information Patent Application
WAFER DEBONDING SYSTEM AND METHOD
- Publication number 20190118522
- Publication date Apr 25, 2019
- Taiwan Semiconductor Manufacturing Co., LTD
- Chang-Chen Tsao
- B32 - LAYERED PRODUCTS
Information Patent Application
APPARATUS AND METHOD FOR INSPECTING WAFER CARRIERS
- Publication number 20190067057
- Publication date Feb 28, 2019
- Taiwan Semiconductor Manufacturing Co., LTD
- Cheng-Kang Hu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
AUTOMATED INSPECTION TOOL
- Publication number 20190035696
- Publication date Jan 31, 2019
- Taiwan Semiconductor Manufacturing Co., LTD
- Chia-Han Lin
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
AUTOMATIC IN-LINE INSPECTION SYSTEM
- Publication number 20180366357
- Publication date Dec 20, 2018
- Taiwan Semiconductor Manufacturing Co., LTD
- Chien-Ko LIAO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
WAFER DEBONDING SYSTEM AND METHOD
- Publication number 20180147825
- Publication date May 31, 2018
- Taiwan Semiconductor Manufacturing Co., LTD
- Chang-Chen Tsao
- B32 - LAYERED PRODUCTS
Information Patent Application
METAL RECYCLING METHOD AND METAL RECYCLING EQUIPMENT THEREOF
- Publication number 20170092528
- Publication date Mar 30, 2017
- EPISTAR CORPORATION
- Chun-Lung TSENG
- B32 - LAYERED PRODUCTS

Sheng-Hsu Chuang

Person

Patents Grantslast 30 patents

Chemical mechanical planarization tool

Automated inspection tool

Apparatus and method for inspecting wafer carriers

Defect offset correction

Semiconductor equipment management method, electronic device, and n...

Chemical mechanical planarization tool

Method and system for map-free inspection of semiconductor devices

Defect offset correction

FinFET contacts and method forming same

Automated inspection tool

Semiconductor processing stage profiler jig

Topological scanning method and system

Wafer debonding system and method

Apparatus and method for substrate inspection

Automatic in-line inspection system

Semiconductor equipment management method, electronic device, and n...

Defect offset correction

Apparatus and method for inspecting wafer carriers

Wafer debonding system and method

Automated inspection tool

Metal recycling method and metal recycling equipment thereof

Wafer debonding system and method

Dual-function wafer handling apparatus

Signal receiving device for Ethernet and control method thereof

Method for estimating cable length in Ethernet system and receiver...

United power module and system using the same

Control method applied to operating-mode finite-state-machine and c...

Channel detection method and system thereof

Signal transmission method and communication system using the same

Photoresist composition to reduce photoresist pattern collapse

Patents Applicationslast 30 patents

DEEP TRENCH ISOLATION STRUCTURE AND METHODS FOR FABRICATION THEREOF

ELECTROSTATIC DISCHARGE PROTECTION DEVICE

STEPPED BACK SIDE DEEP TRENCH ISOLATON STRUCTURE

APPARATUS AND METHOD FOR INSPECTING WAFER CARRIERS

IMAGE SENSOR INTEGRATED CIRCUIT WITH ISOLATION STRUCTURE AND METHOD

Chemical Mechanical Planarization Tool

THERMAL IMAGE AUXILIARY PROCESSING DEVICE, POSITIONING DEVICE AND M...

DEFECT OFFSET CORRECTION

AUTOMATED INSPECTION TOOL

METHOD AND SYSTEM FOR MAP-FREE INSPECTION OF SEMICONDUCTOR DEVICES

SEMICONDUCTOR EQUIPMENT MANAGEMENT METHOD, ELECTRONIC DEVICE, AND N...

DEFECT OFFSET CORRECTION

CHEMICAL MECHANICAL PLANARIZATION TOOL

FINFET CONTACTS AND METHOD FORMING SAME

APPARATUS AND METHOD FOR INSPECTING WAFER CARRIERS

WAFER DEBONDING SYSTEM AND METHOD

METHOD FOR MONITORING CUTTING-TOOL ABRASION

APPARATUS AND METHOD FOR SUBSTRATE INSPECTION

AUTOMATED INSPECTION TOOL

TOPOLOGICAL SCANNING METHOD AND SYSTEM

DISPLAY SYSTEM AND DISPLAY METHOD

SEMICONDUCTOR EQUIPMENT MANAGEMENT METHOD, ELECTRONIC DEVICE, AND N...

DEFECT OFFSET CORRECTION

SEMICONDUCTOR PROCESSING STAGE PROFILER JIG

WAFER DEBONDING SYSTEM AND METHOD

APPARATUS AND METHOD FOR INSPECTING WAFER CARRIERS

AUTOMATED INSPECTION TOOL

AUTOMATIC IN-LINE INSPECTION SYSTEM

WAFER DEBONDING SYSTEM AND METHOD

METAL RECYCLING METHOD AND METAL RECYCLING EQUIPMENT THEREOF