Sheng-Long Liang

Person

  • Hsinchu County, TW

Patents Grantslast 30 patents

  • Information Patent Grant

    Reliability determination method

    • Patent number 10,996,262
    • Issue date May 4, 2021
    • Vanguard International Semiconductor Corporation
    • Sheng-Hui Liang
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Method for testing semiconductor devices

    • Patent number 7,453,280
    • Issue date Nov 18, 2008
    • Taiwan Semiconductor Manufacturing Co., Ltd.
    • Sheng-Hui Liang
    • G11 - INFORMATION STORAGE
  • Information Patent Grant

    Automatically adjustable wafer probe card

    • Patent number 6,856,156
    • Issue date Feb 15, 2005
    • Taiwan Semiconductor Manufacturing Co., Ltd
    • Sheng-Hui Liang
    • G01 - MEASURING TESTING

Patents Applicationslast 30 patents

  • Information Patent Application

    RELIABILITY DETERMINATION METHOD

    • Publication number 20200348355
    • Publication date Nov 5, 2020
    • Vanguard International Semiconductor Corporation
    • Sheng-Hui LIANG
    • G01 - MEASURING TESTING
  • Information Patent Application

    Intelligent bicycle and front fork thereof

    • Publication number 20090243254
    • Publication date Oct 1, 2009
    • Industrial Technology Research Institute
    • Dar-Ming Chiang
    • B62 - LAND VEHICLES FOR TRAVELLING OTHERWISE THAN ON RAILS
  • Information Patent Application

    VIBRATION REDUCING GOLF CLUB

    • Publication number 20090233729
    • Publication date Sep 17, 2009
    • Industrial Technology Research Institute
    • Dar-Ming Chiang
    • A63 - SPORTS GAMES AMUSEMENTS
  • Information Patent Application

    DOUBLE LAYER ETCH STOP LAYER STRUCTURE FOR ADVANCED SEMICONDUCTOR P...

    • Publication number 20080073724
    • Publication date Mar 27, 2008
    • Taiwan Semiconductor Manufacturing Co., LTD
    • Sheng-Hui Liang
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    Automatically adjustable wafer probe card

    • Publication number 20040189332
    • Publication date Sep 30, 2004
    • Taiwan Semiconductor Manufacturing Co., Ltd.
    • Sheng-Hui Liang
    • G01 - MEASURING TESTING