Shengrui Zhang

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Shenzhen, CN

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Patents Grantslast 30 patents

Information Patent Grant
Automatic selection of metrology target measurement recipes
- Patent number 10,782,616
- Issue date Sep 22, 2020
- ASML Netherlands B.V.
- Daimian Wang
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Optimization of integrated circuit mask design
- Patent number 10,521,539
- Issue date Dec 31, 2019
- Shenzhen Jingyuan Information Technology Limited
- Zongchang Yu
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
AUTOMATIC SELECTION OF METROLOGY TARGET MEASUREMENT RECIPES
- Publication number 20190204750
- Publication date Jul 4, 2019
- ASML NETHERLANDS B.V.
- Daimian WANG
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Optimization of Integrated Circuit Mask Design
- Publication number 20180225817
- Publication date Aug 9, 2018
- Shenzhen Jingyuan Information Technology Limited
- Zongchang Yu
- G06 - COMPUTING CALCULATING COUNTING