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Plano, TX, US
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Patents Grants
last 30 patents
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Patent Grant
Systems, circuits, and methods to detect gate-open failures in MOS...
Patent number
11,585,844
Issue date
Feb 21, 2023
Board of Regents, The University of Texas System
Bhanu Teja Vankayalapati
G01 - MEASURING TESTING
Information
Patent Grant
Methods of measuring real-time junction temperature in silicon carb...
Patent number
11,525,740
Issue date
Dec 13, 2022
Boards of Regents, The University of Texas System
Bilal Akin
G01 - MEASURING TESTING
Information
Patent Grant
Methods of determining operating conditions of silicon carbide powe...
Patent number
11,474,145
Issue date
Oct 18, 2022
Board of Regents, The University of Texas System
Enes Ugur
G01 - MEASURING TESTING
Information
Patent Grant
Methods of monitoring conditions associated with aging of silicon c...
Patent number
11,397,209
Issue date
Jul 26, 2022
Board of Regents, The University of Texas System
Bilal Akin
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
SYSTEMS, CIRCUITS, AND METHODS TO DETECT GATE-OPEN FAILURES IN MOS...
Publication number
20230076735
Publication date
Mar 9, 2023
Board of Regents, The University of Texas System
Bhanu Teja Vankayalapati
G01 - MEASURING TESTING
Information
Patent Application
METHODS OF MEASURING REAL-TIME JUNCTION TEMPERATURE IN SILICON CARB...
Publication number
20210396596
Publication date
Dec 23, 2021
Board of Regents, The University of Texas System
Bilal Akin
G01 - MEASURING TESTING
Information
Patent Application
METHODS OF DETERMINING OPERATING CONDITIONS OF SILICON CARBIDE POWE...
Publication number
20200408829
Publication date
Dec 31, 2020
Board of Regents, The University of Texas System
Enes Ugur
G01 - MEASURING TESTING
Information
Patent Application
METHODS OF MONITORING CONDITIONS ASSOCIATED WITH AGING OF SILICON C...
Publication number
20200400738
Publication date
Dec 24, 2020
Board of Regents, The University of Texas System
Bilal Akin
G01 - MEASURING TESTING