Shiang-Ruei SU

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Zhudong Township, TW

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Patents Grantslast 30 patents

Information Patent Grant
Reliability testing method and apparatus
- Patent number 11,226,363
- Issue date Jan 18, 2022
- Taiwan Semiconductor Manufacturing Company, Ltd
- Shiang-Ruei Su
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Reliability testing method
- Patent number 10,495,687
- Issue date Dec 3, 2019
- Taiwan Semiconductor Manufacturing Company, Ltd
- Shiang-Ruei Su
- G01 - MEASURING TESTING
Information Patent Grant
Test chip, test board and reliability testing method
- Patent number 9,508,617
- Issue date Nov 29, 2016
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Shiang-Ruei Su
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
RELIABILITY TESTING METHOD AND APPARATUS
- Publication number 20200088786
- Publication date Mar 19, 2020
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Shiang-Ruei SU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
RELIABILITY TESTING METHOD
- Publication number 20170074923
- Publication date Mar 16, 2017
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Shiang-Ruei SU
- G01 - MEASURING TESTING
Information Patent Application
TEST CHIP, TEST BOARD AND RELIABILITY TESTING METHOD
- Publication number 20130229190
- Publication date Sep 5, 2013
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Shiang-Ruei SU
- G01 - MEASURING TESTING