TREA

Shenzhi Yang

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Patents Grantslast 30 patents

  • Information Patent Grant

    Via chains for defect localization
    • Patent number 9,564,379
    • Issue date Feb 7, 2017
    • International Business Machines Corporation
    • Balasingham Bahierathan
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Static random access memory test structure
    • Patent number 8,787,074
    • Issue date Jul 22, 2014
    • International Business Machines Corporation
    • Oliver D. Patterson
    • G11 - INFORMATION STORAGE
  • Information Patent Grant

    Via chains for defect localization
    • Patent number 8,546,155
    • Issue date Oct 1, 2013
    • International Business Machines Corporation
    • Christopher B. D'Aleo
    • H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

  • Information Patent Application

    VIA CHAINS FOR DEFECT LOCALIZATION
    • Publication number 20130299828
    • Publication date Nov 14, 2013
    • Balasingham Bahierathan
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    STATIC RANDOM ACCESS MEMORY TEST STRUCTURE
    • Publication number 20130094315
    • Publication date Apr 18, 2013
    • International Business Machines Corporation
    • Oliver D. Patterson
    • G11 - INFORMATION STORAGE
  • Information Patent Application

    VIA CHAINS FOR DEFECT LOCALIZATION
    • Publication number 20130082257
    • Publication date Apr 4, 2013
    • ST MICROELECTRONICS, INC.
    • Bahierathan Balasingham
    • H01 - BASIC ELECTRIC ELEMENTS