Shengcheng JIN

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San Jose, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Defect pattern grouping method and system
- Patent number 11,238,579
- Issue date Feb 1, 2022
- ASML Netherlands B.V.
- Wei Fang
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
SYSTEMS AND METHODS FOR DEFECT DETECTION AND DEFECT LOCATION IDENTI...
- Publication number 20250005739
- Publication date Jan 2, 2025
- ASML NETHERLANDS B.V.
- Shengcheng JIN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
HIERARCHICAL CLUSTERING OF FOURIER TRANSFORM BASED LAYOUT PATTERNS
- Publication number 20240212317
- Publication date Jun 27, 2024
- ASML NETHERLANDS B.V.
- Jingchun WANG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PROCESSING REFERENCE DATA FOR WAFER INSPECTION
- Publication number 20230139085
- Publication date May 4, 2023
- ASML NETHERLANDS B.V.
- Shengcheng JIN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DEFECT PATTERN GROUPING METHOD AND SYSTEM
- Publication number 20190333205
- Publication date Oct 31, 2019
- ASML Netherlands B.V.
- Wei FANG
- G06 - COMPUTING CALCULATING COUNTING